Corinna Grabner’s scientific contributions

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Publications (3)


Multimodal Named Entity Recognition for Semiconductor Failure Analysis
  • Conference Paper
  • Full-text available

November 2023

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78 Reads

Anna Safont-Andreu

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Corinna Grabner

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During the activity in the Failure Analysis (FA) laboratory, all corresponding findings and conclusions are included in a series of documents known as the FA reports. They shall, in the first place, inform the requestor about the analysis results. But additionally, they shall provide information to solve similar cases. Therefore, these documents play a key role in preserving the knowledge acquired by the engineers as they become available for consultation during future works. The different information systems in FA consist of databases, file shares, wikis, or other human-readable forms. However, the heterogeneity of these databases and the large number of independent documents make it inefficient for manual consultation. In this context, this paper proposes an application of Natural Language Processing (NLP) known as Named Entity Recognition (NER), consisting of an AI-based detection of key concepts in textual data in the form of annotations. These annotations can then be used to boost search systems or other AI models.

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A BERT-Based Report Classification for Semiconductor Failure Analysis

October 2022

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141 Reads

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4 Citations

Failure Analysis (FA) is a complex activity that requires careful and complete documentation of all findings and conclusions to preserve knowledge acquired by engineers in this process. Modern FA systems store this data in text or image formats and organize it in databases, file shares, wikis, or other human-readable forms. Given a large volume of generated FA data, navigating it or searching for particular information is hard since machines cannot process the stored knowledge automatically and require much interaction with experts. In this paper, we investigate applications of modern Natural Language Processing (NLP) approaches to the classification of FA texts with respect to electrical and/or physical failures they describe. In particular, we study the efficiency of pretrained Language Models (LM) in the semiconductors domain for text classification with deep neural networks. Evaluation results of LMs show that their vocabulary is not suitable for FA applications, and the best classification accuracy of appr. 60% and 70% for physical and electrical failures, respectively, can only be reached with fine-tuning techniques.

Citations (1)


... NLP approaches [45,46] classify FA reports according to their physical failures and corresponding electrical characterizations. In the first case, the authors apply classic ML techniques with TF-IDF vectorization and, in the second, deep learning methods based on a SciBERT [47]-a language representation model pre-trained on scientific texts. ...

Reference:

Artificial Intelligence Applications in Semiconductor Failure Analysis
A BERT-Based Report Classification for Semiconductor Failure Analysis