[Show abstract][Hide abstract] ABSTRACT: The hot electron induced mechanism disturbing the stored information in inhibited bit lines during the programming of nonvolatile memories with NAND architecture is studied in detail using a new dedicated advanced physical simulation scheme for the first time.
[Show abstract][Hide abstract] ABSTRACT: Linear and non-linear transport of holes in strained Si and SiGe on insulator inversion layers has been simulated. A deterministic method based on the Fourier expansion of the distribution function is proposed to solve the BTE. The model takes into account the fully anisotropic transition rates of the scattering mechanisms and the Pauli principle. The simulated low-field mobility and drift velocity reproduce experimental data for different MOS structures. (c) 2008 Elsevier Ltd. All rights reserved.
No preview · Article · Dec 2007 · Solid-State Electronics