A Novel Test Generation Methodology for Adaptive Diagnosis
This paper presents a automatic test pattern generation technique to improve the diagnostic resolution of a given test set. Each test pattern generated by existing techniques detects a large number of faults. Identifying the faulty candidate from a large set of possible fault candidates is extremely difficult and time consuming. A novel framework to adoptively generate additional patterns for diagnosing the faulty location is presented. The additional patterns prune a set of fault free candidates from the possible fault candidates. The proposed technique improves the diagnostic resolution where each new pattern detects only a small number of faults and each fault is detected by few patterns. The proposed method is applicable to any fault model and distinguishes a large number of faults with a small number of patterns. For simplicity we demonstrate the effectiveness of the approach on the path delay fault model.
Data provided are for informational purposes only. Although carefully collected, accuracy cannot be guaranteed. The impact factor represents a rough estimation of the journal's impact factor and does not reflect the actual current impact factor. Publisher conditions are provided by RoMEO. Differing provisions from the publisher's actual policy or licence agreement may be applicable.