Here, the Double Exposure Holographic Interferometry (DEHI) technique is used to study the surface deformation of CdSe films electrodeposited on stainless steel substrate. The electrodeposition of CdSe thin films is carried out by varying the time of deposition. The deposition potential of the compound was studied by cyclic voltammetry. The structural, surface morphological and optical properties of the deposited films have been studied by X-ray diffraction (XRD), scanning electron microscope (SEM) and optical absorption technique respectively. Also the contact angle measurements are carried out. The DEHI technique is used to determine, thickness of thin films, mass deposited, fringe width and stress to substrate of electrodeposited CdSe thin films for various deposition time with different solution concentrations. With increasing deposition time fringe width was decreased due to the reduction in film stress