M. R. Khanlary

Imam Khomeini International University, Kazvin, Qazvīn, Iran

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Publications (5)5.29 Total impact

  • M. R. Khanlary · A. Hajinorozi · S. Baghshahi
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    ABSTRACT: We report synthesis and characterization of nanoparticles and thin films of undoped and cerium doped zinc oxide (Ce:ZnO).Samples were prepared by sol–gel and spin coating method. The effect of cerium concentrations, as a rare- earth impurity, on structural and optical properties of ZnO is examined. X-ray diffraction (XRD) measurements have proven that the films are polycrystalline with the (101) as preferential crystallographic orientation. Grain size of the prepared ZnO NPs is approximately 20 nm and for the doped samples is ~43 nm. From the differential thermal analysis crystallization thermal threshold was detected to be 400 °C. As observed by field emission scanning electron microscopy, XRD and optical transmission, the film microstructure is strongly dependent on the dopant concentration. Data obtained from the UV–Visible spectroscopy shows a blue shift in the absorption edge of cerium doped ZnO which is confirmed by optical band gap calculation.
    No preview · Article · Aug 2015 · Journal of Inorganic and Organometallic Polymers and Materials
  • A. Reyhani · M.R. Khanlary · V. Vahedi
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    ABSTRACT: In this research, ZnO nanostructure hexagonal pyramid rods with high optical and structural quality were synthesized by the simple thermal chemical vapor deposition of Zn powder without a metal catalyst. Surface morphologies were characterized by scanning electron microscopy (SEM). XRD analyses demonstrated that ZnO hexagonal pyramid rods had a wurtzite structure with the orientation of (002). Investigation of optical properties of samples by photoluminescence spectrum exhibited a sharp UV emission peak at 380nm. The quality and composition of the ZnO pyramid rods were characterized using the Fourier transform infrared spectrum (FTIR) at room temperature. In addition, the growth mechanism of ZnO hexagonal rods is also briefly discussed.
    No preview · Article · Jan 2014 · Iranian Journal of Physics Research
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    Mohammad Reza Khanlary · Vahid Vahedi · Ali Reyhani
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    ABSTRACT: In this research high-quality zinc oxide (ZnO) nanowires have been synthesized by thermal oxidation of metallic Zn thin films. Metallic Zn films with thicknesses of 250 nm have been deposited on a glass substrate by the PVD technique. The deposited zinc thin films were oxidized in air at various temperatures ranging between 450 °C to 650 °C. Surface morphology, structural and optical properties of the ZnO nanowires were examined by scanning electron microscope (SEM), X-ray diffraction (XRD), energy dispersive X-ray (EDX) and photoluminescence (PL) measurements. XRD analysis demonstrated that the ZnO nanowires has a wurtzite structure with orientation of (002), and the nanowires prepared at 600 °C has a better crystalline quality than samples prepared at other temperatures. SEM results indicate that by increasing the oxidation temperature, the dimensions of the ZnO nanowires increase. The optimum temperature for synthesizing high density, ZnO nanowires was determined to be 600 °C. EDX results revealed that only Zn and O are present in the samples, indicating a pure ZnO composition. The PL spectra of as-synthesized nanowires exhibited a strong UV emission and a relatively weak green emission.
    Full-text · Article · Dec 2012 · Molecules
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    M. R. Khanlary · E. Salavati
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    ABSTRACT: Physical vapor deposition of tin-doped lead selenide (Sn/PbSe) thin films on SiO2 glass is described. Interaction of high-energy Ar+ ions bombardment on the doped PbSe films is discussed by XRD analysis. The improvement of optical band gap of Sn/PbSe films irradiated by different doses of irradiation was studied using transmission spectroscopy.
    Preview · Article · Jun 2012 · Advances in Condensed Matter Physics
  • M.R. Khanlary · S. Isazadeh
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    ABSTRACT: In this Letter thin films of zinc oxide (ZnO) are prepared by sol-gel method and deposited on glass substrate to evaluate structural and optical properties of the film. The films were grown at different thicknesses in the range of 100-180-nm. The properties of layers were characterised using X-ray diffractometer (XRD), atomic force microscope (AFM) and optical spectrophotometer to evaluate the quality of the thin film for photovoltaic applications. The results from XRD pattern revealed that the grown films exhibit wurtzite structure with (002) preferential plane. The results from AFM data revealed that the films had nano-sized grains with a grain size from-25 to 60-nm depending on the film thickness. The optical spectrophotometer studies exhibited direct allowed transition with an energy bandgap of 3.12-3.02-eV for films with thicknesses of 100-180-nm, respectively. The refractive index as well as extinction coefficient of films was also measured.
    No preview · Article · Oct 2011 · Micro & Nano Letters