In Situ Probing of Electromechanical Properties of an Individual ZnO Nanobelt

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of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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... In the field of transmission electron microscopy a wide range of parameters have been altered inside the instrument. Next to the examination of temperature dependent properties where in situ heating holders are widely-used also electrical biasing, electrochemical reactions, electron beam irradiation as well as mechanical and tensile testing were examined [1][2][3][4][5][6] . Even for novel and sophisticated setups using TEM-compatible MEMS devices one drawback of all these methods is often the need for dedicated and expensive devices and holders [7,8] . ...
In situ measurements are a pivotal extension of conventional transmission electron microscopy (TEM). By means of the shape memory alloy NiTi thin film Functional Grids were produced for in situ straining as alternative or at least complement of expensive commercial holders. Due to the martensite-austenite transition temperature straining effects can be observed by use of customary heating holders in the range of 50 to 100°C. The grids can be produced in diversified designs to fit for different strain situations. Micro tensile tests were performed and compared with finite element simulations to estimate the applied forces on the sample and to predict the functionality of different grid designs. As a first example of this Functional Grid technology, we demonstrate the impact of applying a strain to a network of ZnO tetrapods.
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