Y. Z. Wang's scientific contributions
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It was automatically created by ResearchGate to create a record of this author's body of work. We create such pages to advance our goal of creating and maintaining the most comprehensive scientific repository possible. In doing so, we process publicly available (personal) data relating to the author as a member of the scientific community.
If you're a ResearchGate member, you can follow this page to keep up with this author's work.
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Publication (1)
In this paper, we reported a cost effective yield enhancement methodology in our 6-inch Gallium Arsenide wafer fab using the August NSX system and in-house developed defect correlation program. An automated defect detection and analysis system has been developed to monitor process and defect excursions at the critical process levels. The inspection...
