Takeshi Namioka’s research while affiliated with Tohoku University and other places

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Publications (100)


VUV/SOFT‐X‐RAY SPECTROSCOPIC FACILITIES AT THE SYNCHROTRON RADIATION LABORATORIES IN JAPAN
  • Article

January 2008

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22 Reads

Photochemistry and Photobiology

Takeshi Namioka

The present status is described of the vacuum ultraviolet/soft-X-ray spectroscopic facilities at the synchrotron radiation laboratories in Japan. An overview is presented of the spectroscopic instruments available and under development at the SOR-RING at the Institute for Solid State Physics, University of Tokyo, the Photon Factory-ring at the National Laboratory for High Energy Physics, the UVSOR at the Institute for Molecular Science, and the TERAS at the Electrotcchnical Laboratory. Emphasis is placed upon the unique features of the instruments developed in Japan.


A Laser-Produced-Plasma VUV Continuum Source for Use with Conventional Monochromators

November 2006

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21 Reads

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2 Citations

Takeshi Kudo

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Katsuji Kaminishi

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[...]

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Takeshi Namioka

A systematic study of the reproducibility of the VUV continuum emitted from a laser-produced samarium-plasma source driven by a 10-Hz Q-switched Nd: YAG laser is reported, and its possible use with a conventional scanning monochromator in absorption spectroscopy is demonstrated.


The 1s2 1S0–1 snp 1P10 series of the helium spectrum

November 2006

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20 Reads

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4 Citations

The principal series of helium has been observed up to n = 50 in the 10th order of a 6.65-m spectrograph with synchrotron radiation. The series limit 1s 2S is determined to be 198 310.75 ± 0.04cm−1, the error estimate being the standard deviation in the fitting procedure. The term values and effective quantum numbers are also given for the 1snp levels (4 n 50). It is confirmed that rotational lines of the CO 4th positive bands can serve as wavelength standards, even for a high-resolution spectrum.


Modern developments in VUV spectroscopic instrumentation

November 2006

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12 Reads

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1 Citation

The recent developments of VUV spectroscopic instruments are reviewed in connection with the advances in design methods and fabrication technology of optical elements. The design concepts and the performance of several grating instruments for use with synchrotron radiation, both normal incidence and grazing incidence, are discussed, with special emphasis on the high-resolution capability in the photoelectric detection mode.


High-resolution absorption spectrum of atomic calcium in the vicinity of the 4p 2P1/2, 3/2 thresholds

September 2006

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13 Reads

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4 Citations

The absorption spectrum of atomic Ca has been observed photographically in the wavelength region between 1410-1330 Å with the high-resolution spectrograph at the Photon Factory. Complex structures of the observed spectrum just below the 4p 2P1/2 threshold are found to be well reproduced by the recent ab-initio calculation done by Kim and Greene.


Reflectance degradation of soft X-ray multilayer filters upon exposure to synchrotron radiation

September 2006

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10 Reads

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5 Citations

Reflectance degradation of soft X-ray reflection filters of Mo/Si and Rh/Si multilayers fabricated on SiC substrates was studied after exposure to Synchrotron Radiation for 26 and 140 hours, respectively. For both mirrors, darkening was seen at the exposed area, where peak reflectances around 100 eV photon energy were decreased from 45% to 35% in the Mo/Si and from 40% to 9.8% in the Rh/Si mirror. Unexposed areas retained much higher peak reflectances of over 30% in spite of the temperature increase of the substrates to over 110°C. At the exposed area of the Mo/Si mirror, a carbon layer was found and the attenuation factor in peak reflectance vs. photon energy was primarily explained by absorption in this layer.


Absorption cross sections of krypton in the photoionization threshold region

September 2006

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18 Reads

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2 Citations

The photoabsorption cross sections of Kr i in the photoionization threshold region [845-887 Å] have been measured with the highest resolving power (≥ 1.5 x 105) ever achieved in this wavelength region. The data obtained have been analyzed by means of least squares fitting with a line shape formula based on the multichannel quantum-defect theory. The quantum defects, width parameters, and asymmetry parameters thus determined are given together with the photoabsorption cross sections for the ns' and nd' series converging to the 2P1/2 ionization limit.


Soft X-ray reflectometer with a laser-produced plasma source

September 2006

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20 Reads

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12 Citations

A soft X-ray reflectometer with a laser-produced plasma source driven by a Q-switched Nd: YAG laser or a XeCl excimer laser was constructed. By comparing the reflectances of a multilayer mirror with the data obtained using synchrotron radiation, its usefulness for reflectance measurements in the soft X-ray region (40-130 eV) is demonstrated.


Design of a Conical Diffraction Type Plane Holographic Grating Monochromator for Use in the Energy Region of 1-4 keV

May 2004

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7 Reads

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2 Citations

The holographic plane grating with grooves of a radial form and its imaging properties in a converging beam are analyzed. The results are applied to the design of conical diffraction monochromators for the 1-4 keV region, and their expected performances are examined by means of ray tracing in comparison with the corresponding ruled radial grating. Design examples show that, in a conical diffraction monochromator covering the energy region of 1-4 keV, the holographic grating thus designed exhibits a resolving power equivalent to that of the ruled radial grating.


International Symposium on Optical Science and Technology

December 2002

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11 Reads

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6 Citations

Proceedings of SPIE - The International Society for Optical Engineering

A new type of monochromators that incorporates two kinds of Monk-Gillieson monochromators has been designed and constructed for the purpose of realizing an evaluation beamline for characterizing soft X-ray optical elements in a wide wavelength range of 0.7-25 nm. One of the monochromators is a conventional type equipped with three varied-line-spacing plane gratings, allowing a choice of two inclusion angles. The other is a new type that employs a scanning mechanism based on Surface Normal Rotation (SNR). The SNR scheme provides high throughput at short wavelengths and simple scanning mechanism by means of a grating rotation about its normal. The monochromators is operated in the SNR and conventional modes over the ranges of 0.7-2.0 nm and 2.0-25 nm, respectively. The system was installed on a beamline of the AURORA, a superconducting compact storage ring, at the Synchrotron Radiation Center, Ritsumeikan University. In this paper we describe the optical and mechanical designs of the monochromators, and a practical method of wavelength calibration. Also experimental data are shown which demonstrate the performance and versatility of the new type of Monk-Gillieson monochromators.© (2002) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.


Citations (62)


... Aberration correction and self-focusing are major characteristics of aberration-corrected holographic gratings. Aberrationcorrected gratings, such as the concave gratings used in sophisticated spectrometry and varied line-space (VLS) gratings in synchrotron radiation experiments, have a wide range of applications in the field of spectrum measurement [1][2][3][4][5]. The design of aberration-corrected holographic gratings is mainly based on the optical path function theory developed by Namioka [6,7]. ...

Reference:

Moiré alignment algorithm for an aberration-corrected holographic grating exposure system and error analysis
Design and Performance of Holographic Concave Gratings
  • Citing Article
  • October 1976

Japanese Journal of Applied Physics

... In this paper, we propose a third-order geometric aberration theory of the Offner imaging spectrometer to provide an alternative aberration-correction method. This method is an extension and new application of Namioka's theories [21][22][23][24][25][26]. Namioka and his team have shown aberration theories based on the light path function for a single grating or a double-element system that can correctly describe the individual aberrations and can be used to design an advanced optical system. ...

Geometric theory for the design of multielement optical system
  • Citing Article
  • January 2001

... To describe the geometrical aberration characteristics of the Offner imaging spectrometer and the holographic aberration characteristics of ACHG, which is recorded by a spherical wave under Rowland circle mounting, we derived both the geometrical aberration coefficients of the Offner imaging spectrometer and the holographic aberration coefficients of the ACHG based on the analysis of the LPF F. Figure 1 schematically shows the Offner imaging spectrometer with an ACHG under Rowland circle mounting [22,23]. The x axis is coincident with the grating normal. ...

Design and performance of toroidal holographic gratings.
  • Citing Article
  • January 1978

Journal of the Spectroscopical Society of Japan

... -(3) imply that the Mo/Si and Rh/Si multilayers may withstand still higher-power radia-Reflected intensity versus exposure time for the 27-layer Mo/Si multilayer prepared by IBS. Reflected intensity versus exposure time for the 27-layer Mo/Si multilayer prepared by MS. ...

Multilayer Reflection Filters For Soft X-Rays
  • Citing Conference Paper
  • December 1988

Proceedings of SPIE - The International Society for Optical Engineering

... In doing so, we must have accurate optical constants of various materials for soft x-rays, especially in the form of a very thin film ( 100 A thick). Such data are, however, conspicuously lacking at present; the data so far reported are mostly for bulk materials and film samples thicker than -1000 A. [2][3][4][5][6][7][8][9][10][11] Furthermore, it is often the case that a difference between the designed and the measured performance of a multilayer is attributed, with little or no reason, to a possible difference in the optical constants between a bulk and a thin film sample and/or to some factors arising from fabrication methods and techniques, such as film surface roughness and errors in layer thickness control. In reality, it has not been made clear how the optical constants of materials in a thin film form depend on the film thickness and the deposition method. ...

Fabrication and Evaluation of Mo-Si Multilayer Mirrors for Soft X-Rays
  • Citing Conference Paper
  • April 1987

Proceedings of SPIE - The International Society for Optical Engineering

... us denote the remaining (N -1) X (N -1) matrices and grilles by G and G and now consider their associated correlation functions.First, we write down the following relations: G,,K) = L(S,9,K) = -(N -K -1); 4 0 < K < N -1(10) Using normalization of the H matrix, we obtain hihi-hi)hi--E (1 + hj-h 0 jhoj.Kho) +h 0~)~ N-i L(S,S,K) --E (1 + hi. + hiK + hiohiK)-(1 + ho 1 j-+ h 0 j + hoijKhOj) K1) = (-1) (N-K-1). ...

Golay-type Static Multi-slit Spectrometer
  • Citing Article
  • November 1977

Journal of Modern Optics

... Here, we describe the characterization of the MP with SR and polarization analysis of the XRL. The SR experiments were performed using a high accuracy reflectometer installed in the BL-11 soft X-ray beamline for calibration of optical components at Ritsumeikan University, Japan [20]. This beamline has been newly constructed as an X-ray absorption fine structure (XAFS) spectroscopy beamline [21]. ...

New evaluation beamline for soft x-ray optical elements
  • Citing Article
  • March 2002

... function from Fermat's principle 9 has been investigated. Following the early effort by Underwood and Namioka who proposed a ray-traced spot diagram and a merit function to obtain the optimum spacing variation, 13 Kenta Amemiya and Toshiaki Ohta et al. did the pioneer work on the mathematical deduction for the coma correction term and presented a set of analytical equations to determine the VLS parameters. [14][15][16] Meanwhile, although the same set of equations were used, there seems to be inconsistency of the optical parameter definition between their consecutive work, [14][15][16] i.e., the η angle of the focusing mirror relative to the x ray in their coma correction term. ...

A new optical design method and its application to an extreme ultraviolet varied line spacing plane grating monochromator
  • Citing Article
  • August 1994

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment

... In the EUV range, generally, it is not uncommon to report slightly different optical constants for the same material in a report. Maehara et al. [99] reported slightly different optical constants for Pt and Rh thin films upon determining them using ADR and the photoelectric yield measurements from the same samples. Schlegel also showed different optical constants of Ru regarding ADR and TMMs [100]. ...

Optical constants of very thin Pt and Rh films determined from soft-X-ray reflectance and photoelectric yield measurements
  • Citing Article
  • May 1993

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms