Article

F-8 Combining CdTe and Si Detectors for Energy-Dispersive X-ray Fluorescence

Authors:
Robert Redus at Amptek Inc.
Robert Redus
  • Amptek Inc.
Theofanis Pantazis at University of Wollongong
Theofanis Pantazis
J. Pantazis
J. Pantazis
J. Pantazis
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Alan Huber at Amptek Inc.
Alan Huber
  • Amptek Inc.
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Figure of merit for spectrometers for EDXRF
Article
  • Nov 2012
How should one select the best detector for a particular measurement in energy dispersive X‐ray fluorescence (EDXRF)? How should one select the optimum system configuration, i.e. the best shaping time and beam current? Manufacturers provide a variety of specifications, such as energy resolution and maximum count rate, but these are indirectly related to the end use of an EDXRF instrument, the measurement and detection limit of the measured elemental concentrations. We suggest in this paper using the time required to achieve a given statistical uncertainty as a figure of merit. We derive scaling rules for this figure of merit based on conventional specifications, including energy resolution, peaking time, maximum count rate, detector area, and intrinsic efficiency. These scaling rules also include the peak to background ratio of a photopeak and the number of overlapping peaks. We then show how this figure of merit can be used to select the optimum detector and spectrometer configuration for specific applications and compare the results to data obtained with typical systems. Copyright © 2012 John Wiley & Sons, Ltd.
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