An HDL-Based Platform for High Level NoC Switch Testing

Conference PaperinProceedings of the Asian Test Symposium · November 2007with8 Reads
DOI: 10.1109/ATS.2007.97 · Source: IEEE Xplore
Conference: Asian Test Symposium, 2007. ATS '07. 16th


    This paper presents a non-scan method of NoC switch testing. The method requires addition of test-mode hardware for NoC switches and processing elements which is much less than what is required for most scan methods. Associated with our proposed test-mode of an NoC, we have developed a test environment based on high-level switch faults. The test environment applies test packets to the NoC-under-test in its test-mode and generates an NoC fault dictionary to be used for error detection of an NoC running in the test-mode. Proposed fault models and test strategy will be discussed in this paper.