Tao Zhang

University of Florida, Gainesville, Florida, United States

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Publications (5)4.8 Total impact

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    ABSTRACT: A peak/RMS power detector with ges40 dB dynamic range is presented. The simulated frequency response is flat to 60GHz and the measured response is flat to 20 GHz. Analysis shows that the Meyer detector, originally developed as a peak detector, can be used for RMS detection with an error less than 0.5dB over an approximately 20 dB range, comparable to the popular RF/microwave diode detector. The range for RMS detection is extended by cascading several stages of attenuators and detectors, leading to a circuit suitable for applications such as embedded RFIC test. The power detector is only 700times550 mum<sup>2 </sup> including all AC and DC bond pads
    No preview · Article · Oct 2006 · IEEE Journal of Solid-State Circuits
  • Tao Zhang · W.R. Eisenstadt · R.M. Fox
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    ABSTRACT: A peak/RMS power detector with up to 20 GHz bandwidth and ≥ 40 dB dynamic range is presented. The design is based on cascading several stages of attenuators and detectors. Analysis shows that the Meyer detector, originally developed as a peak detector, can be used for RMS detection over an approximately 20 dB range, comparable to the popular RF/microwave diode detector. The new cascaded structure extends the dynamic range for RMS detection, providing a circuit suitable for applications including embedded RFIC test.
    No preview · Conference Paper · Nov 2005
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    ABSTRACT: This paper presents a wide-bandwidth, high dynamic range, BiCMOS RF rms detector based on the dynamic translinear principle. A current-domain circuit carries out the main computation, and a circuit compensates for errors due to finite transistor gain. Wide-bandwidth input and output circuits allow connecting voltage-mode signals to the internal current-mode circuitry. Measurements on a prototype chip demonstrate that the circuit is suitable for embedded on-chip testing, particularly for "alternative test" of RF circuits.
    No preview · Article · Nov 2005 · IEEE Transactions on Instrumentation and Measurement
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    ABSTRACT: The paper presents recent progress in the development of embedded test for RF/microwave circuits. This work includes compact on-chip circuits designed for (1) microwave signal sampling (5 GHz couplers, baluns, and combiners), and (2) microwave/RF signal detection circuits (5 GHz peak detector and 1 GHz RMS detector).
    No preview · Conference Paper · Jan 2005
  • Tao Zhang · W.R. Eisenstadt · R.M. Fox
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    ABSTRACT: The principles of a RF power detector using bipolar transistors are analyzed and a new RF power detector for embedded RF IC test is proposed. The new detector uses a voltage divider to provide unequal ac signals for its differential input. It has a more linear transfer function for large-signal detection than previously reported detectors. Also, the detector retains its square-law transfer characteristics for low-level-signal detection. The errors in linear or square-law region operation are within 2%. The crossover region between detector linear and square-law operation is minimized to 30∼50mV and its detection error is within 8% using either linear or square-law estimation. The detector has 65dB dynamic range and it can work with 5GHz or higher signals as compared to roughly 30dB dynamic range in R.G. Meyer (1995).
    No preview · Conference Paper · Jun 2004