A method for correcting the effect of specimen drift on coherent diffractive imaging

School of Physics, University of Melbourne, Victoria 3010, Australia.
Ultramicroscopy (Impact Factor: 2.44). 02/2010; 110(4):359-65. DOI: 10.1016/j.ultramic.2010.01.014
Source: PubMed


Coherent diffractive imaging involves the inversion of a diffraction pattern to find the wave function at the exit-surface plane of the specimen. It is a promising technique for imaging, for example, nanoparticles with electrons and biological molecules with X-rays. If the illumination is not a plane wave of infinite extent, then a relative drift between the illumination and the object introduces errors into the diffraction pattern; an issue which is often overlooked. This may be of particular importance for applications with electron microscopes which use nanoscale probes. Here we show that beams which are uniform over a sufficiently large region can be used to pose a phase retrieval problem that is immune from specimen drift, provided suitable analysis of the diffraction data is undertaken. The method only applies to objects contained within a support that is smaller than a uniform region of the beam.

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