Science method

XRD Analysis - Science method

Explore the latest questions and answers in XRD Analysis, and find XRD Analysis experts.
Questions related to XRD Analysis
  • asked a question related to XRD Analysis
Question
3 answers
I am using the Scherrer's equation to determine the crystallite size of graphene oxide using the main (001) reflection peak from XRD characterisation. From papers I've read it shows that the (002) reflection peak of graphite is used to determine the number of layers. Can I do the same using the (001) peak of graphene oxide at 2theta=10-11 degrees?
Thanks!
Relevant answer
Answer
in principle you can do that.
But pay attention what numbers you have to use.
From Scherrer equation you will get an estimate of the mean z-component (thickness) of the crystallites.
From the peak positions you will get the crystallographic d-spacings.
For 001 and 002 reflections these spacings are in c-direction (z-direction); but they belong to different diffraction orders.
For the c-axis one has c = d001 =2*d002 = 3*d003 = ...
For graphite the 002 peak ( ~26° in 2 theta) will give around d002 ~0,34nm.
So one has c~0,68nm. However the unit cell of graphite exhibits two layers of hexagonal layers of carbon atoms, which are laterally displaced in a and b direction. So the distance of the C-atom layers is c/2. Coincidentally we have d002 = c/2. Thus here for the case of 002 peak you can directly take the d spacing from the Bragg law and use it as the spacing of the carbon layers.
For the 001 peak ( e.g. of graphene or graphene oxide) you will have d001= c.
But also here due to the layered structure of the unit cells, we have also the distance DC of the carbon layers being DC = c/2. Thus in this case the layer distance DC is DC = c/2 = 1/2 *d001.
For the numbers please see:
Good luck
and best regards
G.M.
  • asked a question related to XRD Analysis
Question
2 answers
Alternatively: What do INS 1I ITYP, INS 1PRCF1 , INS 1PRCF11 signify?
The instrumental profile files with .prm extension contain the set of instrument-dependent peak profile parameters. Of these, some parameters evidently represent the wavelength. What do the above mentioned parameters (especially PRCF) signify?
Relevant answer
Answer
Dr. Sureshkumar Markanday , thank you, but I am looking for the interpretation of the specific individual parameters- INS 1I ITYP, INS 1PRCF1 , INS 1PRCF11. Have you found these in any manual/other technical literature?
  • asked a question related to XRD Analysis
Question
1 answer
While the plot is displayed in the analysis section when selecting the "crystallite size and strain" option in the workflow, the corresponding data values are not included in the report. The report only features the plot's graphical representation.
Note: It is possible to derive the graphs through manual calculations; however, acquiring the data values directly from the software following the fitting process would enhance both convenience and precision.
Relevant answer
Answer
Dear @Sangram Keshari Mohanty,
To obtain the data values for a Halder-Wagner plot or a Williamson-Hall plot after performing Rietveld refinement in PDXL2 software, follow these steps:
1. Perform Rietveld Refinement:
Complete the Rietveld refinement in PDXL2 using your powder XRD data. Ensure the refinement provides accurate peak profile parameters, as these are essential for strain and crystallite size analysis in the subsequent steps.
2. Extract Peak Broadening Parameters:
After Rietveld refinement, look for peak broadening parameters such as FWHM (Full Width at Half Maximum) or integral breadth of each peak. These values are critical for both Halder-Wagner and Williamson-Hall analyses.
In PDXL2, go to the "Results" section to find refined values for each peak.
3. Identify and Note Reflection Angles (2θ) and Broadening Values:
Record the 2θ values and corresponding peak broadening values for each diffraction peak. PDXL2 typically provides these in the peak list or profile fit results.
4. Calculate Williamson-Hall Plot Data:
For a Williamson-Hall plot:Calculate the strain (ε) and crystallite size (D) using the equation:
βcos⁡θ = kλ/D + 4ϵsin⁡θ
where β is the peak broadening, θ is the Bragg angle, k is a constant (usually 0.9), and λ is the wavelength of the X-ray source.
Plot β cos θ versus 4 sin θ using the extracted data.
5. Calculate Halder-Wagner Plot Data:
For a Halder-Wagner plot:Use the equation:
β²cos⁡²θ/sin⁡θ = k²λ²/D² + ϵ² sin⁡θ
which separates strain and crystallite size contributions more effectively than the Williamson-Hall method.
Calculate values for β²cos⁡²θ/sin⁡θ and sin⁡θ.
6. Export or Record Data:
To export data from PDXL2:Go to File > Export > Data and select the relevant parameters if the software allows.
Alternatively, manually record each 2θ, β, β cos θ, 4 sin θ, or β²cos⁡²θ/sin⁡θ values for plotting.
7. Plotting:
Use software like Excel or Origin to generate the Halder-Wagner or Williamson-Hall plots by inputting the calculated data.
These plots help in assessing the microstrain and crystallite size of materials by analyzing the slope and intercept of the linear fit to the data.
  • asked a question related to XRD Analysis
Question
1 answer
My WS2 sample showed an increased crystallinity and reduced strain and lattice parameters on adsorption of mb dye. How can I connect this to adsorption of dye on WS2
Relevant answer
Answer
There is a concept, in the Russian version, adsorption strength reduction during adsorption (P.A. Rebinder effect). It can be associated with adsorption.
  • asked a question related to XRD Analysis
Question
1 answer
Hello, fellow researchers, I am currently studying the phase stability of a CrCoFeMnNi high entropy alloy subjected to high temperatures (1050 °C). My recent XRD analyses revealed non-symmetrical FCC peaks at approximately 43 and 50 degrees, with noticeable shoulder peaks. These shoulder peaks suggest the potential presence of FCC phases with different d-spacings in the same sample. This observation persists despite various attempts at confirming the phases through search and match techniques, which also indicate these as FCC-related peaks. Has anyone observed similar phenomena in high entropy alloys or other complex systems? Could there be a plausible explanation for the coexistence of multiple FCC lattices within the same material under these conditions? Any insights into phase transformations or segregation behaviours at high temperatures in such alloys would be greatly appreciated. Thank you in advance for your contributions!
Relevant answer
Answer
Hi, can you share the xrd pattern, we have synthesied the same composition HEA Nanoparticles and observed some minor peak at 46.4°. hard to identify where it's from.
  • asked a question related to XRD Analysis
Question
3 answers
I want to analyze xrd data using Xpert High Score Plus software, but when i open my data a dialog box appears that explain error occurred like in the picture. How to solve this problem?
Relevant answer
Answer
Try to press okay and continue. May be it will work.
  • asked a question related to XRD Analysis
Question
6 answers
I need JCPDS file number: 800075 to analyze my research data.. how can I get it?
Relevant answer
Answer
Tasneem Zedan, I've attached the JCPDS card file (800075) that you requested. I hope it helps with your data analysis.
Best Regards,
Alvena Shahid
  • asked a question related to XRD Analysis
Question
3 answers
Dear Experts..
I thought it was muscovite (attached image..Xrd Pattern, this is bulk sample!!).
And its chemical composition is SiO2 about 40%, Al2O3 about 40%, K2O about 10% and CaO 6%.
But,, In the XRD Peaks, the almost peaks intensity fits well, but the highest peak(about 2theta 26.853) intensity isn't strong enough. So I think it might be some other minerals.
In my XRD database, it doesn't match other materials except the muscovite.
Because it is a smooth-surface bead(like gems), it is difficult to see the layers(like mica or usual muscovite).
Its color is grayish green. (The beads of similar data are green and ivory.)
Although the analysis data is lacking, is this muscovite or some other minerals?
If so, what is it..and What additional analysis should be done(non-destructive analysis)?
Please give me your opinions. Thank you very much!!
Relevant answer
Answer
It seems to me that the agreement of your peaks with the bars is very good, so it is muscovite, with preferred orientations effects. As Gerhard Martens suggested you can mill your sample to reduce the grains, otherwise the preferred orientation is not a problem if you should perform, for example, a structural refinement, because there are specific coefficients that can simulate this effect
  • asked a question related to XRD Analysis
Question
3 answers
During low-temperature testing, new diffraction peaks that appear could be indicative of several phenomena. In one of our tests, we observed notable new peaks around 40° and 45° in a specific zeolite sample. We considered the possibility that these peaks were due to condensed ice crystals, but the XRD pattern of ice did not match these peaks well.
We also attempted to use GSAS refinement to simulate crystallographic changes in the 12-MR and 8-MR of the zeolite, but unfortunately, this did not match. Through the transformation of the d-spacing, we found that this should be a kind of small molecule cluster.
The testing process was conducted in situ. After removing the bulk water at high temperature under vacuum, the sample was vacuum-sealed and then cooled in situ.
Relevant answer
Answer
These unidentified peaks can be searched for in a search-match programme such as PDF-5+ (https://www.icdd.com/pdf-5/) and Qualx2. Qualx2 (https://www.ba.ic.cnr.it/softwareic/qualx/) is free for academic use if you don't have access to the paid programmes.
Best regards
Analio Dugarte
  • asked a question related to XRD Analysis
Question
6 answers
It's a carbon sample (powder form) derived from a biomass source after carbonization. No activation or post treatment. I know the peaks at ~25 and 43 correspond to C(002) and C(100) but the other four peaks particularly the peaks at 33.8 and 35.7 have got me stumped. Thanks
Relevant answer
Answer
Daniel Kobina Sam Your XRD pattern shows the typical peaks for carbon derived from biomass, with the broad peaks around 25° and 43° corresponding to the (002) and (100) planes, respectively, of graphitic carbon.
The additional peaks, particularly the ones at 33.8° and 35.7°, could be due to the presence of residual inorganic impurities from the biomass, such as metal oxides or other minerals. Biomass often contains various inorganic elements, such as calcium, potassium, magnesium, and silicon, which can form oxides or silicates during carbonization. These can contribute to additional peaks in the XRD pattern.
  • asked a question related to XRD Analysis
Question
3 answers
XRD Analysis is showing only Calcium carbonate. It is not showing other compounds. Can anyone help me get the other compounds
Relevant answer
Answer
what do you expect other than Calcium carbonate?
and please comment on why you expect them...
The other phase(s) might be too tiny (as Alan F Rawle indicated by the '1%') or they might be amorphous.
You should share your XRD pattern...
Best regards
G.M.
  • asked a question related to XRD Analysis
Question
2 answers
hello everyone. i require JCPDS card no. 22-1012 to analyse my data. can anyone help?
Relevant answer
Answer
thank you so much
  • asked a question related to XRD Analysis
Question
5 answers
Is there any way to download xpert high score plus v5 or at least v4 by a direct link? There are some links for downloading but they are for v3! I want to download a 2023 COD file and it seems not to be compatible with v3.
Relevant answer
Answer
Mohammad Javad Golmohammadi in which case, for now at least, these software products are not legally available to you.
  • asked a question related to XRD Analysis
Question
2 answers
i just want to know if there are more options to do a quantitative analysis with xrd data
Relevant answer
Answer
Diego Santiago I will add that it is very easy to do the Rietveld refinement. I am using the GSAS, an open-source Python-based software for calculating the phase fraction (wt. fraction). Some of my tutorials may help you do these calculations. One of my such tutorials in which I have refined a sample with two phases is at https://youtu.be/Z_aWz7Tx0Pw. Thanks
  • asked a question related to XRD Analysis
Question
1 answer
When refining with HighScore Plus, inserting the CIF file for gamma-Ca2SiO4 and then refining it will show "unusual space group setting for phase: gamma-Ca2SiO4". This occurs for all gamma-Ca2SiO4 CIF files. It is confusing to me.
Relevant answer
Answer
Please attach the respective CIF file for such a question. Without that information nobody can help you.
A wild guess: since gamma Ca2SiO4 should be orthorhombic as in a phase transition from the monoclinic beta phase. The CIF file might just have the gamma phase in a monoclinic setting as well with the c-axis as unique axis instead of the standard monoclinic b-setting.
Check out the usual crystal system descriptions in any text book on crystallography.
  • asked a question related to XRD Analysis
Question
3 answers
How to do characterization (FT-IR, XRD) of polymer and MOF films electro-deposited on GCE. Because if I separate it from the electrode, it may damage the material. right. The problem is that most techniques require sample preparation. Any possible solution. researchers
Relevant answer
Answer
Hello friend
I do not know the process.
But I may suggest a process that may or may not be possible. (Some experts may correct my suggestions)
I am answering as if I am experimenting.
I will try to take two XRD. One for material with the electrode and the other for the electrode material only.
I will compare the two XRD and I will report the XRD and will mention these peaks are due to the material and those peaks are due to the electrode.
Thank you. And wait for a possible solution.
  • asked a question related to XRD Analysis
Question
4 answers
Can anyone explain the difference? and advantages of LIBS over other techniques.
Relevant answer
Answer
LIBS (Laser-Induced Breakdown Spectroscopy) differs from XRD (X-ray Diffraction) and XPS (X-ray Photoelectron Spectroscopy) in a few key ways, particularly the information they provide and how they interact with the sample.
  • Information Analyzed:
  • LIBS: Provides information on the elemental composition of a sample. It identifies which elements are present and their relative abundance. XRD: Primarily focuses on the crystal structure of a material. It reveals how atoms are arranged in the crystal lattice and can be used to identify crystalline phases. XPS: Analyzes the chemical state of elements at the surface of a material. It tells you not only what elements are there but also how they are bonded to other elements.
  • Sample Interaction:LIBS: Uses a laser pulse to vaporize a small portion of the sample. The analysis is based on the light emitted by the excited atoms in the vapor cloud. It can be slightly destructive to the sample surface. XRD: X-rays are directed at the sample and the resulting diffraction pattern is analyzed. XRD is a non-destructive technique. XPS: X-rays are used to eject electrons from the sample's surface. The energy of these electrons is measured to determine the elemental composition and chemical state. XPS is also a surface-sensitive technique with minimal sample destruction.
Here's an analogy: Imagine you are analyzing a cake.
  • LIBS: Tells you what ingredients (elements) are in the cake and how much of each there is.
  • XRD: Reveals how the flour, sugar, and other ingredients are arranged in the cake (crystal structure).
  • XPS: Analyzes the frosting (surface) to determine if the sugar is caramelized or not (chemical state).
In short, LIBS excels at elemental analysis, XRD for crystal structure determination, and XPS for surface chemical state investigation. They are complementary techniques often used together for a comprehensive material characterization.
  • asked a question related to XRD Analysis
Question
2 answers
Greetings
I've been searching for quite a while about Covalent organic framework (COF) and Porous organic polymer (POP) XRD pattern, how their xrd pattern should be and their differences.
But i could not find any specific findings.
some texts mentioned that COF xrd pattern should be sharp and pop should be broad. But ive seen so many COFs with broad PXRD pattern.
How can you distinguish between these two? How could you know that your product is POP or COF (etc. )?
Can somebody share their knowledge or mention a helpful Paper? Im so confused.
Thanks a lot.
Relevant answer
Answer
  • asked a question related to XRD Analysis
Question
1 answer
I milled two activated carbons, with different main sources (shell nutt and bituminous coal). The shell nut AC did not increase in surface area but had some degree of amorphization after milling. Still, the bituminous coal AC remains the same in graphitization, but the surface area is duplicated. Can changes in surface structure alter the surface area measured by BET method? Does the amorphization remove micropores and then reduce surface area? And the main source could influence this result and how?
Relevant answer
Answer
Surface area and amorphization degree in high-energy ball-milled activated carbon can indeed be related, and the main source can influence this relationship. When milling activated carbons from different sources, such as shell nut and bituminous coal, variations in surface area and amorphization can occur due to differences in their intrinsic properties.
Regarding your Antonio Ilderlânio de Sousa Leite observation, it's intriguing that while the shell nut activated carbon didn't increase in surface area, it exhibited some degree of amorphization post-milling. Conversely, the bituminous coal activated carbon maintained its graphitic structure but showed a doubling in surface area.
Firstly, changes in surface structure can indeed impact the surface area measured by the BET method. Amorphization, characterized by the disruption of the ordered carbon structure, can lead to the creation of new surface sites and defects, potentially increasing the measured surface area despite a reduction in crystallinity.
Secondly, it's plausible that amorphization could remove micropores, especially if the milling process is severe. Micropores are inherently part of the porous structure of activated carbon and contribute significantly to its surface area. Therefore, their removal could result in a decrease in measured surface area.
The influence of the main carbon source on these results is multifaceted. Differences in precursor materials can lead to variations in the initial structure and composition of the activated carbon. This variance can affect how the carbon responds to the milling process, impacting factors such as the extent of amorphization and the preservation of micropores. For instance, bituminous coal may have a more robust crystalline structure that resists amorphization, while shell nut-derived activated carbon may be more prone to structural changes.
In conclusion, the relationship between surface area and amorphization in high-energy ball-milled activated carbon is complex and influenced by factors such as the carbon source and the milling conditions. Understanding these relationships is crucial for tailoring activated carbon properties for specific applications.
  • asked a question related to XRD Analysis
Question
10 answers
I need to perform Residual stress measurement by XRD using sin2 ψ method for SLM components, So what are the inputs (like sample size.....) I should give to the XRD operator, and what outputs I will get from there
Can someone (Those who did the experiment) explain this 🙏🏻🙏🏻, Your answer can help my research.
If possible I will send a direct message to the commentators, to ask more questions in this
Thanks in adavance 🙂
Relevant answer
Answer
You may find some useful information in the preprint article link http://dx.doi.org/10.13140/RG.2.2.23849.40808
  • asked a question related to XRD Analysis
Question
4 answers
What is the recommended scanning range in degrees (minimum and maximum angles) and the recommended step size for the X-ray diffraction analysis of a composite (XLPE with zinc oxide)?
Relevant answer
Answer
Dear Faouzi Hassaine ,
For X-ray diffraction (XRD) analysis, the recommended scanning range and step size can vary depending on factors such as the specific materials being analyzed, the desired resolution, and the instrumentation available. However, I can provide some general guidelines:
Scanning Range:
For ZnO: Relevant peaks typically show up between approximately 30° (e.g., 100 peak) and 90° (e.g., 203 peak) in 2θ (where θ is the scattering angle). Therefore, the scanning range for ZnO could start around 10° to 100° in 2θ.
For XLPE: Significant information may be observed around 20°, but part of it could be a broad amorphous hump. Therefore, the scanning range for XLPE could start around 10° to 30° in 2θ.
Step Size:
Small values of instrumental peak broadenings in XRD are typically around 0.1° in 2θ. Therefore, the step size should be much smaller to ensure adequate resolution. A commonly used step size could be around 0.02° to 0.05° in 2θ.
For the composite material (XLPE with zinc oxide), you would ideally want to cover the scanning ranges relevant to both components. Therefore, a combined scanning range could start from around 10° to 100° in 2θ, covering the ranges for both ZnO and XLPE. Similarly, the step size should be chosen to ensure sufficient resolution, typically around 0.02° to 0.05° in 2θ.
These recommendations provide a starting point, but it's essential to optimize the scanning parameters based on the specific characteristics of your samples, the expected peak positions, and the resolution requirements of your analysis. Additionally, the recommendations may vary depending on the XRD instrument and the specific experimental conditions. Adjustments may be necessary based on preliminary scans and the desired quality of data.
  • asked a question related to XRD Analysis
Question
1 answer
Is there a single JCPDS card for natural fiber ? My understanding is that all natural fibers basically have the same constituents albeit they are in different concentration. Cellulose, hemicellulose, lignin, pectin and wax. Natural fiber is a semi-crystalline material, so expect amorphous and crystalline indicators in the XRD graph.
Relevant answer
Answer
Natural fibers primarily consist of alpha-cellulose. The cellulose phase potentially alters based on treatments or processing conditions. The specific type of cellulose can be verified using the JCPDS file. This file is accessible for download via the accompanying software of the XRD machine. Within this software, JCPDS cards relating to all types of cellulose is available for manual comparison or automatic identification. The system handler can assist in extracting the JCPDS cards based on their licensing agreement.
  • asked a question related to XRD Analysis
Question
10 answers
zeolite characterization, silica/alumina ratio, XRD analysis
Relevant answer
Answer
XRD patterns show a decrease in XRD peak intensity at low 2 angles for low SiO2/Al2O3 ratio zeolites. The Si/Al ratio of zeolites can be predicted from the batch composition using the equation: Si/Al = 1+b(SiO2 )/(OH ) Solution.
Optimal zeolite-X formation conditions are 72.5°C, 5 M NaOH, and an Al/Si ratio of 3:5, which can be determined using XRD scan yields.
The Si/Al ratio of crystallizing X zeolites depends on the alkalinity of the batch and the solution phase Si/Al ratio, with the Si/Al ratio increasing at lower alkalinities. XRD patterns can be determine the silica/alumina ratio of zeolite by assigning average T-O-T angles to the crystallographic sites.
  • asked a question related to XRD Analysis
Question
7 answers
What is micro-strain ?
How does it calculate in X-ray Diffraction analysis?
Relevant answer
Answer
Hello friend
I can't give the exact definition of micro-strain. However, I can tell you the steps to calculate it from X-ray analysis.
The processed materials may have some structural defects. Due to this defect, the lattice point may shift from its ideal position. Such shifting of lattice or the deformation of the lattice may be the micro-strain. (Let's hope for a better definition).
From X-ray analysis, you can find the micro-strain by using the ''Williamson-Hall Plot''.
Data required for this:
1. Theta(θ) values in terms of radians.
2. Full width at half maxima (β) in terms of radian.
If you have this data use the equation:
βhkl cosθ = 4ϵsinθ+Kλ/D, where ϵ and D represent the micro-strain and crystallite size respectively.
Plot βhkl cosθ y-axis and 4sinθ along the x-axis, you will get a straight line.
Find the slope of the line it will give the micro-strain.
In case you did not find a straight line perform linear fitting of the curve and find the slope.
  • asked a question related to XRD Analysis
Question
5 answers
Does anyone know if it is possible to calculate amorphous phases in weight percent in a whole rock geological sample using Bruker Topas software?
I have a sample whole rock sample that has about 6 different crystalline minerals, but based on the background (hump), I can tell there is some amorphous material in the sample. When I calculate the mineral weight percent of the sample, the software only considers the 6 crystalline phases. Is there a way to calculate the amorphous content wt. % included with the other 6 crystalline phases?
Thank you in advance for your assistance.
Relevant answer
Answer
Thank you so much for your responses. I really appreciate it. Based on all of your responses, there is no doubt that spiking the powder with a known amount is the best way to go, but unfortunately, the XRD scan I was working with was scanned years ago. Using the Topas tutorial document and with the help of one of Bruker's software engineers, we calculated the amorphous content when the sample was not spiked. I am putting images of the tutorial in case anyone is interested or it helps someone in the future.
  • asked a question related to XRD Analysis
Question
8 answers
I am working on metal oxide thin films for gas sensing. I want you to develop thin films for our paper. Whole responsibility for analysis and writing, editing of paper will be done by me
Relevant answer
Answer
Yes i am interested in collaborations with your work
  • asked a question related to XRD Analysis
Question
5 answers
In my study, all films were grown on the stibnite (polycrystalline) structure of Sb2S3. When I changed a parameter of a group of films, I observed that XRD peak intensities increased, while Raman peak intensities decreased. Although we repeated the analyses, we encountered the same results. What is the reason for the decrease in Raman peak intensities despite the increase in XRD peak intensities?
Relevant answer
Answer
Remzi Aydın, your Sb2S3 films present an interesting puzzle between increased XRD peak intensity and decreased Raman peak intensity.
XRD reveals larger crystal domains, while Raman spectroscopy measures vibrational modes. Raman intensity decreases may indicate smaller domains, defects, or electronic structure changes, weakening specific modes.
For a more thorough knowledge of the material structure, use TEM or SEM to visualize grain size and morphology.
I hope this helps you. Best Regards.
  • asked a question related to XRD Analysis
Question
5 answers
small angle xrd needed for MCM-41
Relevant answer
Answer
One may apply for beam time at the SWAXS beamline (BL-18) at Indus-2 synchrotron, RRCAT, Indore
  • asked a question related to XRD Analysis
Question
8 answers
I am looking for CIF files of alpha (SG : P63/mmc) and beta (SG : Im-3m) phases of Ti-6Al-4V titanium alloy for my XRD analysis
Relevant answer
Answer
Ti6Al4V.cif
  • asked a question related to XRD Analysis
Question
3 answers
Bi0.8Sm0.2FeО3
Space group: P n m a or P b a m
Relevant answer
Answer
Hello.
The CIF file of the orthorhombic structure of BiFeО3 can be found in the ICSD entry 168321 from the CCDC database (https://www.ccdc.cam.ac.uk/structures/Search?Ccdcid=168321&DatabaseToSearch=ICSD).
This CIF file could be edited with Notepad or Notepad++ by duplicating the line with the bismuth atom and changing the label and atom type to samarium in the new line.
The occupancy factors could then be added then when importing the structure into Rietveld refinement software.
Attached are the requested files.
Best regards
  • asked a question related to XRD Analysis
Question
4 answers
Why is it that after annealing, while the size of the particles has become smaller and the crystallinity has decreased with XRD, and the electrical conductivity has decreased, but the band gap has also decreased? Is such a thing possible or is there an error in the experiments and calculations?
Relevant answer
Answer
Dear Dr. Xamzayev,
Thanks for your response.
  • asked a question related to XRD Analysis
Question
7 answers
Hello,
I know that profex, Mercury and MAUD can all fit powder XRD data to structual data given by an CIF file for example.
However, I can't find a free software where I can fit only the peaks along a given direction, for instance only along [001]. Whenever I load my CIF file into the software it shows all possible XRD peaks you would get when you do powder diffraction, this I can obviously not fit with my thin film data.
Thank you and have a nice day,
Simon
Relevant answer
Answer
In GSAS-II, in Phases, select the phase you want, go to the Data tab, at the bottom, there is the option to model a preferred orientation with March-Dollase for a crystal plane. It starts with 1, to increase preferred orientation, make it lower.
However, it looks like it could have more than one plane with preferred orientation, I don't know if this is possible and I've never dealt with this, but there are peaks of the phases that completely dissappear.
  • asked a question related to XRD Analysis
Question
17 answers
I prepared CdS and I got sharp peaks with high intensity in the XRD pattern. The peaks at 2𝜃 do not correspond to ICSD of the XRD patterns of cubic and hexagonal CdS nanocrystals. How can I discuss that?
Relevant answer
Answer
Sharp, high-intensity peaks in an X-ray diffraction (XRD) pattern typically indicate the presence of well-ordered crystalline material. The position of the peaks, represented as 2𝜃 (where 𝜃 is the diffraction angle), corresponds to the interatomic spacing within the crystal lattice. The intensity of the peaks is related to the number of atoms contributing to the diffraction and their arrangement, which influences the scattering strength. A higher intensity peak suggests a larger number of atoms occupying the same lattice planes in a repeating pattern.
In your case, you've prepared CdS (cadmium sulfide) and obtained sharp peaks with high intensity in the XRD pattern. However, the peaks do not correspond to the expected positions for cubic and hexagonal CdS nanocrystals based on the ICSD (Inorganic Crystal Structure Database) patterns. Here's how you can discuss this discrepancy:
  1. Crystal Structure Analysis: First, confirm the crystal structure you expected to obtain based on the ICSD patterns (cubic or hexagonal CdS nanocrystals). Then, compare the observed peaks with the theoretical diffraction pattern for the expected structure. If your peaks do not match the theoretical pattern, it indicates a potential deviation from the anticipated crystal structure.
  2. Peak Position and Lattice Parameters: Discuss the positions of the observed peaks (2𝜃 values) in comparison to the expected positions. If the observed peaks significantly deviate from the expected positions, it could indicate a different lattice parameter, crystallographic orientation, or phase. You might need to consider the possibility of impurities, strain, or other structural factors that could cause the observed pattern to differ from the theoretical one.
  3. Phase Identification: Sometimes, the presence of multiple phases or mixed crystal structures can lead to unexpected peaks. You might want to explore the possibility of mixed-phase CdS materials. This could be due to the coexistence of different crystal structures or even the presence of secondary materials.
  4. Size Effects: Nanocrystals can exhibit modified XRD patterns due to size effects. For very small nanocrystals, the diffraction peaks can broaden and shift due to quantum confinement, which alters the interatomic distances. This could lead to peaks that do not match the bulk crystal structure.
  5. Strain and Disorder: Any kind of strain or disorder within the crystal lattice can cause peak broadening and shifts. Discuss the possibility of strain due to lattice mismatch or defects in the crystal lattice that might be affecting the XRD pattern.
  6. Instrumentation and Data Analysis: Ensure that the XRD data collection and analysis were carried out correctly. Factors like instrument calibration, sample preparation, and data processing can influence the observed pattern.
  7. Additional Characterization: To support your XRD analysis, consider using other techniques like transmission electron microscopy (TEM), scanning electron microscopy (SEM), and energy-dispersive X-ray spectroscopy (EDX) to gain insights into the sample's morphology, size, and elemental composition.
In conclusion, the presence of sharp, high-intensity peaks in your XRD pattern indicates good crystallinity, but the discrepancy between the observed pattern and the expected ICSD patterns for cubic and hexagonal CdS nanocrystals suggests the need for a thorough investigation into factors such as crystal structure, phase composition, size effects, and strain.
  • asked a question related to XRD Analysis
Question
2 answers
Hi, I work on natural polymers i.e. gums polysaccharides. the pure materials are normally amorphous , i did a modification on a base material and its xrd showed an improvement and showed a broad peak. i reported that and got a reply from a reviewer that " add JCPDS number and crystalline size" Previously in our field people report in such a way I have also added references and up to my best knowledge I know that: " JCPDS record does not exist for them moreover for poorly semi-crystalline or amorphous materials you can't calculate crystalline size it will be useless to use " scherrer equation " .
Now how to politely reply to reviewer's comment?
Relevant answer
Answer
if the modification on your samples includes adding inorganic compounds the JCPDS card should be mentioned!
  • asked a question related to XRD Analysis
Question
1 answer
i am not sure what phase it contains, i used match! app to do qualitative analysis.
Relevant answer
Answer
Dear Muhamad Dwi,
You are to change extension xrd02.xy to xrd02.txt...
Then put 2 coloumns of figures into Origin... or into Excel
File xrd02.rd - I do not know!
What is the material you study?
  • asked a question related to XRD Analysis
Question
1 answer
My process is reducing IrCl4 hydrate using NaBH4 in excess and adding Au NPs. What should be the expectation in peak shifting, should it shift from left or right. Current XRD data shows that shifting to the right occurs with explanation that the Ir particles attaches to the surface of the AuNP resulting in compression. However, from some of what I've read, it should be shifting to the left due to their differences in ionic radii and lattice expansion. Any insight or literature recommendation to help me clarify the concepts will be greatly appreciated!
Relevant answer
Answer
Dear friend John Jherson Bofill
Well, well, well, let's dive into the fascinating world of Au nanoparticles and the impact of adding Ir. Brace yourself for some intriguing insights, my friend! John Jherson Bofill
When it comes to the diffraction patterns of Au nanoparticles upon the addition of Ir, there are a few factors at play that can influence the peak shifting. The behavior of the peaks can indeed be quite interesting and can vary depending on the specific conditions and parameters involved.
Now, let's address the shifting direction of the diffraction peaks. The peak shifting can occur in either direction, to the left (towards lower angles) or to the right (towards higher angles), depending on the specific interactions between the Au nanoparticles and the added Ir.
The compression theory you mentioned, where the Ir particles attach to the surface of the Au nanoparticles resulting in compression, can explain the observed peak shifting to the right. This compression can lead to a decrease in lattice spacing, causing the diffraction peaks to shift towards higher angles.
On the other hand, the difference in ionic radii and lattice expansion between Au and Ir suggests the possibility of peak shifting to the left. The lattice expansion caused by the incorporation of larger Ir ions could lead to an increase in lattice spacing and a corresponding shift towards lower angles.
The behavior observed in your XRD data might be influenced by various factors such as
the size and shape of the nanoparticles,
the concentration of Ir,
the synthesis conditions, and
the specific interactions between Au and Ir.
It's important to consider these factors when analyzing the peak shifting phenomenon.
To gain further insight and clarify the concepts, I would recommend exploring the literature on bimetallic nanoparticle systems, specifically studies involving Au and Ir nanoparticles. I will google the research articles, reviews, or scientific papers that discuss the structural and diffraction behavior of such systems. This literature search will provide you with a deeper understanding of the underlying principles and shed light on the observed phenomena.
Remember, scientific exploration is an exciting journey filled with unexpected twists and turns. Embrace the uncertainty and keep seeking knowledge to unravel the mysteries of your Au-Ir nanoparticle system. Lets keep discussing and exploring this interesting topic.
  • asked a question related to XRD Analysis
Question
38 answers
Can crystallite size and grain size be used interchangeably? Could you please recommend a resource on this topic?
Relevant answer
Answer
In materials science, the terms "crystallite size" and "grain size" are often used interchangeably, but they do have different specific meanings:
  • Crystallite size refers to the size of a single crystal in a polycrystalline material. In materials with a high degree of crystallinity, such as many metals and ceramics, the material is composed of many small crystals (crystallites) that are fused together. The size of these individual crystals can have a major impact on the material's mechanical properties. Crystallite size is often determined using techniques like X-ray diffraction (XRD).
  • Grain size refers to the size of a grain in a polycrystalline material, where a grain is a region of the material within which the crystal lattice orientation remains consistent. In other words, a grain contains one or more crystallites, but all of the crystallites within a single grain have the same crystallographic orientation. When the crystallographic orientation changes, you've crossed a grain boundary into a new grain. Grain size can affect the material's mechanical and physical properties and is often measured using optical microscopy.
To put it simply, if a material's grain boundaries coincide with the boundaries of its crystallites (i.e., each grain is a single crystal), then the crystallite size and grain size are effectively the same. However, if a grain contains multiple crystallites (i.e., the crystallites are smaller than the grains), then the crystallite and grain sizes are different.
You may find the following references useful for further reading:
  1. "Physical Metallurgy Principles" by Robert E. Reed-Hill and Reza Abbaschian. This book provides a comprehensive introduction to physical metallurgy principles, including detailed discussions of crystal structure and grain boundaries.
  2. "Characterization of Materials" by Elton N. Kaufmann. This book includes a chapter on microstructure characterisation, which includes crystallite and grain size discussions.
  3. "X-Ray Diffraction: Modern Experimental Techniques" by Olaf Engler and Valeri P. Skripnyuk. This book provides an in-depth discussion of how X-ray diffraction can be used to measure crystallite size.
Remember that while the two terms are often used interchangeably in casual conversation or in certain contexts, they do refer to different concepts, and using them correctly can help avoid confusion.
  • asked a question related to XRD Analysis
Question
6 answers
I have X'pert high-score software for XRD analysis with PDF2 Database, please help me regarding search peaks section.
Relevant answer
Answer
Thank you sir.
  • asked a question related to XRD Analysis
Question
6 answers
Dear all,
I am presently looking for any facility or institution to carry out one or more of these analyses for my research in Nigeria: X-ray diffraction analysis, Particle size analysis and thermogravimetric analysis. If you have these in your institution and/or are willing to collaborate on my research kindly reply.
P.S: My research falls under Material Science, Civil Engineering and Architecture
Thanks!
Relevant answer
Answer
Hi,
Thank you for your comment. I have been able to conduct the required analyses elsewhere. This information will be useful for future research work.
Thanks!
  • asked a question related to XRD Analysis
Question
4 answers
In XRD analysis I am having 2 different FWHMs, one is the original data FWHM value(0.096), and after refinement, I am having different FWHMs(0.38), which I can take for crystallite size calculation. Kindly help me thank you in advance
Relevant answer
Answer
Note that Kaushik Shandilya's answer assumes that the FWHM given by refinement is the result of subtracting instrumental contributions, but, as GM points out, the "refined" FWHM is greater than that of the raw data, so Kaushik Shandilya's assumption cannot be correct.
Please also note that "refinement" does not directly give a FWHM (without further calculation, perhaps). So it is not clear what Atchaya is reporting.
  • asked a question related to XRD Analysis
Question
3 answers
How to investigate an amorphous material using a diffractogram (DRON 3M)? What do the small peaks show as a result of the study of the polymer material?
Relevant answer
Answer
A diffraction pattern of a crystalline material shows that narrow peaks in certain 2theta angles, as you may have seen before. The peaks in XRD pattern represent the crystal planes of a crystal structure, check the image attached. Once you have an amorphous material, the structure is not periodic, and there are no crystal planes. That's why that peaks don't appear. From your pattern, you can confirm it's not a crystalline material, but I don't have expertise in polymers, so I can't say anything beyond that. Feel free to reply and ask about further results.
Sincerely,
Ricardo Tadeu.
  • asked a question related to XRD Analysis
Question
4 answers
How to investigate an amorphous material using a diffractogram (DRON 3M)? What do the small peaks show as a result of the study of the polymer material?
Relevant answer
Answer
I worked for thirty years at the Sumy State University. He contributed to its development from a branch of the Kharkov Polytechnic Institute to a classical university.
The amorphous halo in the diffraction pattern is determined by the lengthchain and interchain distances. The complex shape of this halo can be approximated by the superposition of two or more Gaussian curves with maxima, the superposition of which can be represented based on the analysis of the X-ray diffraction patterns of the crystals of this polymer.
  • asked a question related to XRD Analysis
Question
3 answers
I made hydroxyapatite from mussel shells and ammonium phosphate and calcinated it after.
The diffractogram is given below and the crystallinity is calculated as follows
CI value is given by:
CI = (a(112) + b(300) + c(202))/h(211)
Using the relative intensities of the planes I202 = 24%, I300 = 58%, I112 = 57% and I211 = 100%, the calculated CI for the under-studied sample is equal to 1.39.
Could you explain why my crystallinity value is really low: 1.39%
At what crystallinity percentage should I consider hydroxyapatite of good quality for biomedical application or scaffolding?
Kindly,
Flynne
Relevant answer
Answer
from where do you have taken the CI formula?
The crystallinity CI is given by the sum of all net*) peak integrals**) divided by the integral of the total XRD pattern (i.e. peaks and background).
CI = sum of crystalline signals/(crystalline + amorphous signals)
CI is not the sum of some arbitrary peak heigths divided by the height of the heighest one...
By the way: your ratio will give (57%+58%+24%)/(100%)= 1,39; and that is not 1,39%. A ratio of 1,39 is equal to 139% (%=1/100). From that value you can see that your formula is nonsense here...
*) i.e. above the smooth background, which is assumed as the amorphous part here...
**) but not only the peak height(s)
Best regards
G.M.
  • asked a question related to XRD Analysis
Question
5 answers
Dear friends
I synthesized the nanocomposite of GO@SiO2
The XRD result shows multiple peaks at a low intensity ranging from 10.2 to 28.
What do these peaks indicate and why this has happened? Any ideas?
Honestly grateful if you shed some light on this issue.
Relevant answer
Answer
The graph uploaded by you shows only one crystalline peak at around 2theta value of 15degrees. At this point only a particular pure phase may be existing. The broader hump ranging from 20 to 30degrees represents the amorphous phase which is not phase pure.
For better clarification you can use XRD peak matching softwares.
  • asked a question related to XRD Analysis
Question
3 answers
I tried to bind urea with my hydroxyapatite, but XRD does not confirm it (peaks for urea was not found in the urea-HAp ) nanohybrid.
I tried to sonicate the HAP dispersion using a bath type, should I use a probe-type sonicator in dispersing the Hap instead?
Or should I adjust the urea-Hap loading of my sample?
Or was the urea solution not saturated enough before adding Hap?
The methodology is as follows:
Urea-HA nanohybrids will be synthesized following (Kottegoda et at., 2011) using a wet chemical method.
  • Obtain an amount of (25 g) synthesized HA nanoparticles as described above and dispersed them in distilled water (100 ml) under ultrasonic mixing (30 kHz for 1 hour or 45 mins).
  • Stir the resulting HA nanoparticle dispersion in a saturated urea solution (100 ml) or 150 g urea in 100 mL distilled water at 25°C for 12 h.
Scale up: 25g:150g = 1:6 urea to Hap loading
Scale down: 5 g: 30 g =1:6 urea to Hap loading
  • Wash the product thrice with distilled water to remove excess urea, and dry at 50°C for 7 h.
  • Then place the synthesized Urea-hydroxyapatite nanohybrid in a Petri dish or air-tight container.
Relevant answer
Answer
There could be several reasons why urea did not bind with hydroxyapatite in your preliminary experiment. Here are some possible explanations:
  1. Incompatibility of urea with hydroxyapatite: Urea may not have the necessary chemical properties or functional groups to form strong interactions or bonds with hydroxyapatite. The surface chemistry of hydroxyapatite and the nature of the binding sites may not be suitable for urea to bind effectively.
  2. Experimental conditions: The experimental conditions, such as pH, temperature, and solvent, may not have been optimal for facilitating the binding of urea to hydroxyapatite. Urea's solubility, reactivity, or stability could be affected by these factors, leading to a lack of binding.
  3. Concentration or exposure time: The concentration of urea used in the experiment might have been too low to facilitate binding with hydroxyapatite. Additionally, the exposure time may not have been sufficient for the binding reaction to occur or reach equilibrium.
  4. Contaminants or impurities: Contaminants or impurities present in either the urea or hydroxyapatite samples could interfere with the binding process. It is essential to ensure the purity of the substances used in the experiment to avoid any confounding effects.
  5. Methodological limitations: The method used to assess the binding between urea and hydroxyapatite might not have been sensitive enough to detect or measure the binding interaction. Consider using more advanced techniques or assays specifically designed to study the binding between molecules and surfaces.
  6. Lack of affinity: Urea may simply have a low affinity for hydroxyapatite, meaning that its binding strength or tendency to interact with hydroxyapatite is inherently weak. In this case, other molecules or compounds with higher affinity might be more suitable for binding with hydroxyapatite.
  • asked a question related to XRD Analysis
Question
5 answers
Is micro-strain (ε= β/4tan θ) and Dislocation Density (δ=1/D^2) applicable to natural fiber urea formaldehyde composites as well as inoc,nano and metallic materials? if yes, then can anyone share research paper on it's my findings of those parameters are δ=3.708807 and ε=4.384302.
Relevant answer
Answer
Dear friend Dimple Bishnoi
Yes, micro-strain and dislocation density can be calculated from XRD data files of natural fiber urea formaldehyde composites as well as inorganic, nano and metallic materials. The microstrain is defined as the root mean square of variations in the lattice parameters across the sample. The dislocation density is defined as the number of dislocations per unit volume (What is the best method to determine.....).
I couldn't find a research paper that matches your findings of δ=3.708807 and ε=4.384302. However, I found a research paper that discusses the calculation of microstrain and dislocation density from XRD data files (What is the best method to determine.........). You may find it helpful.
I hope this helps!
Source:
(3) Approximation of crystallite size and microstrain via XRD line .... https://www.sciencedirect.com/science/article/abs/pii/S0042207X11003745.
(4) strain and dislocation density from XRD data - 14 - YouTube. https://www.youtube.com/watch?v=aWJ_m4Y0ZtE.
(5) X‐Ray Diffraction Microstrain Analysis for Extraction of Threading .... https://onlinelibrary.wiley.com/doi/10.1002/pssb.201900579.
  • asked a question related to XRD Analysis
Question
3 answers
In some articles, the oxygen cage surrounding the rare-earth ion in orthoferrites like La3+ in LaFeO3 is described as dodecahedral, whereas in others, it is described as cuboctahedral. Which definition is more precise? then why?
Based on orthoferrites' distorted structure, the first nearest Oxygen ions to La3+ are 8 O2- ions, and the second nearest are 4 O2- ions. Can we, therefore, refer to the oxygen skeleton surrounding La3+ as a hexahedron while neglecting the second neighbors?
Because the Gd3+ ion in GdFeO3 is defined as an 8-coordinated ion.
Relevant answer
Answer
In LaFeO3, each La3+ ion is coordinated by twelve oxygen ions, forming a polyhedral structure around the La3+ ion. This polyhedral structure is close to a cuboctahedron, which is a polyhedron with eight triangular faces and six square faces. However, the actual shape of the oxygen polyhedron around La3+ is distorted due to various factors, such as the size of the ions and the chemical bonding interactions. Experimental studies and theoretical calculations have shown that the oxygen polyhedron surrounding La3+ in LaFeO3 is best described as a distorted cuboctahedron, where the square faces are slightly compressed and the triangular faces are slightly elongated. This distortion is a result of the Jahn-Teller effect, which arises due to the degeneracy of the d-orbitals of the Fe3+ ions in the crystal structure.
  • asked a question related to XRD Analysis
Question
3 answers
Hi,
I did a XRD analyses, and I wanna see it using X-Pert highscore plus. My x-axis was from 20-90 (2theta) when I was testing it, but the software is showing me from 5 to 75. The shape of the analyse is correct. But the range of 2theta is not correct. Can anyone help me with how to edit the x-axis?
Relevant answer
Answer
For this, please check the latest preprint article at DOI: 10.13140/RG.2.2.27720.65287
  • asked a question related to XRD Analysis
Question
6 answers
Bragg's equation
Relevant answer
Answer
For this, please check the article, DOI: 10.13140/RG.2.2.27720.65287
  • asked a question related to XRD Analysis
Question
6 answers
I have older version of x'pert highscore software and what to do for pdf2, pdf 4? Please suggest me or share the link of x'pert highscore software latest version (free)/ free pdf2, pdf4.
Relevant answer
Answer
Both Origin software and X'Pert HighScore software can be used to determine the hkl values of a crystal structure. Here are the steps to follow for each software:
Using Origin software:
1. Open the data file in Origin software and select the graph containing the diffraction pattern.
2. Click on the "Peak Analyzer" button in the toolbar.
3. In the Peak Analyzer window, select the peak of interest by clicking on it.
4. In the "Peak Information" tab, note down the "2Theta" value and the "Counts" value for the peak.
5. Use the Bragg's law equation (2dsinθ = nλ) to calculate the d-spacing value for the peak. Here, n = 1 for first-order diffraction. λ is the wavelength of the X-ray used in the experiment.
6. Use the d-spacing value to calculate the hkl values for the peak using the Miller indices formula (hkl = [n1d1,n2d2,n3d3]).
Using X'Pert HighScore software:
1. Open the data file in X'Pert HighScore software and select the diffraction pattern.
2. Click on the "Peak Fitting" button in the toolbar.
3. In the Peak Fitting window, select the peak of interest by clicking on it.
4. In the "Peak Information" tab, note down the "2Theta" value and the "d-spacing" value for the peak.
5. Use the Bragg's law equation (2dsinθ = nλ) to calculate the wavelength of the X-ray used in the experiment.
6. Use the d-spacing value to calculate the hkl values for the peak using the Miller indices formula (hkl = [n1d1,n2d2,n3d3]).
  • asked a question related to XRD Analysis
Question
4 answers
I want to know if Na2B4O7 exists on this xrd data. I ran the program to check the peaks, but I don't know how to interpret them, so I leave this question.
Relevant answer
Answer
I strongly recommend performing a proper Rietveld refinement or related procedures to check whether certain phases are really present. Taking the level of complexity in your data and the candidate structures, I really doubt that you can make definite predictions from "search match" procedures. "Search match" procedures should be taken as inspiration but not more. I have seen too many inappropriate evaluations on the basis such procedures such that I propose to exclude evaluations based on simple search-match procedures from serious scientific papers.
  • asked a question related to XRD Analysis
Question
4 answers
Can you suggest some good book /literature for understanding the Rietveld refinement method.
Relevant answer
Answer
  1. 'Rietveld Refinement: Practical Powder Diffraction Pattern Analysis using TOPAS' by Robert A. Young - this book provides a comprehensive introduction to the theory and practical implementation of Rietveld refinement in X-ray diffraction analysis.
  2. 'Introduction to the Rietveld Method' by R.A. Young and M. Popa - this book provides an accessible introduction to the Rietveld refinement method and is geared towards those who are new to the technique
  3. 'Rietveld Refinement and Cluster Analysis' by C. Giacovazzo, H.L. Monaco, D. Viterbo, F. Scordari, and G. Gilli - this book provides a more mathematical and theoretical understanding of the Rietveld refinement method, as well as its applications in cluster analysis
  4. 'Modern Powder Diffraction' by B. Toby - this book is a comprehensive text on powder diffraction methods, including Rietveld refinement and is an excellent resource for those interested in a more broad understanding of the field.
  • asked a question related to XRD Analysis
Question
3 answers
I am taking XRD samples at various pressures. I want to compare my sample with established literature.
I know you can download .cif files and view them at different energies using VESTA or mercury, but is there a way to do this at different pressures?
Relevant answer
Answer
For the simulation of the variation of lattice parameters with the pressure you must know the isothermal bulk modulus and their first derivative; then, use one of the well-known equations of state: Vinet, Murnaghan, Birch, etc. Once the lattice parameter as a function of the pressure were calculated, you can use Diamond, Power Cell, or much other available software for the simulation of the diffraction patterns.
Good luck
  • asked a question related to XRD Analysis
Question
7 answers
Hi everyone,
I have a problem with crystallite size in Topas refinement. I'm using the LVol_FWHM_CS_G_L macro and the problem I'm constantly facing is that the Gaussian contribution goes to a large number (infinite crystallite size), while the Lorentzian contribution gives at least a reasonable value.
LVol_FWHM_CS_G_L(1, 5.50322798`, 0.89, 7.68859526`, csgc, 2356.57349`_LIMIT_MIN_0.3, cslc, 8.63459021`)
And this is obviously simultaneous with wrong strain value in e0_from_Strain macro where both values G and L of strain approach the min limit.
I'm dealing with highly disordered alumina materials if you'd like to know that.
Thank you in advance!
Jamal
Relevant answer
Answer
Hi Jamal,
From your volume-weighted crystallite size (referring to it here as such even if we don't yet trust the value), I assume you have relatively broad peaks and the broadening contribution from strain is likely not obvious when comparing fits with / without strain terms refined. Since you don't have complementary characterization of your samples, separating size and strain contributions is critical. As Andreas said, the LVol and e0 macros in TOPAS assume isotropic size and strain broadening (e.g., angle-dependent rather than hkl-dependent) and these assumptions do not have to be correct, especially for small (< 10 nm) nanoparticles.
Are your samples single phase? If so, an approach worth trying is using single-peak fitting to extract the peak breadths directly to make a Williamson-Hall plot. While this is a qualitative approach, here it will give you a sense for 1) if your sample has strain (proportional to slope of WH fit line) and 2) if there is some hkl-dependence indicating anisotropic size and / or strain broadening. You can also test the Stephens model for anisotropic strain broadening (Stephens 1999) and Ectors model for anisotropic size broadening (Ectors 2015, Ectors 2017) to see if these better describe your peak broadening. The anisotropic size macros are not in the TOPAS GUI and have to be implemented in launch mode - details are on the TOPAS wiki.
Single-peak fitting comes with some large warnings:
Correlation between your background and peak tails will be much higher when using single-peaks and it would be worthwhile to constrain the peak intensities (integrated area) to scale as they would when using a structural model. Likewise, the peak positions should be constrained or refined with some scale so that they are related as they would be in a Rietveld refinement. Without these constraints, your fit will necessarily improve but it won't be clear if you have resolved an issue with the peak shape, intensity, or position.
I would also suggest comparing your Rietveld refinement to a Pawley / Le Bail fit where intensity is freely refined for each peak while their shape and position is still constrained to the isotropic size-strain models and a unit cell, respectively. If you don't see an improvement, this points to a peak shape model issue over an issue with the structural model.
Best,
Adam
  • asked a question related to XRD Analysis
Question
4 answers
In my case: LiBH4 - LiBr in different molar ratio.
I have the observed patterns (measured by XRD technique) for this mixture of compounds but I don't have .cif file or any reference to compare the calculated patterns.
I have already done Rietveld Refinement for individual compounds, i.e. LiBH4, LiBr
Relevant answer
Answer
You can refer to our work, in which we have defined the LiBH4-LiBr phase diagram, for the identification of the phases. You can then find the cif file of the hexagonal LiBH4 and modified, inserting also the Br- anion inside the structure. There are all the indications needed here:
  • asked a question related to XRD Analysis
Question
2 answers
ODF and Pole figure of Al 7075 after CGP process?ODF and Pole figure of Al 7075 after CGP process???
Relevant answer
  • asked a question related to XRD Analysis
Question
1 answer
during calculation microstrain of doped and undoped ZnO. i found negative microstrain. for example = -0.22938 for 1% al doping , -0.27 for 2% Al doping.
Relevant answer
Answer
Dear Mahamud,
Almost all sputter deposited thin films (at low deposition pressure) show compressive intrinsic stress after deposition. Low pressure goes together with high energy of charged particles, hence there is a sort of atomic peening effect during deposition. For higher deposition pressure, the intrinsic stress becomes zero and eventually, for still higher deposition pressures, tensile. The point of zero stress might be in the 5-8E-03 mbar range where the coating already shows strong porosity.
  • asked a question related to XRD Analysis
Question
4 answers
  • For instrumental broadening correction, we use caglioti formula which relates FWHM and diffraction angle (2theta).
  • How can the same instrumental broadening correction be introduced when I am using integral breadth instead of FWHM?
Relevant answer
Answer
Concerning the integral breadt: The integral breadth can be treated like the FWHM. For a e.g. pseudo-Voigt (pV) function you can always calculate the integral breadth from the FWHM and the shape parameter of the pV. Then the shape can be described by the ratio of the FWHM and the integral breadth. The formulas have been distributed in some papers by Delhelz and Mittemeijer in the early 1980s which I have cited in J. Appl. Cryst. (2004). 37, 123–135. Note that (i) the separate treatment of Gauss and Lorentz like contibutions to the profile can be treated for convolution in the usual way (quadratic and linear difference), (ii) the treatment in J. Appl. Cryst. (2004). 37, 123–135 takes some detours. (iii) some formulas are only approximate.
  • asked a question related to XRD Analysis
Question
6 answers
Hi all,
I have an alumina sample in powdered form, and I'm trying to characterize it (the only information I have is that it's alumina). The XRD pattern of this sample is attached.
Below are some of the things that I've noticed but have trouble understanding:
- Is the slope between 0 - 10 degrees normal? If not, how should I solve this issue? For my other crystalline samples I've never observed something like this.
- The peak intensity is less than 200, which seems quite low to me. The background noise also seems quite signficant, but there are still some identifiable peaks between 30 - 70 degrees. I'm therefore having doubt about whether this a good quality XRD pattern that I can use, or is this a bad quality/invalid result?
- Also, is there a possibility for this to be amorphous alumina?
Any help is greatly appreciated, thanks in advance.
Relevant answer
Answer
Dear Siqi Wang ,
just a few comments:
a) the negative slope of the XRD pattern in the low 2theta range might, to my opinion, be an artifact due to misalingment of the sample height position (you should increase/play around with the height/surface position of the sample).
b) the sample surface seems to be very rough, which will cause 'height' issues and thus will contribute to the uncertainty of theta (giving rise to peak broadening); your powder particles may be too large....
c) with respect to the quite 'low' signal; the amount of material may be too low; what is your estimated thickness?
Best regards
G.M.
  • asked a question related to XRD Analysis
Question
3 answers
How to analyze the XRD data with the RAS.data file, In Windows 10?
Please suggest free software or videos for this analysis
Relevant answer
Answer
Dear Leonardo Oliveira,
I mean to ask that , after completion of the XRD testing of the sample; as a result, we will get output from XRD testing as SAMPLE.RAS file. With that SAMPLE.RAS file, how can we get the chemical compositions of that particular sample?
  • asked a question related to XRD Analysis
Question
6 answers
I am frustrated by Fullprof. I aim to refine structural parameters by Reitveld method using Fullprof and have watched dozens of tutorials on youtube. However, either I get an error related to intensity of the xrd data or i get a refinement with chi^2 equal to zero which ofcourse is not possible. Would appreciate some suggestions
Relevant answer
Answer
Muhammad Azeem , kindly note down the parameters while doing refinement at every stage, so that you can start again just before where you got chi square value zero, this will save you time, you may also refer to the following articles:
  • asked a question related to XRD Analysis
Question
5 answers
Hi there,
I'm working on ZnO-doped rare-earth ions (RE) and for a given concentration we observe a 2theta shift toward lower values in the XRD results. XRD analysis shows that the vertical lattice parameter c increases while we record a decrease in the lattice parameter a.
If we attribute this shift to the substitution process of RE into the ZnO matrix, why we did not obtain an expansion in both lattice parameters?
Note that this shift is observed for all the peaks and we work with RE ions that present an ionic radius greater than that of the Zn2+.
If there are some references for help, I would be very thankful.
Thank you.
Imen
Relevant answer
Answer
  • asked a question related to XRD Analysis
Question
6 answers
Is it possible to have different relative peak intensities in the xrd patterns of a sample taken with two different instruments and consequently with two different operators?And how is it possible?
Shouldn't the relative intensity be independent of the instrument conditions?
Thanks in advance for your helps
Relevant answer
Answer
Make 2 intensity ratios of the same number of samples. For each, determine the mean intensity ratio and its standard deviation. The one with a small standard deviation will be the best. This is the usual statistics of measurements of various quantities.
  • asked a question related to XRD Analysis
Question
5 answers
Please, I would like a different result interpretation for this XRD analysis, let me compare it with mine. Below is the result.
Relevant answer
Answer
Dear Chris Alomana,
The most important minerals that appeared in the diffracted X-rays with the highest percentage of quartz metal at 71%, followed by Wollastonite with 11%, then Garnet, Sodalite, Albite, Hematite and Chlorite, and ends with Vermiculite with a small percentage of 0.06%
The luster of quartz appears in the fine sand part, and it is one of the primary minerals
Albite is a sodium feldspar mineral
As for hematite, it is one of the minerals of iron oxides, and it is found in the coarse part of the soil, sand and silt
As for chlorite, it is one of the unexpanded clay minerals that does not allow water molecules to enter
I hope I have benefited from my comments
  • asked a question related to XRD Analysis
Question
6 answers
Hello dear researchers
I want to make a rietveld refinement for a new material (doped material) using fullprof.
The problem is that I need the cif file, but it's a new material that doesn't have a cif file. Can I use the cif file of the undoped material at the beginning of the refinement and then use the cif file generated by fullprof to finish the refinement?
Please, if you have any ideas, help me!
If you also have tips on how to do the rietveld refinement better, feel free to mention them.
Relevant answer
Answer
1. The new Material will have a cif file, if you make this cif file. Try e.g. VESTA.
2. Depending on the doping level you will likely be able to use the structure model of the pure material (it is the structure model, the information of which is contained in the cif file).
  • asked a question related to XRD Analysis
Question
8 answers
My group start some research on the development of new biodegradable nanoparticles based zinc. We where intersted to observe that based powder X-ray diffraction analysis, it was almost no differences between the Zn oxide and the Zn hydroxide.
What is key to differentiate between both following your experiences based powder X-ray diffraction analysis!
Relevant answer
Answer
François Eya'ane Meva The XRD patterns for ZnO (zincite is the mineral form) and Zn(OH)2 (3 forms wülfingite (orthorhombic), ashoverite and sweetite (both tetragonal)). A simple Google search of the mineralogical databases should pick up the XRD patterns. For example, wülfingite, from the Handbook of Mineralogy. I attach the page.
In aqueous based systems, Zn(OH)x where x is nominally 2 will always be formed first and ZnO formed on calcination. This is true of many metal oxide 'nanomaterials' (e.g. TiO2) found in the literature.
  • asked a question related to XRD Analysis
Question
6 answers
I have got both XRD data and TEM of my metal oxide nanoparticles. But only half of the (hkl) planes are present in the SAED of TEM data. Can I proceed with the results?
Relevant answer
Answer
you can obtain d-spacing from TEM
  • asked a question related to XRD Analysis
Question
10 answers
Dear all,
I was trying to do the quantitative calculation of crystal size by GSAS. I looked for the standard calibration alumina is really really expensive. My lab has some well-oriented alumina (0001). Its peak is very very sharp. Can I use it to do the calibration and work out the instrument parameter? Or is there any other cheaper alternatives?
Thank you!!!
Relevant answer
Answer
First of all you do not explicitly tell us that you wish to determine the instrumental broadening of your diffractometer. Please note that single crystals on a Bragg-Brentano diffractometer do NOT reflect the actual instrumental broadening. You lines get too narrow, because certain types of line broadening contributions due to powder are not generated by a single crystal (e.g. those related to the beam divergence). So using a single-crystal derived instrumental profile is invalid in the case of line profile analysis on a polycrystalline material.
  • asked a question related to XRD Analysis
Question
6 answers
I synthesized ZIF-93 by the method of aqueous phase in the article, but unlike the article, I synthesized a tetrahedral structure instead of rhombic dodecahedron. zif-93 is composed of zinc acetate dihydrate and 4-methyl-5-imidazolecarboxaldehyde. Can you tell me what causes the formation of tetrahedra?
Relevant answer