Conference Paper

Statistical hypothesis testing to detect unreliable semiconductor devices

September 2016

Conference: Eighth International Workshop on Simulation 2015
At: Vienna, University of Life Sciences
Volume: Proc. 8th IWS (D. Rasch, V. Melas, J. Pilz, k. Moder and B. Spangl, Eds.), p. 229, ISBN 978-3-900932-28-2

Authors:

Alpen-Adria-Universität Klagenfurt

KAI - Kompetenzzentrum für Automobil- und Industrieelektronik GmbH

Alpen-Adria-Universität Klagenfurt

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Conference Paper

Full-text available

Mean estimate for Shewhart-chart-monitored processes subject to random shifts

November 1998

The Shewhart control chart is a widely used statistical control tool that helps detect a possible process shift (out-of-control process). Though the Shewhart chart is in theory a monitoring tool that reveals only the result of a hypothesis testing. In practice chart's signalling is often used as the evidence for making process adjustment. In this paper we develop a process mean estimator for ... [Show full abstract] processes monitored by Shewhart charts. This mean the estimate can serve as an important reference for investigating assignable causes and taking appropriate corrective actions. A semiconductor fabrication process is used as an example to illustrate the methodology