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Lumen degradation analysis of LED lamps based on the subsystem isolation method

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Applied Optics
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  • Lanzhou Institute of Physics

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The lumen degradation of LED lamps undergoing an accelerated aging test is investigated. The entire LED lamp is divided into three subsystems, namely, driver, lampshade, and LED light source. The parameters of output power [Watts (W)], transmittance (%), and lumen flux (lm) are adopted in the analysis of the degradation of the driver, lampshade, and LED light source, respectively. Two groups of LED lamps are aged under the ambient temperatures of 25°C and 85°C, respectively, with the aging time of 2000 h. The lumen degradation of the lamps is from 3.8% to 4.9% for the group under a temperature of 25°C and from 10.6% to 12.7% for the group under a temperature of 85°C. The LED light source is the most aggressive part of the three subsystems, which accounts for 70.5% of the lumen degradation of the LED lamp on average. The lampshade is the second degradation source, which causes 21.5% of the total amount on average. The driver is the third degradation source, which causes 6.5% under 25°C and 2.8% under 85°C of the total amount on average.
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Lumen degradation analysis of LED lamps based
on the subsystem isolation method
HONG-LIANG KE,1,*JIAN HAO,1JIAN-HUI TU,1PEI-XIAN MIAO,1CHAO-QUAN WANG,1
JING-ZHONG CUI,1QIANG SUN,2AND REN-TAO SUN3
1Lanzhou Space Technology Institute of Physics, Science and Technology on Vacuum Technology and Physics Laboratory,
No.100 Feiyan Roud, Chengguan District, Lanzhou, Gansu Province 730000, China
2Department of Optoelectronics Research and Development Center, CIOMP-Chinese Academy of Science,
No. 3888 East South-Lake Road, Changchun, Jilin Province 130033, China
3College of Communication Engineering, Jilin University, No. 5988 Renmin Street, Changchun, Jilin Province 130022, China
*Corresponding author: pirlo2008snooker@126.com
Received 7 September 2017; revised 21 December 2017; accepted 30 December 2017; posted 2 January 2018 (Doc. ID 306558);
published 31 January 2018
The lumen degradation of LED lamps undergoing an accelerated aging test is investigated. The entire LED lamp
is divided into three subsystems, namely, driver, lampshade, and LED light source. The parameters of output
power [Watts (W)], transmittance (%), and lumen flux (lm) are adopted in the analysis of the degradation of the
driver, lampshade, and LED light source, respectively. Two groups of LED lamps are aged under the ambient
temperatures of 25°C and 85°C, respectively, with the aging time of 2000 h. The lumen degradation of the lamps
is from 3.8% to 4.9% for the group under a temperature of 25°C and from 10.6% to 12.7% for the group under a
temperature of 85°C. The LED light source is the most aggressive part of the three subsystems, which accounts for
70.5% of the lumen degradation of the LED lamp on average. The lampshade is the second degradation source,
which causes 21.5% of the total amount on average. The driver is the third degradation source, which causes
6.5% under 25°C and 2.8% under 85°C of the total amount on average. © 2018 Optical Society of America
OCIS codes: (000.2190) Experimental physics; (350.4800) Optical standards and testing.
https://doi.org/10.1364/AO.57.000849
1. INTRODUCTION
Recently, white LEDs converted by blue chip and yellow
phosphor have been developed owing to their high efficiency,
environmental benefits, and long lifetime [13]. To verify the
long-lifetime performance, Energy Star proposed a well-known
6000 h test for the LED light source [4], as well as the LED
lamps [5]. The LED lifetime of L70%, defined as the time for
luminous maintenance to drop to 70%, could be predicted by
TM-21-11 [6] with the lumen degradation acquired in the
6000 h test. However, 6000 h is not a long enough period
to catch up with the present LED production, and therefore
the thermal stress is always applied in the LED accelerated
aging test to shorten the test time in most studies [711].
The failure mechanism analysis and the lifetime prediction for
LED lamps under accelerated aging tests remain challenging
tasks. First, there are various unexpected failure modes at the sys-
tem level under different stress levels [12,13]. Second, the lifetime
spans of the subsystems always differ greatly, which makes the
lifetime of the LED lamp limited to the worst subsystem.
In recent years, some researchers [14,15] divided the LED
lamp into several subsystems, which are the driver, the LED
light source, and the lampshade and fixture. The analysis for
the different subsystems is conducted. For the LED light
source, studies [1620] focused on the reliability tests and life-
time prediction of LED packages/modules. Yoon et al.[21]
made a comparison between LED packages and LED lamps
in the reliability analysis. It was shown that the shape param-
eters of the Weibull distribution in the two cases were, respec-
tively, 8.8711.12 and 14.8719.82, which means the failure
mechanism was different. IES LM-82 [22] pointed out that the
thermal condition of the LED light source should be consid-
ered when it was applied in a certain lighting system and differ-
ent thermal conditions corresponding to different reliabilities.
As a result, the lifetime of the LED lamp cannot be simply
taken as that of the LED light source.
For the LED driver, De Santi et al.[23] indicated that the
output power of the driver decreased over time, and one of the
samples power decreased by 5% after 2000 h aging under an
ambient temperature of 40°C. Sun et al.[24] pointed out that
the output power of the LED driver with isolated components
decreased by the same rate in a 300 h aging test under ambient
temperatures of 55°C and 105°C. Therefore, the decrease of the
Research Article Vol. 57, No. 4 / 1 February 2018 / Applied Optics 849
1559-128X/18/040849-06 Journal © 2018 Optical Society of America
output power of the LED driver results in a decrease of the
lumen flux of the LED lamp.
For the LED lampshade, mostly made of polymethyl
methacrylate (PMMA), Lu et al.[25] investigated the failure
mechanism of PMMA under different thermal stresses. The
results showed that the transmittance of PMMA decreased
significantly in the wavelength band from 380 nm to 730 nm,
causing a 10.2% decrease of the lumen flux for 360 h of aging
under an ambient temperature of 55°C. The degradation of the
lampshade is the darkening of PMMA, which reduces the trans-
mittance of PMMA and is therefore responsible for the decrease
of the luminous flux as well as the color shift of the LED lamp.
The main purpose of this research is to investigate the deg-
radation of each subsystem of the LED lamp, namely the driver,
lampshade, and LED light source, under the thermal acceler-
ated aging test. The variation in the output power (W) of the
driver, the variation in transmittance (%) of the lampshade, and
the variation in the lumen flux (lm) of the LED light source are
taken as the parameters for evaluating the degradation of each
subsystem. The proportion of lumen degradation of the LED
lamp caused by each subsystem is given for comparison. The
second purpose is to investigate the difference in the degrada-
tion of the subsystems under different thermal stress levels, and
the normal temperature of 25°C and the elevated temperature
of 85°C are applied in this research.
2. THEORETICAL ANALYSIS
The total lumen degradation of the LED lamp over time Dall is
divided into the three parts D1,D2, and D3, which are caused
by the driver, the lampshade, and the LED light source,
respectively, as given by
Φ0ΦtDall D1D2D3;(1)
where Φ0is the initial lumen flux of the LED lamp before aging
and Φtis the lumen flux after an aging time t.
For the LED driver, the correspondent lumen degradation
of D1can be evaluated by the variation in its output power
using
D1W0Wt×μ;(2)
where W0and Wtare, respectively, the output power of the
LED driver before and after thours of aging and μis the varia-
tion rate of the lumen flux of the LED light source with respect
to the output power of the driver.
For the lampshade, the correspondent lumen degradation of
D2is evaluated by the variation of the transmittance of Tλ,
which is given by
TλSPD1λSPD2λ;(3)
where SPD1λand SPD2λare the spectral power distribu-
tion (SPD) of the LED lamp with and without the lampshade,
respectively. Then D2can be calculated by
D2Z780
380
Km×T0λTtλ ×Vλ×SPDtdλ;(4)
where T0λand Ttλare the transmittance of the lampshade
before and after thours of aging, respectively. Kmis 683 lm/W,
Vλis the vision function under photopic vision, and SPDtis
the spectral power distribution of the LED lamp without the
lampshade after thours of aging. The visible wavelength band
from 380 nm to 780 nm is adopted.
For the LED light source, the correspondent lumen degra-
dation of D3is evaluated by the degradation of the LED itself,
which is expressed as
D3Φ0
0Φ0
t;(5)
where Φ0
0and Φ0
tare the lumen flux of the LED light source
under the rated current before and after thours of aging, re-
spectively. With the acquired Dall,D1,D2, and D3, the
proportion of the lumen degradation of each subsystem is
obtained and compared.
3. EXPERIMENTS
A. Test Samples
The subsystems of the driver, the lampshade, the LED light
source, the heat sink, and the lampholder E27 of the tested
LED lamp in this research are shown in Fig. 1. The driver
is placed outside the LED lamp for the measurement of the
output power. The main parameters of each subsystem are
listed in Table 1.
Six LED lamps from the same batch are divided into two
groups, with samples 1, 2, and 3 as the first group and samples
4, 5, and 6 as the second group. The samples in the first group
are aged under the normal temperature of 25°C while the sam-
ples in the second group are aged under the elevated temper-
ature of 85°C. The total aging time for both groups is 2000 h,
and the parameters measurement for each subsystem is taken
before and after the aging process.
B. Test for LED Lamp and Subsystems
The experimental apparatus is shown in Fig. 2. The LED lamp
is fixed inside a temperature chamber, and outside the chamber
Fig. 1. Subsystems of the LED lamp.
Table 1. Main Parameters of Each Subsystem
Composition
Thirty 0.15 W, GaN-Based White
LEDs Converted by Y3Al5O12:Ce
LED
source Rated input/output
135 mA (DC)/340 lm,
3500 K
Driver Rated input/output 220V(AC)/135 mA (DC)
Lampshade Material PMMA
Heat sink Material Ceramics
850 Vol. 57, No. 4 / 1 February 2018 / Applied Optics Research Article
a 1.5 m integrating sphere connected to a spectrometer is used
for the collection of optical parameters of the LED lamp. The
side opening of the integrating sphere is closely connected to
the window of the chamber. To achieve thermal isolation
between the integrating sphere and the chamber, a special hood
made of vacuum glasses is placed at the window.
By using this measurement system, the optical parameters of
the LED lamp under different thermal conditions can be
measured. First, different ambient temperatures are controlled
by the chamber, and the correspondent thermal condition of
the LED lamp is monitored by a thermal infrared imager fixed
on the top of the chamber. Second, the lamp is pushed into the
integrating sphere to ensure that the measurement is with
highest lumen flux of the sample. Finally, the output of the
LED lamp under a certain thermal condition is given by the
spectrometer.
The measurement steps for the LED lamp, driver,
lampshade, and LED light source are given as follows.
Step-1 for the LED lamp: The chamber temperature is con-
trolled to 25°C, and therefore the samples in the second group
after 2000 h of aging must be fully cooled down before testing.
The tested sample is fixed inside the chamber and preheated for
20 min before the measurement. The LED driver is placed
outside the chamber and powered by 220 V (AC). The lumen
flux of Φand the spectral power distribution of SPD1of LED
lamp are then measured by the spectrometer.
Step-2 for the driver: During the optical parameter measure-
ment in step-1, the stable output power (W) of the driver is
simultaneously measured with a digital multimeter outside
the chamber.
Step-3 for the lampshade: In the following steps, the lampshade
is removed from the tested lamp, and thereby the thermal
condition and the junction temperature of the LED lamp
inevitably vary. Cai et al.[13] indicated that the variation in
the temperature of the LED heat sink could be 810°C, before
and after removing the lampshade. Figure 3shows the compari-
son of the infrared image of the LED lamp with and without
the lampshade, under the normal working conditions. Note
that at the ambient temperature of 25°C, the heat sink temper-
ature (TH) of the LED lamp is 62°C in the case with the lamp-
shade, and it is 54°C in the case without the lampshade.
Therefore, when the lampshade is removed, the chamber tem-
perature should be adjusted to ensure the THis unchanged.
Then the sample is pushed into the integrating sphere, and
the spectral power distribution of SPD2is given by the spec-
trometer. In our previous research in Ref. [20], the LED junc-
tion temperature measured by the forward voltage method
shows an upward trend over the aging time, which gives a varia-
tion of about 6°C8°C after 3000 h of aging under an ambient
temperature of 80°C. Therefore, the thermal condition of the
LED lamp should be tested and adjusted during the aging
process. It is emphasized that the integrating sphere system
should be re-calibrated with the auxiliary lamp before the
measurement, due to the change of the tested target.
Step-4 for LED light source: The LED driver and AC power are
substituted by a DC power, and the rated current of 135 mA
(DC) is applied to the sample. The lampshade is removed, and
the chamber temperature is adjusted as described in step-3.
After 20 min preheating, the lumen flux of Φ0is measured.
In this way the influence of the LED driver and the lampshade
on the lumen degradation is excluded, and the variation of Φ0
over 2000 h can be regarded as the degradation of the LED
light source itself.
4. RESULTS AND ANALYSIS
A. Lumen Degradation of LED Lamp Dall
Figure 4shows the difference of the lumen flux measured be-
fore and after 2000 h of aging for the six samples in step-1.
Note that the degradation of Dall is 13.9 lm (4.5%), 11.9 lm
(3.8%), 14.7 lm (4.9%), 38.4 lm (12.7%), 37.0 lm (11.8%),
Fig. 2. Sketch map of the measurement system.
Fig. 3. Comparison of the infrared image of the LED lamp with
lampshade and that without lampshade.
Fig. 4. Comparison of the lumen flux measured in Step-1 at 0 h and
2000 h.
Research Article Vol. 57, No. 4 / 1 February 2018 / Applied Optics 851
and 33.1 lm (10.6%), respectively, for the six samples after
2000 h of aging.
B. Lumen Degradation of Driver D1
To evaluate the effect of the degradation of the driver on the
lumen degradation of the LED lamp, the variation rate of the
lumen flux of the LED light source with respect to the output
power of the driver μshould be determined first. Figure 5
shows the experimental results of the lumen flux under differ-
ent driver output power for sample 1, before and after 2000 h
of aging. Note that the lumen flux can be linearly fitted for both
cases with R-square (coefficient of multiple determination)
higher than 0.99. The slope of the fitting for the data before
aging is 56.71 (lm/W), and it is 57.11 (lm/W) for the data after
2000 h of aging. As a result, the average value of 56.91 is taken
as the variation rate of μfor sample 1. The μvalues for the other
five samples are, respectively, 55.32, 57.66, 60.35, 59.62, and
55.30 (lm/W).
Table 2lists the output power of the driver before and after
the 2000 h of aging measured in step-2, and the decreased out-
put power of ΔWfor the six samples. Note that the decreased
output power of the driver over 2000 h aging at a normal tem-
perature of 25°C is 0.015 W on average, and it is 0.018 Wat
elevated temperatures of 85°C. This indicates that an elevated
temperature of 85°C has little effect on the degradation of the
driver. With the decreased output power and the μvalue, the
lumen degradation of D1caused by the driver is calculated
according to Eq. (2). The values of D1for the samples are listed
in the last column of Table 2. Note that the averaged value of
Fig. 5. Lumen flux as a function of output power for sample 1.
Table 2. Degradation of Driver D1
Aging
Temperature
(°C)
Power (W)
at 0 h
Power (W)
at 2000 h
ΔPower
(W)
μ
lm/W D1lm
25
No. 1 4.725 4.711 0.014 56.91 0.81
No. 2 4.635 4.620 0.015 55.32 0.83
No. 3 4.821 4.804 0.017 57.66 0.98
85
No. 4 4.748 4.548 0.020 60.35 1.20
No. 5 4.622 4.607 0.015 59.62 0.88
No. 6 4.535 4.517 0.018 55.30 1.00
Fig. 6. (a) SPD1and SPD2of sample 1 at 0 h and 2000 h. (b) The
transmittance of sample 1 at 0 h and 2000 h. (c) The transmittance
reduction of sample 1 after 2000 h of aging. (d) The transmittance
reduction of the other five samples.
852 Vol. 57, No. 4 / 1 February 2018 / Applied Optics Research Article
D1is 0.87 lm for the samples aging at 25°C, and is 1.03 lm for
the samples aging at 85°C.
C. Lumen Degradation of Lampshade D2
To investigate the transmittance of the lampshade, the SPD1in
step-1 and the SPD2in step-3 are compared. Figure 6(a) shows
the SPD1and SPD2of sample 1 at 0 h and after 2000 h of
aging, and Fig. 6(b) shows the calculated transmittance T0
(before aging) and Tt(after 2000 h of aging) according to
Eq. (3). Apparently, Ttis lower than T0at each wavelength
over the visible band. The transmittance reduction (T0Tt)
is shown in Fig. 6(c). Note that as the wavelength increases,
T0Ttdecreases within the band from 400 nm to 500 nm
and becomes steady with the value of 1.11.4% within the
band from 500 nm to 800 nm. Figure 6(d) shows the calculated
T0Ttfor the other five samples. Note that the values of
T0Ttare larger for the samples under an aging temperature
of 85°C compared with those under 25°C, indicating that the
degradation of the lampshade strongly correlates to the elevated
temperature.
With the obtained T0,Tt, and SPD2at 2000 h, the cor-
respondent lumen degradation of D2caused by the lampshade
is calculated according to Eq. (4). The values of D2are listed in
Table 3, which are from 2.4 to 3.1 lm for samples 1, 2, and 3,
and are from 7.6 to 8.1 lm for samples 4, 5, and 6.
D. Lumen Degradation of LED Light Source D3
The lumen flux of the LED light sources of the sample is ac-
quired in step-4. The values of Φ0(before aging) and Φ0
t(after
2000 h of aging) are listed in the third and fourth row, respec-
tively, of Table 4. According to Eq. (5) the correspondent
lumen degradations of D3are calculated and listed in the last
row of Table 4. Note that the lumen degradation caused by the
LED light source over 2000 h of aging at a normal temperature
of 25°C is 9.3 lm on average, and it is 26.0 lm at an elevated
temperature of 85°C. The latter is about 2.8 times larger than
the former, implying that thermal stress plays an important role
in the degradation of the LED light source.
E. Analysis of Dall ,D1,D2, and D3
For sample 1, the lumen degradation of the LED lamp of Dall is
13.9 lm after 2000 h of aging at a temperature of 25°C (see
Fig. 4). The lumen degradation caused by the driver of D1
is 0.81 lm (see Table 2), which accounts for 5.8% of Dall. The
lumen degradation caused by the lampshade of D2is 3.0 lm
(see Table 3), which accounts for 21.7% of Dall. The lumen
degradation caused by the LED light source of D3is 9.6 lm
(see Table 4), which accounts for 69.1% of Dall. It is noticed
that the sum of D1,D2, and D3is 96.6% of Dall. The remain-
ing 3.4% of the total lumen degradation is caused by the mea-
surement errors and some interactions among each subsystem,
which can result in a faster degradation of the whole LED lamp.
For example, the lighting by the LED light source has a direct
effect on the degradation of the lampshade, and the degradation
of the light source therefore effects the degradation of the lamp-
shade. However, the degradation value caused by this effect
cannot be detected in step-3. Similar interactions among the
three subsystems contribute to the remaining 3.4% of the total
lumen degradation.
Table 5lists the results for the six samples. These results
show that the lumen degradation of the aged LED lamp is
mainly due to the degradation of the LED light source,
which causes about 70.5% of the total amount on average.
The lampshade is the second degradation source, which causes
about 21.3% of the total amount on average. The driver is the
third degradation source, which causes about 6.5% (at a normal
temperature of 25°C) and about 2.8% (at an elevated
temperature of 85°C) of the total amount on average.
5. CONCLUSIONS
To investigate the degradation of each subsystem of the LED
lamp in the aging test, the LED lamp is divided into the three
subsystems of driver, lampshade, and LED light source. Two
groups of aging tests, one test at a normal temperature of 25°C
and the other at an elevated temperature of 85°C, are
conducted for 2000 h.
It is shown that the decreased output power of the LED
driver is 0.015 W on average for the aging test at a normal
temperature of 25°C, and it is 0.018 W for the aging test at
an elevated temperature of 85°C. The small difference indicates
that the elevated temperature of 85°C has little effect on the
driver degradation. The degradation of the driver causes a
Table 3. Degradation of Lampshade D2
Aging Temperature (°C) 25 85
No. 123456
D2(lm) 3.0 2.4 3.1 8.1 7.6 7.6
Table 4. Degradation of LED Light Source D3
Aging Temperature
(°C) 25°C85°C
No. 123456
Φ0at 0 h (lm) 335.2 342.5 338.0 339.3 341.8 336.4
Φ0
tat 2000 h (lm) 325.3 334.0 327.6 311.0 314.3 312.2
D3(lm) 9.6 8.3 10.1 27.6 26.8 23.6
Table 5. D1Dall,D2Dall , and D3Dall for Six Samples
Aging Temperature (°C) Driver D1Dall Lampshade D2Dall LED Light Source D3Dall Remaining 1D1D2D3Dall
25
No. 1 5.8% 21.7% 69.1% 3.4%
No. 2 6.9% 20.3% 69.7% 3.0%
No. 3 6.7% 21.4% 68.7% 3.2%
85
No. 4 3.1% 21.1% 71.8% 4.0%
No. 5 2.3% 20.5% 72.4% 4.8%
No. 6 3.0% 23.0% 71.3% 2.7%
Research Article Vol. 57, No. 4 / 1 February 2018 / Applied Optics 853
correspondent lumen degradation of 6.5% (at a normal tem-
perature of 25°C) and 2.8% (at an elevated temperature of
85°C) of the total amount on average.
The degradation of the lampshade, coming from the
changing of transmittance, causes a correspondent lumen
degradation of 21.3% of the total amount on average.
The degradation of the LED light source causes a corre-
spondent lumen degradation of 70.5% of the total amount
on average, meaning that the degradation of the LED lamp
is mainly attributed to the LED light source.
The elevated temperature of 85°C plays an important role in
the degradation of the LED light source and lampshade, with
the lumen degradation approximately three times that at a
normal temperature of 25°C in this research.
As a starting point, the scope of this study is limited to the
LED lamp used in this research. For other kinds of LED lamps
with different driver circuits, lamp structures, materials, chips,
phosphors, and so on, the worst subsystem should be experi-
mentally determined, but we do believe that the proposed
subsystem isolation method can provide a useful way for
estimating the reality of LED lamps, especially with current
multifarious LED lighting products.
Funding. Chinese Academy of Sciences (CAS), Cui-Can
Project (KZCC-EW-102); CAS, 863 Project (2013AA03A116,
2015AA03A101).
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854 Vol. 57, No. 4 / 1 February 2018 / Applied Optics Research Article
... This work discusses the theory behind the multi-domain operation of a LED luminaire. Prior works in literature have discussed multi-domain operations of LEDs and their products using mathematical models and tools (Alexeev et al., 2019;Ibrahim et al., 2021;Janicki et al., 2020;Ke et al., , 2018Pohl et al., 2020;Poppe, 2012Poppe, , 2015Poppe et al., 2009). Most of these studies have analyzed LED luminaires during their prototyping phase. ...
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In this work, an empirically derived multi-domain model of a light-emitting diode (LED) luminaire is proposed. The optical, electrical, and thermal characteristics of LEDs are obtained from the data sheets provided by manufacturers. Both transient and steady-state performance of LED luminaire were realized theoretically and validated against experimental findings from earlier investigations. The difficulties encountered in creating an ideal LED luminaire are discoursed and examined. Most of the studies on LED luminaires described in prior works ignored the influence of luminaire housing and optics on the thermal management of the luminaire. Knowledge of thermal time constants of LED luminaires is important, as they decide the rate of luminous flux decay when LED lighting systems are used for long periods of operation. Thermal time constants also decide the time taken by the LED junction to reach steady state with its surrounding. From the study it is inferred that the increase in junction temperature and deterioration of luminous flux is controlled by the product of the single most dominant thermal resistance from the junction to a point along the heat conduction path and sum of all the downstream thermal capacitances. This is true as in most cases LED device thermal capacitance is very less related to the thermal capacitance of the heat-sink, hence the product of single most dominant thermal resistance and thermal capacitance of heat-sink decide the rate of rising of junction temperature or luminous flux deterioration.
... Thus, the changes in the thermal quenching, the color coordinate, the wavelength, the lighting inconsistency, and the lifespan decrease will cause a reduction in the light emission by more than one level in the magnitude due to the rising heat within the phosphor film of the package. Materials exhibiting high TC are applied to encourage the dispersion of generated phosphor-layer heat of PiG in WLEDs, as a result [10], [11]. The supported graphene material that has high TC (~600 W/m·K) was applied to the covering of PiG to optimize the thermal management in WLEDs. ...
... The thermal stress limit for noticeable physical variations and a short-term accelerated degradation test is conducted in [16]. [17] proposes experimentation at 25 • C and 85 • C and determines the lumen degradation for an LED luminaire considering the effective performance of each subsystem. The results show that the LED is primary source of failure followed by the secondary optics and then the LED driver electronics. ...
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Solid-state lighting technology currently dominates illumination technologies, which have been growing throughout time. LEDs are a semiconductor-based illumination solution that is energy-efficient, long-lasting, and capable of meeting all application requirements for quantity of light, colour and spatial limitations. In all of the essential lighting applications, LED reliability and lifetime performance are critical. The LED luminaire’s performance may decline over time, resulting in lower light output or different colours than the required colour characteristics. The importance of LED performances in LED luminaires as a system has only lately been realised. Different LEDs are used in two commercially available LED luminaires with exact electrical and optical specifications that are exposed to accelerated working conditions. The paper outlines a method for analysing and forecasting lifetime based on lumen maintenance for light output, Duv for colour-based quantification. The xy chromaticity, spectral power distribution, and SEM-EDS analysis are used to detect the characteristics indicative of variations in LED light output performance with degradation. The findings imply that LED packaging and device physics are important factors in the LED luminaire’s overall lifetime performance. The work gives consumers the opportunity to see specifics about luminosity and colour-based changes as a product data-sheet, making it easier for them to choose appropriate luminaires for their needs. It also aids LED and LED luminaire makers in making appropriate design and technological adjustments, resulting in improved LED performance that is longlasting and consistent in colour stability.
... As such, there have been a great number of researches that aim at creating onephase white-illumination phosphor that have desirable performance, longevity and possess the elements of red, green, blue (RGB) on the basis of energy shift (ET) between sensitizers and activator [11], [12]. There is a great deal of available phosphors to be used in WLED, but treating with Ce 3+ , Tb 3+ , or Mn 2+ ions appear to be usually utilized to generate white illumination via ET for the one-phase phosphors [13]. Ce 3+ possesses 4f 1 5d 0 ground state and 4f 0 5d 1 excited state. ...
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Using the solid-state technique that involves great temperature, we created multiple phosphors Sr4La(PO4)3O:Ce3+, Tb3+, Mn2+ (abbreviated as SLPO:Ce, Tb, Mn). We then examined their heat consistency, luminescence, as well as energy shift from Ce3+ to Tb3+ and Mn2+. We can acquire a considerable boost for the faint emission in green generated by Tb3+ as well as the emission in red generated by Mn2+ via adding the sensitizer Ce3+ ions. Through modifying the proportion between Ce3+ and Tb3+ along with the proportion between Ce3+ and Mn2+, it is possible to adjust the chroma of emission. We acquired white illumination which had color coordinates determined as (0.3326, 0.3298) for the testing phosphor Sr4La(PO4)3O: 0.12Ce3+, 0.3Mn2+. Such result displays the promising efficiency of phosphors Sr4La(PO4)3O:Ce3+, Tb3+, Mn2+ for the WLED devices.
... On the other hand, the temperature of luminescence abatement appears to be comparatively significant. Taking heat abatement theory into account, it is possible to determine the intensity that correlates with temperature via an equation [12]- [14]. ...
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span>For the task of realizing greater progress for the light output in white light-emitting diodes (WLEDs), t his study focuses on the luminescence temperature subordination feature of CaSc2O4:Ce3+ phosphor (abbreviated to CaS for this study). Some other aspects of the phosphor were also included in this piece of paper: Huang-Rhys coupling factor, Stokes shift, triggering power, abatement temperature and especially, abatement behavior in CaSc2O4:Ce3+. Creating the bluish-green LEDs by the combination of blue InGaN chip and CaSc2O4:Ce3+ is the primary purpose. CaSc2O4:Ce3+ appears to be a decent green phosphor that can be used in WLEDs made of blue InGaN chip. Production tasks may be based on our investigation for the task of making desirable WLED devices that meet the production demands.</span
... x c represents the rare-earth concentration. n total amount of Wyckoff locations for the Eu 2+ spots [12], [13]. ...
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We created the green-light phosphor Cs2ZnSi5O12 (CZSO) with Eu2+ replacement for the practical use of ultraviolet white illumination through the solid-state technique. The phosphor displays many different forms and crystallizes in the space group Pbca along with Pa , with formation resembling CsAlSi2O6, the leucite in cube form. We utilized the X-ray powder diffraction as well as the spectroscopic knowledge to validate that the crystal formation in the phosphor CZSO:Eu2+ belongs to the space group Pa . CZSO can generate wide green emission with a wavelength of 504 nm when excited by ultraviolet. We enveloped the blend using the translucent silicone resin and the red-light phosphor Sr2Si5N8:Eu2+ as well as excited it using an ultraviolet light emitting diode (LED) device with a wavelength of 370 nm to generate white illumination that yields remarkable chromatic output. The generation of illumination utilizing the phosphor CZSO benefits from the wide green emission, which does not require the integration of the three phosphors that are critical to the ultraviolet pumping. Such benefit will allow the model of the apparatus to become simpler and simultaneously create a desirable ultraviolet white illumination. When the augmentation the emission efficacy as well as the heat consistency for the phosphor CZSO is realized, we can easily incorporate the ultraviolet LED devices to create better white illumination.
... Eu 2+ generating green lights[15]. Hence, we decided to dope Eu 2+ ion with silicate Ca2Si2P2O16 phosphor host to enhance the efficiency of this phosphor. ...
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To enhance the dual-layer remote phosphorus configuration's color standard help spread its application in the LED devices, the new green-emitting phosphor of Ca7Si2P2O16:Eu 2+ is proposed. The sol-gel method is used to dope the Eu 2+ ions with Ca7Si2P2O16. Increasing the ion Eu 2+ concentration can lead to high thermal stability, color-tunable ability, stronger green emission band, and higher photoluminescence extraction. The dual-layer structure's color standards, as well as the luminous flux, are examined with different concentrations of Ca7Si2P2O16:Eu 2+ in the phosphor layer. Owing to the improved features, the green phosphor Ca7Si2P2O16:Eu 2+ has enhanced the emission intensity in the blue and green wavelengths, resulting in better color mixing and distribution. The luminescence shows the enhancement when increasing the concentration of Ca7Si2P2O16:Eu 2+. However, the color rendering feature can present a reduction with more than 10% wt. green phosphor within the double-layer phosphorus remote configuration, due to color balance's loss. Keywords: Ca7Si2P2O16:Eu 2+ Color homogeneity Luminous flux Monte Carlo method WLEDs This is an open access article under the CC BY-SA license.
Chapter
Solid phase process was used to make green-emitted ZnGa2S4:Eu2+ (ZnE) phosphorus. Photograph-luminescence stimulation as well as emitting spectrum, intensity cooling, heat cooling, and photograph-luminescence degradation have all been used to explore their luminous characteristics. The crucial doping concentration is 0.05 mol Eu2+, with a crucial transmission length of 17 Å. The phosphorus’s temperature cooling findings indicates that it is not an excellent quality. This features chromaticity coordinates which are quite similar to SrGa2S4:Eu2+. Once paired alongside RB phosphors as well as a UV-LED, the ZnE phosphorus is a promising green-emitted phosphorus option to generate white-emitting light in phosphorus converting white-emitting LEDs due to its wideband absorbance within the 350–520 nm area.
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The lumen efficacy in remote phosphor structure displayed remarkable enhancements, which is notable for the development of white light-emitting diodes (WLEDs). Nevertheless, its quality of colour is deemed not as good as that of the conformal or in-cup phosphor structure. Therefore, the goal of this research is to achieve a better quality of colour and significant luminous flux value for remote phosphor configuration by using extra phosphor layers. In particular, the two-layer and three-layer structures with the implementation of green and red phosphors are proposed. Comparing these two structures can help pinpoint the best suited for the WLED production. The assessment of each structure’s effect on the WLEDs’ optical parameters was determined under various correlated temperatures of colour (5,600-8,500 K). The outcomes indicated that the three-layer structure enhanced the quality of colour with greater efficiency compared to the two-layer structure due to the increased color rendering index (CRI), color quality scale (CQS), and photoluminescence (PL), and reduced colour deviation. The scattering improvement of the three-layer structure is a key factor of these accomplishments, proven by the scattering theory of Mie. Therefore, the three-layer structure is potential for developing WLED production.
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An accelerated aging test is the main method in evaluation of the reliability of light-emitting diodes (LEDs), and the first goal of this study is to investigate how the junction temperature (Tj) of the LED varies during accelerated aging. The Tj measured by the forward voltage method shows an upward trend over the aging time, which gives a variation about 6°C–8°C after 3,000 h of aging under an ambient temperature of 80°C. The second goal is to investigate how the variation of Tj affects the lifetime estimation. It is verified that at a certain aging stage, as Tj increases, the normalized luminous flux linearly decreases with variation rate of microns ( ) (1/°C). Then, we propose a method to modify the luminous flux degradation with the Tj and to meet the requirements of a constant degradation rate in the data fitting. The experimental results show that with the proposed method, the accelerated lifetimes of samples are bigger than that of the current method with increment values from 8.8% to 21.4% in this research.
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This paper describes one of the first studies of the degradation of retrofit light bulbs based on white GaN light emitting diodes. The results indicate that the lifetime of LED lamps depends mostly on the stability of the driver and optical elements, rather than on the degradation of the LED chips, that have a stable output over stress time. By comparing lamps from four different manufacturers stressed at room and high temperature, we found that (i) long-term stress causes a change of the chromatic properties of the lamps, which is ascribed to the degradation of the phosphors or to the inner LED reflector; (ii) during aging the LED driver may degrade gradually and/or catastrophically, causing a reduction of the output optical power, or a complete failure; (iii) proper thermal management and heat dissipation reduce the degradation rate; (iv) spectral transmissivity measurements and visual inspection reveal the degradation of the diffusive optical elements, which is induced by the short wavelength side of the LED emission spectrum.
Conference Paper
With rapid development of lighting emitting diode (LED) market, more people are focusing on reliability testing method of LED luminaries system. However, it is difficult to use traditional reliability testing method for electronic products to assess LED luminaries with high reliability and long life. In this paper, reliability testing methods applied on LED, LED luminaries and other fields are reviewed shortly, and step stress accelerated life test (SSALT) and step stress accelerated degradation test (SSADT) are selected for exploring reliability testing on commercial available LED systems. According to special characteristic of LED system and advantage of each method, both of methods are combined into one testing plan for evaluating system life. Proposed methods are also conducted on one thermal testing example by focused on commercial available LED bulb and lamp-cup systems. Explored results suggest that step stress accelerated test is an effective accelerated test method for LED luminaries. At the same time, there are still many challenging aspects for system reliability test, such as complicated failure mechanisms, Life gap among subsystems and also product manufacturers and lack of appropriate models to extrapolate. To assess the system reliability in future, an assessment procedure to subsystems is proposed by combining mentioned step stress accelerated test and system statistics analysis methodologies recommended in recent literature.