Publications (1)0 Total impact
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ABSTRACT: Product F<sub>max</sub> shift is shown to be mainly due to HCI and NBTI. This is because the likelihood of a TDDB event in the product speed path is negligible. An exponential drain current and voltage dependence of HCI and a power-law gate voltage dependence of NBTI are shown to fit the F<sub>max</sub> shift quite well for realistic guardbands.