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IOP PUBLISHING JOURNAL OF PHYSICS D: APPLIED PHYSICS
J. Phys. D: Appl. Phys. 46 (2013) 084010 (8pp) doi:10.1088/0022-3727/46/8/084010
Multiple frequency capacitively coupled
plasmas as a new technology for sputter
processes
S Bienholz, N Bibinov and P Awakowicz
Institute for Electrical Engineering and Plasma Technology, Ruhr-University Bochum, Universitaetsstr.
150, 44801 Bochum, Germany
E-mail: bienholz@aept.rub.de
Received 13 July 2012, in final form 21 November 2012
Published 1 February 2013
Online at stacks.iop.org/JPhysD/46/084010
Abstract
A novel large area multiple frequency coupled plasma is introduced for sputter deposition
purposes. The discharge is driven by three different excitation frequencies (13.56, 27.12 and
60 MHz) simultaneously for advanced control of Ar ion flux and energy at the target by
applying the electrical asymmetry effect during sputter processes.
Optical emission spectroscopy is performed to characterize the sputter plasma with respect
to plasma parameters as well as the Al transport through the plasma. The spectroscopic data
are compared with TRIDYN calculation in combination with a simulation of the transport of
atoms through the plasma volume.
1. Introduction
In industrial applications multiple frequency capacitively
coupled plasmas (MFCCPs) are mostly applied in reactive
ion etching or plasma enhanced chemical vapour deposition
(PECVD) e.g. for solar panel production. However, in physical
vapour deposition (PVD) sputter applications MFCCPs can
be an appropriate alternative for specialized problems such as
ceramic or magnetic film deposition [1].
Nowadays, dc magnetrons are the most applied sputter
sources in nearly all fields of PVD technology. This is mainly
due to high deposition rates resulting from a high electron
density in the strongly magnetized area in front of the target.
Electrons are trapped in helical paths around the magnetic field
lines in the plasma, whereas the electric field of the plasma
boundary sheath reflects the electrons at the edges. Therefore
the kinetic energy of secondary electrons coming from the
target is efficiently transferred into ionization in the magnetized
plasma region. In principle, this concept works well for
all metallic target materials with a low relative permeability.
For insulating targets and insulating films in reactive sputter
processes, a dc plasma process is not sustainable, because
the dc current cannot penetrate through those materials.
Therefore, dc sources are usually replaced by rf power supplies
with the drawback of lower sputter rates. The electric circuit
is then closed by the displacement current. In the case of
ferromagnetic target materials, the magnetic field is short-
circuited in the target material itself making the magnetron
inefficient. In both cases, the ferromagnetic [1] as well as
the ceramic sputter deposition processes, multiple frequency
plasmas are a good compliment to existing technologies.
Multiple frequency discharges in PVD processes exhibit
a strong frequency coupling behaviour which needs to be
controlled carefully to ensure high-quality films. The main
challenge is to achieve a large range of independent control of
ion bombarding energy and electron density. The interaction
of driving frequencies in dual frequency CCPs with respect
to plasma sheath behaviour was studied in detail by Rauf
and Kushner [2]. They found a strong dependence of the
excitation frequency on the impedances of the plasma and
its sheath, which leads under certain circumstances to an
independent behaviour of very different frequencies. Kitajima
et al [3] verified the investigation experimentally by proving
the separability of substrate biasing frequency and discharge
excitation frequency through optical emission spectroscopy
(OES) for an etching reactor. Gans et al [4] studied complex
excitation frequency coupling mechanisms and their influence
on discharge excitation and ionization dynamics via phase
resolved OES. These results were verified experimentally
by Semmler et al [5] through the electrostatic probe and rf
current sensor measurements. Several studies on the effect of
the relative phase between integer driving frequencies were
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