Questions related to EDX
It was not possible to identify lithium an nitrogen. What is the effect of the Be window in this case? Can this be explained with the K-Shell of nitrogen?
My substrate is Magnesium, it was electroless "Ni-P" coated.
I went to another test facility for EDX test to verify the contents of the coating. A Pt coating was put on it prior to FESEM and EDX at the test centre. As a result, the EDX pattern showed Pt peaks when the findings were released. But only Nickel and Phosphorous were deposited on the substrate in my work.
SO should I just ignore the Pt content in the EDX results or not ?
Recently, I have deposited the LiF on silver foil and I have done both XPS and TEM/EDX of my sample. EDX shows no oxygen presence or any other impurity in the LiF sample. SO, Is it possible that oxygen we got from XPS measurement, does not segregate in grain boundary or phase boundary?
How many frames are needed to cover 1cm2 area with a 50-micron step?
I am looking for traces of PTFE in the nickel plating on a steel sample. I have no prior experience with SEM technology. I have access to a JSM-IT100 SEM. Based on my research, it appears possible to determine the amount of PTFE present utilizing the machines EDS/EDX system? However I do not know how to go about this problem. Any help or direction is much appreciated.
I have two powder materials in particle size about 30 Micro-meter, one consist of CuO and TiO2, and other of CuO and MgO. I received following results from EDS operator. My questions are:
1-Did you think the test penetrated the sample completely?
2- If so, how can I get the result on the surface for my case or what is minimum energy required for my elements ?
3- What are these red and green vertical lines?
4-In general, how can we interpret EDS spectrum?
Note: regarding carbon that appear in result the operator said me that its due to he used material consist of carbon to fix the sample in the device is this acceptable for publication or how can I deal with it ?
Thank in advance ,,
I found a specail clay mineral in shale sample.
Backscattered SEM image and corresponding EDX spetrum of a argon-ion milled shale sample were attached. The caly mineral looks like rose-like authigenitc smectite in the SEM image. But since element k is present, it could be illite. It also could be a mixed-layer illite-smectite (I/S). Can anyone tell me what is the kind of the clay mineral?
Thanks for your help.
We are looking to characterize "fluorine flowers" on the surface of aluminum pads. Essentially characterizing contaminates present only on the surface of a homogenous material. So the poor surface sensitivity of EDX is a major limiting factor for us. This would be more of a monitoring effort, so getting relative values in comparison to a golden sample would be fine. Would you all have any techniques that might help, or papers that have addressed similar issues?
I already did TEM/EDX analysis. The results show K factor value, wt% and Atomic%.
How I convert the results by calibrating with ZAF standard.
Element K factor wt% Atomic%
O 1.455 8.83 14.53
Si 1.000 91.17 85.47
How deep can the x-ray penetrate through aluminum nitride (AlN) sample with an accelerating voltage of 10kV (EDX model : FEI Nova NanoSEM 450 SEM)?
I have gone through some threads, and I found, for example, an x-ray attenuation length calculator (https://henke.lbl.gov/optical_constants/atten2.html); it seems simple, but I did not know the parameters such as "Scan" what should I insert here. My questions are: is this reliable way, and how can I use it? Is there any other way or software?
What are the possible characterization techniques to confirm the formation of a core-shell nanostructure except for TEM? How can we confirm it using EDX technique?
I've acquired EDS maps during SEM analysis using an Oxford EDS device. I would like to know if there is a software which allows me to process these data (create scatterplots, compare element peaks, etc) or at least which allow me to convert these databases into .eds files. Could you please help me?
Thank you very much for your availability in advance,
I am using 2M NaOH solution for synthesis of zinc oxide nanoparticles, my EDX data is showing presence of Na and OH. How can I remove it completely? As I am washing it 6-10 times with distilled water and ethanol...but still there is presence of NaOH. Can anyone suggest how can I remove it?
Other elements include Ca, C. All elements are given in wt %.
Please help me understand the attached EDX spectra.
I'm not really familiar with this analytical technique and it is my first time to use EDX.
What is the difference between Element Wt% and Atom %?
And can EDX detect noble gases?
Dear expert colleagues, it is a well-known fact that SEM-EDX analyses give acceptable results from about Na on (i.e. no precision is expected for light elements as O, C, N, and so on). My questions are the following:
1. Let us assume that we have EDX atomic% data on a surface, containing C, O, and heavier elements. If the data on O and C are not precise, can we still trust the relative atomic % values of the heavier elements? Or we should treat the whole thing semiquantitatively? What about changes and tendencies? Are they reliable?
2. If we use wavelength dispersive analysis, do the atomic% values become reliable and comparable with those of the heavier elements?
3. How do EDX and WDX compositional data compare with XPS or XRF atomic% data? Can EDX and WDX data be used at all without model-matrix studies?
I would appreciate it if you could quote review articles on these aspects. So far I have tried to find some, but I did not find what I really looked for. It would be helpful to hear the opinion of colleagues who use these methods in their daily practice not only for elemental mapping but also for obtaining (semi)quantitative compositional data.
Thank you in advance
Most of the journal articles show that the plasmon peak of silver nanoparticles exists at the wavelength range of 400-500 nm. However, what I get is at around 550 nm (the AgNPs were synthesized through chemical reduction of silver nitrate by sodium borohydride with the presence of dodecylamine as capping agent). The formation of AgNPs has been confirmed by other elemental analysis (XRD,EDX). So I am not sure that does the peak presences at the wavelength of 550 nm is attributed to AgNPs or not?
I have the data/results from XRD and EDX. The EDX data shows chemical %age, e.g. SiO2: 73.653 % , Al2O3:14.426 % and other etc including some other details. The XRD results include, peak data Chart (2θ vs I unit cps); 2θ, d and counts table and peak %ages etc.
what is the procedure to calculate the minerals %age, specifically, quartz and montmorillonite and other minerals. Please try to have a simple and concise answer/procedure. If you have a flow chart or outlined procedure or an example data, would be much helpful.
Using Si substrate as base material for ITO samples, after EDX analysis ,not only the samples compositions or content increased or decreased, the Si (as base material) content as well also increased, why?
I am a researcher working with bovine hydroxyapatite. I want to reduce the percentage of carbonate on the sample. Is there any suggested techniques for this? I am measured the carbonate from EDX (SEM-EDX). Thank you
i. Scanning electron microscope (SEM) coupled with energy dispersive X-ray (EDX).
ii. X-ray photoelectron spectroscopy (XPS).
iii. X-ray diffractometer (XRD).
iv. Fourier transform infrared (FTIR)
Is the signal too noisy? Energy too low? Are all TEM EDX detectors above the sample? There are detectors of electrons below but no EDX. I just wonder why this is.
We're trying to get to the stoichiometry of bacterial cells through EDX combined with SEM or TEM. Which kind of grids do you think is the best for our sediment freshwater bacterial cells?
Thank you very much!
I have electrodeposited Co, Ni and Cu oxide on FTO glass substrate from equimolar conc. bath and EDX data obtained is attached here. Kindly guide how can I calculate the composition of my oxides?
Note: XPS confirmed +2 oxidation state of metals.
I am wondering why there is a variation in the theoretical atomic percentage in Ni-Cu ferrites and the percentage atom values found from EDX spectra. In the case of Fe and O, there exists this difference for all of my samples. If it exists the same after the second or third trial from EDX spectra, how can I explain the reason for this discrepancy in the literature? Would you please provide your explanation with references? As I saw from the literature, people usually do not talk about the difference in calculated and observed values of atomic percentage, rather they find whether all elements are present in the spectra and the total should give 100 % atom.
Thank you in advance.
I have taken EDX of a ceramic compound and It has shown all the expected elements along with different weight and atom percentage. But in XRD data of the same compound, all the elements have not been observed in a crystal. How I can sure which compound is developed?
I fabricated a composite say AB and both are carbides ceramics having formula AC and BC. I did EDX point analysis and observed A (45 wt %) and B (28 wt %), Carbon (26 wt %) and Oxygen (1 wt %). Can this data confirms the formation of A rich (A, B) C solid solution? Also at one location I got Carbon (83 wt % ), Oxygen (16 wt %), A (1.62 %) and B (0.13 %). Does that means precipitation of carbon at grain boundaries ? In EDS elemental mapping for some composition both element A and B mapping are superimposing at most of the places. Does it means formation of a intermetallic compound AB or it may be (A, B) C solid solution ?
I am working on 2D nanosheets. During the SEM-EDX and XPS analysis, I got too much difference in atomic percentage.
I have an AlN sample and the EDX data show me the at% of a single atom such as Al, N and O . In order to measure the at% AlN , I have to use the chemical formula 2AlN = 2Al + N 2 . should I use the at% of a single N or I have to calcualte the at% of N2 ?
While elemental analysis of the canine uroliths by energy dispersive X-ray (EDX) spectroscopy; on weight basis, we have detected Gold (Au) 23.46% in sample 1, 28.25% in sample 2, 9.46 % in sample 3, 9.25% in sample 4 and 6.11% in sample 5. Is it a normal findings
After putting the PEO coated glass substrate into the oven and subjecting it to a temperature of 180 degrees, it obtains a haze on the glass. A peak Si was observed after EDX analysis. Is there any possibility that Si is in the polymer or the observed peak coming from the substrate?
I was carrying out RAMAN Spectroscopy for MOFs. I have been carried out the XRD and EDX analysis for three samples synthesized by a different protocol. The crystal structure and chemical composition were the same for all three samples. When I performed RAMAN spectroscopy for these samples; I found one sample was Raman active while the other two was not showing any results. I performed the experiment by varying acquiring time and laser power for many times. But the results were the same. Please tell me the possible reasons?
a sample is a piece from a fuel element containing fuel exposed in nuclear reactor. We cut transversely the fuel element. what is happen with spectrum if the uranium emit gamma rays?
Extracted chitin was subjected to Kjeldahl method, the result of nitrogen level obtained was 1.7 % ; however, EDX elemental analysis present various values of nitrogen form 3 to 6 %.
How can we explain this difference?
is each method present specific meaning of percentage?
Currently working on an alloy which demands to understand the characteristic morphology of each element and the mixed sample (contains more than one element). The peak of one is lower though their peaks could so close. Is there any technical way of analysis?
I have EDX results and I want to caculate clinoptilolite formula. How I can do it while this mineral have smoewhat diffren ideal formula with variou amount of alkali and alkali earth metal.
I'm doing SEM/EDX for nanofiber with some additives and EDX results change from time to time for the same sample. Also the results are not consistent with the amounts of materials I use in my experiment. I'm thinking about test period, is there specific time requirement for the test? Is the time controllable or it's automatically determined by the device? And if detection period changes, will the results be the same or it is updated with time due to enhanced detection??
I have used an adsorbent. In FTIR analysis I was found carboxyl, hydroxyl, thiol and amino group in adsorbent. But in EDX result, the elements that can be detected only C, O, Na and S.The N element was not found.
Do you have any idea why this is happening?
I have done EDX analysis of welded joint of AA6082 T6 and AA6061 T6. Oxygen and carbon is found in the spectra. What are the causes for the same? Is it error due to some problem in sample preparation or any traces of air during testing.
Since titanium (L) and nitrogen (K) peaks are very close and overlap in EDX spectrum (in TEM, 200kv), how the presence of nitrogen according to the EDX result in one grain of polycrystalline material can be verified ? How nitrogen (K) peak is seperated from titanium (L) peak?
thanks in advance
I want to do compositional analysis of doped colloidal CsPbBr3 nanocrystals, by STEM-EDX.
However, even for short exposures, the electron beam induces carbon buildup on the sample, which dominates the EDX signal, and it becomes impossible to measure anything else.
Can someone indicate if and how they managed to do this type of measurement? Is the carbon buildup due to the organic ligands which are not attached to the nanocrystals? is there a simple way to remove them form the solution, to enable the measurement? Please note that I am not doing the measurement myself, so my knowledge of the technique is not very extensive.
Using only EDX it is not possible to distinguish between pyrite and marcasite, which, although they have equal compositions, have different crystalline structures. Or silica from quartz. I wonder if using the EBSD technique it is possible to differentiate one from another.
On the surface of a WC piece a special metal is coated. The thickness is not known.
Is EDX able to detect the coated material on the WC surface? Must the coated layer have a certain thickness in order to be detected?
I would like to ask whether normally Cu from a Cu grid is mapped on target samples on TEM-EDX images. I measured superparamagnetic zeolite samples by a TEM-EDX few times. Every images had Cu mapping images only
on the zeolite samples. I believe the Cu mapping images from the Cu grid as a background, because the samples do not have any Cu.
Do you know whether superparamagnetic samples affect to TEM and EDX? The superparamagnetic particles are Fe3O4.
I have some multiport extruded tubes with a certain white precipitate visible on the iner side of the tubes and would like to know a way to determine what that precipiate is.
During extrusion the aluminium multiport tubes are passed through a water quench to cool them down from an temperature in excess of 500°C to about 40°C. In some cases when the water enters into the ports of the MPE tube due to porosities a thin layer of white precipitate is observed which is mostly aluminium hydroxide. In severe cases a considerable amount of white powder can be detected. After performing an XRD on the white powder it was found to bayerite.
Also anodic dissolution of aluminium around the Al(Mn,Fe)/Al(Mn.Fe)Si precipitates was observed when some samples were analyzed under the SEM. Very minute quantities of oxygen could be detected with the EDX analysis on the SEM but these measurements cannot confirm the exact composition of the precipitates.
Is there a quick way to determine if the precipitate on the surface of the tube is Aluminium hydroxide?(without the need to perform XRD or any other time consuming analyses) And can any other type of precipitate that can form under these conditions?
Would be grateful for your inputs and suggestions.
I have synthesized Ru-doped mesoporous carbon. At low composition I could not get any XRD peak for Ru, however HAADF-TEM shows monodisperse Ru particle in the carbon substrate. As single atom does not give any XRD spectra, so are there minimum crystal structure at which XRD fails to give any spectra? Noted that EDX mapping and XPS show 0.2 at% of Ru.
The rice straw biochars were prepared under oxygen limited conditions in muffle furnace at 350⁰ C (350BC) and 550⁰ C (550BC) and that prepared under nitrogen conditions at 400⁰ C (CBC). From CHN analysis of rice straw and its biochars, 40, 52, 29, 26% carbon was observed in rice straw, 350BC, 550BC and CBC, respectively. From EDX analysis , 20% carbon was observed in rice straw and carbon was absent in all the biochars. The silicon content was 38, 17, 24 and 25% in rice straw, 350BC, 550BC and CBC, respectively. Can someone give reliable reason, why CHN and EDX give contrast results and carbon was absent in all the biochars in EDX analysis?
Hello, I am doing x-ray dispersive (EDX) analysis for Inconel 718 alloy. I have noticed that the elements with higher concentrations in Inconel 718 ( i.e: Nickel- 53%) is providing better accuracy than elements with lower concentration (i.e: Mo- 3%) when I compare the concentration result against available literature. From here, can I come to a conclusion that EDX provides more accurate results for elements with higher concentration in a sample? Thank you!
I am struggling to calculate the accurate weights of starting precursors to represent the formula Mg0.95Ni0.04Cr0.01O. The precursors are:
1. Mg(NO3)2.6H2O (M.W = 256.4 g/mol), M.W of Mg is 24.305 g/mol which represents about 9.47 %.
2. Ni(NO3)2.6H2O (M.W = 290.8 g/mol), M.W of Ni is 58.69 g/mol which represents about 20.18%.
3.Cr(NO3)3.9H2O (M.W = 400.14 g/mol), M.W of Cr is 51.996 g/mol which represents about 13 %.
I used 0.5 M (0.025 mol) by disolving the precursors in 50 ml water. To represent the chemical formula above, I variate the precursors amount as follow:
1- Mg(NO3)2.6H2O , 0.5 M x 0.95 = 0.475 M, (0.02375 mol). 6.0895 grams, to represent the amount of Mg, 6.0895 x 9.47% = 0.57722 grams,
2- Ni(NO3)2.6H2O, 0.5M x 0.04 = 0.02 M, (0.001 mol). 0.2908 grams, to represent the amount of Ni, 0.2908 x 20.18% = 0.05868 grams.
3- Cr(NO3)3.9H2O, 0.5 M x 0.01 = 0.005 M, (0.00025 mol). 0.100035 grams, to represent the amount of Cr, 0.100035 x 13% = 0.01299 grams.
by summation and dividing the results, I got , 89 % Mg, 9 % Ni, 2 % Cr.
Therefore, when I consider the wt%. , the calculated values do not represent the formula (Mg0.95Ni0.04Cr0.01O) becuase I use the weights of metal nitrate precursor not the bare elements Mg, Ni and Cr. Further, both Ni and Cr are heavier than Mg.
I believe that the quantitaive EDX results will give me very different values.
I used sol-gel method to produce the gel and heat treated at 400 C.
I hope I will get help.
Thanks in advance
As we know that the if the atomic percentage of copper is 66.85 Cu and Se is 33.15 , then the composition is Cu2Se. Is there any formula to calculate the elemental compositions of Cu3Se2,Cu5Se4,Cu7Se4 ...? If the atomic percentage of copper is 78.50 and Se is 21.50, then what will be the composition ?
Hi everyone, hope you're all okay. So I have some questions/doubts about eds mapping. Just some notes first: I always use the correct accelerating voltage to excite the elements I need, always use correct probe current to have a good dead time and counts and not forgetting to check the working distance, and last but not least I always try to perform eds with flat surface and polished (but sometime this is not possible).
My doubt is: sometimes when I do eds mapping the distribution of the elements appears dislocated. The pixels dislocates not corresponding to the SED image. Why this dislocations happens?
Besides the deslocated pixels, most maps is very "noisy", I've changed the resolution already on the software to 1024 instead of 4080.
Peform map in 4080 resolution takes too much time. So I would be very grateful if anyone give me some tips on how to improve eds maps.
Thank you for the attention
The carbon composition of steel stock is given as 0.06wt% and the EDX analysis of the ferrite phase gives 12.7wt% of C. How do you relate the two wt%s in terms of relative abundance? This situation is shown as an attachment below.
I need to decide which SEM (with EDX) model to buy. I am told that in going from 100 to 200 nA, there is not much to be gained. I just needed to cross check this claim and educate myself about specific cases where it is advisable to buy one vs another.
I had a Galfenol (Fe:Ga, 81:19 %at.) target made for sputtering, when I received the target I sent it for an EDX analysis and the results came back as Fe:Ga:C (60:11:29 %at)
I am curious about other people's experience with this type of target (or perhaps Fe), is this what one would typically see for the EDX and the C content ignored as a surface contaminant?And is a long pre-sputter time just used to ensure clearing of the C? And I am aware that the EDX itself can be the source of C in the readings.
Or do I have a questionable target?
The follow up would be the films, to ensure that they do not end up being a ternary FeGaC alloy.
I am curious if the surface roughness of a target is considered an important factor for sputter deposition, because if my target is rough I think there is a higher chance of contaminants becoming trapped in small pores, for instance organic contaminants like carbon.
If the surface roughness of the target is minimal and very smooth there is less areas/pores where these could become trapped.
For example, I had an EDX analysis done on a LiNBO3 off cut which I clean in acetone, it had a polished smooth side, and an unpolished rough side.
The smooth side came back without any other additional elements listed, but the rough side showed traces of C, K, Cl, in some of the points that were taken.
And I am curious for sputtering, if my target surface, for a new target, is not a polished surface, and I see other elements from the EDX analysis for this target, I expect I run the risk of deposited films of compositions other than what my target is supposed to be.
I understand pre-sputtering is used to clean a target surface before deposition, and some people suggest plasma cleaning in O2 for some time also to minimise contaminants.
But do people also polish their targets surface so that it is smooth to minimise pores where contaminants could become trapped?
I thought Calcium peaks are expected to appear in 3.6 eV only, but why does myne appear in other eV as well?I only understand Each peak represent the presence of element for that particular energy. How do i know which one is KAlpha or Kbeta
Someone sent me an EDX graph in which there are different peaks for gold at different region having different intensities. i am confused that how is it possible?
I have been sputtering an alloy of Fe Ga, when I get the EDX results of my film back there is a larger percentage of C present in the results, which is unexpected. I did notice that as the film thickness increases the relative percentage of C decreases.
And an EDX of my target now shows the presence of C on it, I think this should just be the surface of the target that is affected.
From the target manufacturer I have a document of the composition analysis of the target which does not indicate any trace of C within my target.
I think it is likely coming from the chamber, the target shield and clamps have blackened over time, during the course of heating during the process. Might that be the source? A dark ring starts to appear around my target after sputter.
My understanding of the sputtering process is that it should essentially be cleaning away the surface layer of the target during the process as the ion bombardment occurs. So I am not quite sure what may be happening here.
Any thoughts on this and possible remedies would be appreciated