Marcello Coppola’s research while affiliated with STMicroelectronics and other places

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Publications (24)


Typical wafer map with the notch at the bottom. Black dots locate defects
Examples of wafer map defect patterns. The first line shows the classes "CLUSTER-BIG", "DONUT-EOW-DENSE", "FINGERPRINT", and on the second line "FULL-WAFER", "HORIZONTAL-MULTI" and "MATRIX" classes are shown
Comparison of classification performances selecting data sets at different scales. The red curve represents the retained 224×\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\times $$\end{document}224 resolution
Inception module diagram
Proposed neural network architecture

+9

Accurate and energy efficient ad-hoc neural network for wafer map classification
  • Article
  • Full-text available

May 2024

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160 Reads

Journal of Intelligent Manufacturing

Ana Pinzari

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Thomas Baumela

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Liliana Andrade

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[...]

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Yield is key to profitability in semiconductor manufacturing and controlling the fabrication process is therefore a key duty for engineers in silicon foundries. Analyzing the distribution of the defective dies on a wafer is a necessary step to identify process shifts, and a major step in this analysis takes the form of a classification of these distributions on wafer bitmaps called wafer maps. Current approaches use large to huge state-of-the-art neural networks to perform this classification. We claim that given the task at hand, the use of much smaller, purpose defined neural networks is possible without much accuracy loss, while requiring two orders of magnitude less power than the current solutions. Our work uses actual foundry data from STMicroelectronics 28 nm fabrication facilities that it aims at classifying in 58 categories. We performed experiments using different low power boards for which we report accuracy, power consumption and power efficiency. As a result, we show that to classify 224×\times 224 wafer maps at foundry-throughput with an accuracy above 97% using a bit more than 1 W, is feasible.

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Automatisation pour l’industrie 4.0 avec des passerelles LoRaWan sécurisées

May 2023

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7 Reads

Les systèmes multiprocesseurs sur puce (MPSoC) sont des composants clés pour les applications complexes qui impliquent une grande pression sur la mémoire, les dispositifs de communication et les unités de calcul. Depuis vingt ans, MPSoC rassemble, lors d’un forum interdisciplinaire, des experts des systèmes matériels, des logiciels multicoeurs et des multiprocesseurs venus du monde entier. C’est pour célébrer le 20e anniversaire de MPSoC que cet ouvrage est publié, de même que le second tome sur les applications.Systèmes multiprocesseurs sur puce 2 est consacré aux applications. Il couvre la conception de MPSoC, les compilateurs et l’exploration d’architectures. Il décrit les méthodes d’optimisation et les outils permettant de porter des applications spécifiques sur les architectures MPSoC : la compilation, la consommation d’énergie et la communication sans fil sont détaillées, des exemples d’outils de modélisation et de CAO sont présentés ainsi que les plates-formes spécifiques pour l’automobile et l’informatique en temps réel.







Citations (16)


... The definition of our model is mostly empirical, as the current pre-defined neural networks are mainly intended for very complex problems, and these large models are simply not appropriate for inference on small electronic devices. More details about our particular defined model can be found in [9]. ...

Reference:

Inside the AI Accelerators: From High Performance to Energy Efficiency
Power Optimized Wafermap Classification for Semiconductor Process Monitoring
  • Citing Chapter
  • March 2023

... However, a failure in the cloud narrows down to limitations and latency in connectivity and security. Edge computing governances closer data to the substantial physical areas, avoiding the disvalued servitude of centralized servers [3,4]. Advanced AI models, in particular, are preferred for realtime industrial operations that burden with very less latency and very much happening privacy preservation. ...

Edge AI Platforms for Predictive Maintenance in Industrial Applications
  • Citing Chapter
  • March 2023

... While these techniques provide a strong foundation, studies such as Mohimont et al. [47] indicate an ongoing gap, noting that only 19% of grapes within a cluster are typically visible, which highlights the need for enhanced occlusion adjustment techniques. Additionally, Zabawa et al. [6] report frequent under-segmentation in dense grape clusters, pointing to the difficulties in achieving accurate yield estimates without advanced occlusion handling. ...

AI-Driven Yield Estimation Using an Autonomous Robot for Data Acquisition

... Their optimized model (RTSD-Net) with TensorRT achieved about 25.20 fps and performed 15% faster than the original YOLOv4-tiny model on Jetson Nano without significant loss of accuracy. Other promising applications of Edge-AI are air temperature forecasting [109], environment monitoring [110], autonomous navigation systems [111] and so on. ...

Innovative Vineyards Environmental Monitoring System Using Deep Edge AI

... Artificial Intelligence (AI) is a computational method that tried to imitate, in a simplified form, human intelligence to solve engineering problems that have escaped normal computer techniques [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20]. According to Russell and Norvig [2], it has been argued that AI can be linked to systems that able to think like people, behave like humans whereas AI able to think logically and act rationally. ...

AI in Food and Beverage Industry

... Authors argue that self-supervised training methods improve classification performance when datasets with several unlabelled data are used, which is the case of the WM-811K dataset. [13] presents experimentations with simplified AlexNet, MobiletNetV1, and VGG, so as to limit the number of parameters they require. This latter architecture leads to the best accuracy while requiring the least parameters. ...

Efficient Deep Learning Approach for Fault Detection in the Semiconductor Industry

... Although the number of parameters has considerably reduced, these architectures are still too large to be implemented in low-power hardware devices. Andrade et al. (2021) presents experimentations with simplified AlexNet, MobiletNetV1, and VGG, so as to limit the number of parameters they require. This latter architecture leads to the best accuracy while requiring the least parameters. ...

Efficient Deep Learning Approach for Fault Detection in the Semiconductor Industry
  • Citing Book
  • January 2021

... In the logistics sector, it is easy to see how optimizing such a tool can lead to efficient warehouse management-thanks to its ability to predict demand and customer behavior, it can optimize route selection or warehouse management (Vermesan et al., 2022). ...

Industrial AI Technologies for Next-Generation Autonomous Operations with Sustainable Performance
  • Citing Book
  • January 2022

... Dalam beberapa tahun terakhir, kemajuan teknologi pemantauan berbasis Supervisory Control and Data Acquisition (SCADA) telah banyak diterapkan Muhammad Irfan / Sistem Early Warning Deteksi Malfungsi pada Motor Listrik 3 Fasa Menggunakan Mikrokontroler Berbasis Lora Terintegrasi Scada untuk meningkatkan keandalan dan efisiensi pemeliharaan motor listrik industri (Chukwunweike et al., 2024;Stankov, 2024). SCADA memungkinkan pemantauan kondisi operasional secara real-time, di mana parameter seperti tegangan, arus, suhu, dan kecepatan putaran dapat dikontrol dari pusat kendali (Kaittan & Mohammed, 2024;Vermesan et al., 2022). Dengan sistem ini, deteksi dini terhadap potensi kerusakan motor menjadi lebih akurat, sehingga membantu mengurangi risiko downtime serta meningkatkan efisiensi pemeliharaan (Akbar et al., 2023;Kaittan & Mohammed, 2024). ...

An Intelligent Real-Time Edge Processing Maintenance System for Industrial Manufacturing, Control, and Diagnostic

Frontiers in Chemical Engineering

... It also makes the entire system more resilient to attacks and disruptions. Finally, the system is designed to comply with all relevant data protection and cybersecurity regulations, ensuring it meets the highest standards for security and privacy [5][6][7]. ...

New Waves of IoT Technologies Research – Transcending Intelligence and Senses at the Edge to Create Multi Experience Environments