Soft X-ray laser spectroscopy on trapped highly charged ions at FLASH

ArticleinPhysical Review Letters 98(18):183001 · June 2007with11 Reads
Impact Factor: 7.51 · DOI: 10.1103/PhysRevLett.98.183001 · Source: PubMed

    Abstract

    In a proof-of-principle experiment, we demonstrate high-resolution resonant laser excitation in the soft x-ray region at 48.6 eV of the 2 (2)S(1/2) to 2 (2)P(1/2) transition of Li-like Fe23+ ions trapped in an electron beam ion trap by using ultrabrilliant light from Free Electron Laser in Hamburg (FLASH). High precision spectroscopic studies of highly charged ions at this and upcoming x-ray lasers with an expected accuracy gain up to a factor of a thousand, become possible with our technique, thus potentially yielding fundamental insights, e.g., into basic aspects of QED.