Stephen Ramey’s research while affiliated with Intel and other places

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Publications (1)


Hot-Carrier Aging by Ultrafast Laser on 22FLL FinFET Technology
  • Conference Paper

April 2024

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41 Reads

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1 Citation

Ricardo Ascázubi

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Bahar Ajdari

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Curtis Shirota

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Stephen Ramey

Citations (1)


... Two-photon ultrafast laser absorption has been shown to induce permanent degradation in FinFET transistors. 2 The laser-assisted HC degradation reported in Ref. 2 is a different process from that using electrical HC although it exhibits many similarities. The laser technique enables the implementation of time-domain studies with multiple successive laser pulses. ...

Reference:

Laser-based FinFET hot-carrier degradation resolved in time-domain
Hot-Carrier Aging by Ultrafast Laser on 22FLL FinFET Technology
  • Citing Conference Paper
  • April 2024