M.T. Postek's scientific contributions

Publication (1)

Article
A metrological electron microscope has been developed at the National Institute of Standards and Technology (NIST) traceable to national standards of length, and a new prototype magnification standard meeting the current needs of the scanning electron microscope (SEM) user community has been fabricated. This metrology instrument is designed to cert...

Citations

... Silicon films can have a microcrystalline or amorphous structure. Microcrystalline silicon was used in [54]. This was because it is impossible to create a film of amorphous silicon with a thickness of more than 1 μm by conventional technologies, while a film thickness of 4-5 μm is required. ...