Article

Radiation sensor based on thin-film CdTe/CdS device structure and its radiation resistance under high-intensity hydrogen plasma

AIP Publishing
Journal of Applied Physics
Authors:
  • National Technical University of Ukraine Kharkov Polytechnic Institute
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Abstract

In this work, the ability of CdTe/CdS thin-film device structures prepared by the hot-wall method to detect ionizing radiation was investigated. The samples were fabricated with a structure typical of CdTe/CdS-based solar cells and exhibit radiation sensitivity even without the application of an external voltage. This allows such structures to be used as low-voltage radiation sensors. An investigation of the radiation resistance of the structures, namely, the effect of irradiation with high-intensity hydrogen plasma H 2 ⁺ on the crystal structure and performance, was carried out. It was shown that the device structures remained operational after two plasma pulses at an ion density of 2 × 10 ²³ m ⁻² and an energy density of up to 0.2 MJ/m ² . With further exposure to plasma, the device structures deteriorated, first, due to gradual sputtering off of the back contact, and, second, as a result of diffusion processes that occurred when the structures were heated to high temperatures, due to which the entire volume of the CdTe base layer got converted into a CdS x Te 1−x solid solution.

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... At the same time, it follows from such studies, that the primary influence on degradation is not so much the energy of the particles in the flow as the accumulated radiation dose. In Ref. [13], we began our investigation of influence of high-intensity plasma flows on CdS/CdTe, with the focus on the irradiation with hydrogen plasma and its effects on the photoelectric properties and crystal structure of these device structures. In that study, the irradiation doses were established, at which structural changes at the CdS/CdTe interface begin to occur, which causes a decrease in the output photoelectric parameters of such device structures. ...
... In the initial state, the device structures had photosensitivity and could be used as SCs and radiation sensors of -particles [13]. The free surface of the cadmium telluride films was smooth, had a typical grey colour, and the average grain size of the layers was 1 -3 µm. ...
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The influence of pulsed helium plasma irradiation, with a 10 ms duration and a surface energy load of 0.2 MJ m-2, on the elemental and phase composition, surface morphology and crystal structure of thin-film heterosystems based on CdS/CdTe was studied. The cadmium sulphide and cadmium telluride layers were deposited by condensation via a hot wall method onto a glass substrate covered with an FTO layer. It was found that after one pulse, the device structure remains in working condition. An increase in the irradiation dose leads to surface sputtering, the formation of through pores 0.5-2 m in size, and a microcracks network with two characteristic scales. One crack network is formed in the glass substrate, and the second network is formed with cracks in the CdTe film. It is shown that the thermal effect of plasma stimulates the diffusion of sulphur; as a result, the proportion of CdTe1-xSx solid solutions formed in the process of obtaining the CdS/CdTe heterosystem increases. In addition, the sulphur content increases in these solid solutions, which leads to their decomposition with the separation of the CdS1-yTey solid solution phase. These solid solutions migrate to the CdTe surface through cracks and are observed as separate crystals.
... Group ⅡB-ⅥA semiconductors have garnered considerable interest due to their unique photoelectric, photochemical, and photocatalytic characteristics [1,2]. These semiconductor materials are extensively used in modern solid-state electronic devices, such as solar panels [3], light-emitting diodes [4,5], photodetectors [6,7], nuclear radiation detectors [8,9], lasers [10,11] and photoelectric chemical cell gas sensors [12]. These semiconductor materials may experience various complex environments during the utilization of devices. ...
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Based on the local bond average approach and the definition of the thermal expansion coefficient, the temperature-dependent thermal expansion coefficient for Group ⅡB-ⅥA semiconductors has been established. The consistency in theoretical results and reported values confirms that the higher the Debye temperature, the wider the nonlinear range of the thermal expansion coefficient at low temperatures, and the lower the change rate for the temperature-dependent thermal expansion coefficient. The bigger the ionicity, the shorter the bond length, and the smaller the thermal expansion coefficient. The influence of ionicity on the thermal expansion coefficient is greater than those of both Debye temperature and cohesive energy. The present analytical function is beyond the scope of available approaches, which not only provides a new understanding of the physical mechanism of the thermal expansion coefficient response to temperature but also is helpful in the quantitative design of semiconducting optoelectronic devices.
... Among them, the correction of radiation intensity signal is particularly prominent (Pokutnii 2023). Due to the complexity and variability of the marine environment, the radiation intensity signals received by the LiDAR system are often affected by many factors (Meriuts et al. 2022), such as atmospheric attenuation, water absorption, scattering, wave fluctuations, marine biological activities, etc. These factors will not only lead to attenuation and distortion of signal strength (Kotarba 2022), but also may introduce noise and interference, thus seriously affecting the accuracy and reliability of surveying and mapping results. ...
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... The stability of CdTe is due to its high binding energy of 6 eV per atom and its high melting point of 1041 • C [13]. Its potential applications include various types of semiconductor devices like solar cells [14], sensors [15], medical imaging [16], and X-ray and γ -ray detectors [17]. ...
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Radiation resistance of semiconductor detectors of corpuscular and gamma radiation
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L.N. Davydov, A.A. Zakharchenko, D.V. Kutny, V.E. Kutny, I.M. Neklyudov, A.V. Rybka, I.N. Shlyakhov, "Radiation resistance of semiconductor detectors of corpuscular and gamma radiation," Bulletin of KhNU Physical series "Nuclei, particles, fields" 627, 3-22 (2005). [in Russian].
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M. Kharchenko, "Using of closed box deposition technique for preparation of cadmium telluride thin films," Physics and chemistry of solid state. 8(4), 718-721 (2007). [in Ukraine] http://page.if.ua/uploads/pcss/vol8/0804-10.pdf.
Radiation hardness of cadmium telluride solar cells in proton therapy beam mode
  • J Y Nam
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Nam, J.Y. Song, "Radiation hardness of cadmium telluride solar cells in proton therapy beam mode,"