Minimizing body instability in deep sub-micron SOI MOSFETs for sub-1 V RF applications

Conference Paper · February 1999with3 Reads
DOI: 10.1109/VLSIT.1999.799323 · Source: IEEE Xplore
Conference: VLSI Technology, 1999. Digest of Technical Papers. 1999 Symposium on


    We report an extensive study on the SOI body instability and the
    noise constraint dependence on device scaling for sub-1 V RF SOI CMOS
    applications. Also, the device parameters associated with these issues
    are addressed