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Neon Soft X-Ray yield optimization from NX2 dense plasma focus device
Abstract
The aim of this research is to study soft x-ray emission from NX2 plasma focus device with neon filling gas using the Lee model code and find the maximum value of soft x-ray yield by using the standard parameters of the device and then find the optimum combination of pressure and anode dimensions that gives the maximum value of soft x-ray yield. Many numerical experiments were carried out and we obtained the maximum value of soft x-ray yield (Ysxr) of (22.6 J) at a pressure of (2.9 Torr) by using the standard parameters of NX2 device. We found the optimum combination of pressure, anode length and anode radius (3 Torr, 2.1 cm and 2 cm), respectively, by reducing the anode length and increasing the anode radius. The soft x-ray yield increases to (26.01 J) with a corresponding efficiency of about 1.53%.
... [5] The pinch current [6], the length of the insulator used to separate the anode and the cathode, the type of gas used within the device [7,8], the parameters of the capacitor bank [9] and the electrode geometry ... And radiation emissions from it [10][11][12]. ...
... These two types differ from each other in geometric dimensions and this effects on the stages of evolution plasma focus starting from the moment of discharge. Since the discovery of plasma focus in The sixties of the twentieth century, a large number of studies have been conducted to understand the physical behavior of this phenomenon [6] and to study the properties of emitting ion beams [7] and soft xrays [8] and also the possibility of benefiting from it in practical fields. Indeed, plasma focus has opened the way to a large number of applications, such as the synthesis materials [9] and the deposition thin films [10] and the obtaining of short-lived radioactive isotopes [11] by taking advantage of emitting ion beams from the collapse of the plasma pinch, and this prompted the study of the properties of these ion beams and their relationship to the operational factors of plasma focus, such as the device energy, its geometric composition, the energy of the capacitor bank, and type of gas used in the operating process. ...
The 2A issue of volume 20 of the Iraqi Journal of Applied Physics (IJAP) has been released and can be browsed at the following link:
https://iasj.net/iasj/issue/17682
... Lee's code is one of the most important programs used to simulate the phenomenon of plasma focus because of its important features, as it couples electrical circuit parameters with the dynamics and thermodynamics of the plasma focus and radiation, enabling a realistic simulation of all gross focus properties. The basic model is described in [24,25]. This code has been used in many plasma focus devices such as the United Nations University/International Centre for Theoretical Physics Plasma Focus Facility (UNU/ICTP PFF) NX2 device and NX1 device. ...
The aim of the research is to examine the dependence of plasma pinch properties and radiation emissions on the atomic number of the operating gas within the dense plasma focus device (NX2) when using hydrogen and argon gases. Simulation was performed with Lee’s code on an NX2 dense plasma focus at a constant gas pressure value (P0=0.5 torr). The results showed that the minimum radius of the plasma focus in the case of the hydrogen plasma pinch was 0.30 cm and in the case of the argon plasma pinch 0.17 cm, and this affected the value of the radiation emission as it was 7.8×10−6 J and 11 J for the hydrogen and argon pinch, respectively. The energy of the ion beam released by the breakdown of the plasma pinch was found as En=23.8 J in the state of hydrogen and En=105 J in the state of argon.
... The Lee model couples the electrical circuit with plasma focus dynamics, thermodynamics and radiation, enabling a realistic simulation of all gross focus properties. The basic model is described in [4][5]. The code has been used extensively in several machines, including UNU/ICTP PFF, NX2 and NX1. ...
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