Alfred Schirmacher's research while affiliated with Physikalisch-Technische Bundesanstalt and other places

Publications (8)

Article
The correlation of single-particle imaging and absorption spectroscopy made the development of sizing curves possible and enabled rapid size determination of semiconductor nanocrystals based solely on optical properties. The increasing demand and production of such materials has resulted in a question of comparability between existing models and ad...
Article
Based on a combined analysis of spectroscopic ellipsometry, reflectance and transmittance measurements as well as spectrally resolved luminescence measurements and spectral responsivity measurements, we present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range 250 – 1450 nm. A systematic meas...
Article
We analyze the uncertainty of the coefficient of band-to-band absorption of crystalline silicon. For this purpose, we determine the absorption coefficient at room temperature (295 K) in the wavelength range from 250 to 1450 nm using four different measurement methods. The data presented in this work derive from spectroscopic ellipsometry, measureme...
Article
Based on a combined analysis of spectroscopic ellipsometry, reflectance and transmittance measurements as well as spectrally resolved luminescence measurements and spectral responsivity measurements, we present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range 250 - 1450 nm. A systematic meas...

Citations

... where ε Si ≡ ε Si 1 + iε Si 2 = 12.709 + i1.7146 × 10 −3 is the permittivity of Si at λ = 1030 nm wavelength [26], k 0 = 2π/λ is the wavevector in free space, and ε air ≡ ε air 1 = 1 is the permittivity of air. The SPP wavelength 2π/k spp 1 = 1.07 µm (Equation (1)) and the propagation length is 1/(2k spp 2 ) = 17.3 mm (Equation (2)). ...