Chunxia Zhang’s research while affiliated with Xi'an Jiaotong University and other places

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Publications (1)


Surveillance of high-yield processes using deep learning models
  • Article

August 2024

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35 Reads

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5 Citations

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Chunxia Zhang

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Quality testing and monitoring advancements have allowed modern production processes to achieve extremely low failure rates, especially in the era of Industry 4.0. Such processes are known as high-yield processes, and their data set consists of an excess number of zeros. Count models such as Poisson, Negative Binomial (NB), and Conway-Maxwell-Poisson (COM-Poisson) are usually considered good candidates to model such data, but the excess zeros are larger than the number of zeros, which these models fit inherently. Hence, the zero-inflated version of these count models provides better fitness of high-quality data. Usually , linearly/non-linearly related variables are also associated with failure rate data; hence, regression models based on zero-inflated count models are used for model fitting. This study is designed to propose deep learning (DL) based control charts when the failure rate variables follow the zero-inflated COM-Poisson (ZICOM-Poisson) distribution because DL models can detect complicated non-linear patterns and relationships in data. Further, the proposed methods are compared with existing control charts based on neural networks, principal component analysis designed based on Poisson, NB, and zero-inflated Poisson (ZIP) and non-linear principal component analysis designed based on Poisson, NB, and ZIP. Using run length properties, the simulation study evaluates monitoring approaches, and a flight delay application illustrates the implementation of the research. The findings revealed that the proposed methods have outperformed all existing control charts.

Citations (1)


... Mahmood et al. (2021) further introduced memory-type data-based and generalized linear model-based control charts to monitor the increasing average defect counts in a high-quality process. Ibrahim et al. (2024) suggested deep learning (DL) based control charts where the failure rate variables follow the zero-inflated Conway-Maxwell-Poisson distribution as DL models can identify complicated non-linear patterns and relationships in data. This article proposes an enhanced CUSUM scheme, called wCUSUM, where the difference between the actual and in-control values of nonconforming units is raised to an exponent w. ...

Reference:

Modified cumulative sum scheme for monitoring attributes
Surveillance of high-yield processes using deep learning models
  • Citing Article
  • August 2024