The Study on Built-in Self-test Method Based on FPGA

Abstract

This paper proposed a built-in self-test method based on FPGA, which applied the traditional verification method of integrated circuit to FPGA test and proposed generating test vectors internally by using internal logic cells in FPGA. It also proposed judging the correctness of the test results by its own logic. This method has a lower dependence on external test facility, because the main test functions are all implemented on the FPGA. Meanwhile, it can give more assurance of testing by achieving a variety of fault excitation.