Ameer Ghazi's scientific contributions

Publication (1)

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NiO thin films were grown via chemical spray pyrolysis (CSP) technique. X-ray diffraction (XRD) styles showed cubic phase and dominant direction at (200). The crystallite size values increase from (13.53 to 15.83) nm via B content. AFM results indicate a smooth surface with RMS roughness from 7.65 nm to 4.92 nm of Undoped NiO, NiO: 2% B and NiO: 4%...