Conference Paper

Evaluation of Reliability and Data Retention of an Irradiated Nonvolatile Memory

Maxwell Technol. Inc., San Diego
DOI: 10.1109/RADECS.2005.4365649 Conference: Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Source: IEEE Xplore


Space systems require high reliability nonvolatile memory. This paper analyzes the reliability of an EEPROM for data retention, endurance and radiation performance across multiple die lots.