[Show abstract][Hide abstract] ABSTRACT: A 0.25 μm CMOS serializer ASIC, designed using radiation tolerant layout practice, was exposed to proton beam at various flux levels and accumulated fluence over 1.9times10<sup>15</sup> protons/cm<sup>2</sup> (100 Mrad (Si)). The ASIC survived this total ionizing dose (TID) with no degradation in function. Single event effect (SEE) cross-sections are also calculated.
[Show abstract][Hide abstract] ABSTRACT: Accelerated lifetime test has been carried out for 147 days on the custom-made optical transmitters used in the ATLAS Liquid Argon Calorimeter front-end electronics readout system. The lifetime of these optical transmitters is estimated to be greater than 200 years and exceeds the design goal for the LHC. The random failure rate has been estimated at 9.6×10-7 per hour at 90% confidence level.