Methods designed to speed up the computation of controllability
within an event-driven fault-free simulation environment are described.
Input generation techniques are presented which reduce the activity of
the simulator, thus achieving a considerable speed-up. Concurrent
simulation of fault-free devices is shown to be very effective in this
domain. Experimental results are reported for benchmark circuits. No
general law has been derived, but a rich set of heuristics has been
collected which may be useful in many other cases