M. Prokopp’s scientific contributions

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Publications (1)


Electrical testing of fine and ultra-fine structures
  • Article

July 1996

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M. Prokopp

The ever-increasing complexity of electronic circuits and its corresponding reduction in the size of the interconnection interface, leads to problems in electrical testing which, if they can be overcome at all, require expensive adapter methods. Using a new Pin-Translator, even highly complex layouts can be cost-effectively tested. The Pin-Translator is a conventional printed circuit board located between the test board and test equipment. It transforms the irregularly positioned test-points on the surface of the board being tested into a formatted pattern acceptable by the test equipment. The advantages and drawbacks of this approach are considered.