Over the years a number of atom probe books have been written by various authors
[1–10], so why write another one you might ask. We believe that this book is unique
in specifically targeting atom probe adopters who are new to the technique. The
book introduces new users to the process of performing all of the aspects of a Local
Electrode Atom Probe™ experiment. It includes the fundamentals of preparing
specimens for the microscope from a variety of materials, details of the instrumentation
used in data collection, parameters under which optimal data are collected,
current methods of data reconstruction, and selected methods of data analysis. In
addition, certain topics are explained specifically from a user perspective and
include details that are often learned only through trial and error, allowing users
to succeed more quickly in the challenging areas of specimen preparation and data
collection.
This book is meant to be a useful reference for the “conventional wisdom” type
of information that is not always found in academic books and is usually gained
only through experience. It is not meant to be a comprehensive treatment of atom
probe tomography but rather an everyday reference for data collection on the local
electrode atom probe and for the specimen preparation and data analysis that go
along with such experiments. For the most part, we have dealt with more advanced
topics, such as the details of the spatial reconstruction equations, by including the
information in appendices or by simply referring the reader to other textbooks or
journal articles. In this way we hope to have produced a very usable reference for
both novice users and experienced scientists. The future of atom probe tomography
is bright, and we hope that the path to adoption will be clearer with the availability
of this book.
1. Mu¨ller, E.W., Tsong, T.T.: Field Ion Microscopy Principles and Applications. Elsevier,
New York (1969)
2. Hren, J.J., Ranganathan, S. (eds.): Field-Ion Microscopy. Plenum Press, New York (1968)
3. Bowkett, K.M., Smith, D.A.: Field-Ion Microscopy. North-Holland, Amsterdam (1970)
4. Muller, E.W., Tsong, T.T.: Field Ion Microscopy, Field Ionization and Field Evaporation, vol.
4. Progress in Surface Science (1973)
5. Miller, M.K., Smith, G.D.W.: Atom Probe Microanalysis: Principles and Applications to
Materials Problems. Materials Research Society, Pittsburgh (1989)
6. Sakurai, T., Sakai, A., Pickering, H.W.: Atom probe field ion microscopy and its applications.
Adv. Electron. Electron. Phys. 20, 1–299 (1989)
7. Tsong, T.T.: Atom-Probe Field Ion Microscopy: Field Ion Emission and Surfaces and
Interfaces at Atomic Resolution. Cambridge University Press, Cambridge, Great Britain
(1990)
8. Miller, M.K., Cerezo, A., Hetherington, M.G., Smith, G.D.W.: Atom Probe Field Ion Microscopy.
Oxford University Press, Oxford (1996)
9. Miller, M.K.: Atom Probe Tomography: Analysis at the Atomic Level. Kluwer Academic/
Plenum Publishers, New York (2000)
10. Gault, B., Moody, M.P., Cairney, J.M., Ringer, S.P.: Atom Probe Microscopy. Springer Series
in Materials Science, vol. 160. Springer (2012)