A 2-ps Resolution Wide Range BIST Circuit for Jitter Measurement

Conference PaperinProceedings of the Asian Test Symposium · November 2007with8 Reads
DOI: 10.1109/ATS.2007.46 · Source: IEEE Xplore
Conference: Asian Test Symposium, 2007. ATS '07. 16th

    Abstract

    In this paper, we propose a novel built-in self-test (BIST) circuit to directly measure cycle-to-cycle jitter. The clock-under-test is under-sampled by this measurement circuit and the jitter values are transformed into digital words. A time-amplified technique is applied to obtain relatively higher resolution with smaller hardware overhead. Experimental results show that our proposed circuit is able to measure the jitter providing the clock frequency up to 2 GHz with resolution of 2 picoseconds.