Minimizing body instability in deep sub-micron SOI MOSFETs for sub-1 V RF applications

Conference Paper · February 1999with3 Reads
DOI: 10.1109/VLSIT.1999.799323 · Source: IEEE Xplore
Conference: VLSI Technology, 1999. Digest of Technical Papers. 1999 Symposium on

    Abstract

    We report an extensive study on the SOI body instability and the
    noise constraint dependence on device scaling for sub-1 V RF SOI CMOS
    applications. Also, the device parameters associated with these issues
    are addressed