Y.H. Lee

Sookmyung Women's University, Sŏul, Seoul, South Korea

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Publications (1)1.39 Total impact

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    ABSTRACT: Dependences of magnetoresistance and morphology upon the insertion of very thin magnetic layers at interfaces between magnetic and nonmagnetic layers in Co/Cu and Ni<sub>81</sub>Fe<sub>19</sub>/Cu multilayers have been investigated. The Co/Cu multilayers with inserted Fe thickness of 0.5~1.0 Å have the MR ratio of about 18% more than the noninserted multilayers, and the MR ratio in the NiFe/Cu multilayers with inserted Co of thickness of 3 Å was found to be significantly increased. These results can be explained by the enhanced interlayer antiferromagnetic coupling and spin-dependent scattering phenomena at the interface. Of particular interest, the “Clustered out-growth” in the surface morphology of these multilayers was observed
    No preview · Article · Oct 1996 · IEEE Transactions on Magnetics