Material Characterization in the Microwave Range Assisted by 3D Simulators – A Modern Solution

Full text

Material Characterization in
Material Characterization in
the Microwave Range Assisted
the Microwave Range Assisted
by 3D Simulators
by 3D Simulators –
–
A Modern Solution
A Modern Solution
By Plamen I. Dankov
By Plamen I. Dankov
Sofia University “St. Kliment Ohridski”
Faculty of Physics
Department of Radio-Physics and Electronics
Sofia, 26
Sofia, 26
th
th
of September, 2013
of September, 2013

Outline

Modern materials for electronics – dielectric anisotropy

Standard method for characterization (IPC TM-650 2.5.5.5)

“Two-resonator method“ – authorship method

Examples for isotropic and anisotropic materials

Principles for utilization of 3D simulators for measurement
purposes
Complex measurement resonators and 3D numerical analysis

Comparative data for modern microwave substrates

Thin layers' characterization, incl. nano-sized absorbers,
protective and hydrophobic layer, other materials (biopolymers,
plant fresh biomass, etc.)

Antenna radomes; other publications, applying our results

Conclusions; Demonstration: Ansoft®HFSS
The presentation is dedicated to the memory of Prof. Stephan Alexandrov (1943-2004)

1
1
st
st
Part:
Part:
Dielectric anisotropy and
Dielectric anisotropy and
necessity for its
necessity for its
measurements
measurements

Most of the modern microwave substrates are reinforced and
therefore – anisotropic
h
t
t
ε
εε
ε
'
r
, tan
δ
δδ
δ
ε
εε
ε
Metallization
Filler
Reinforced fibers
Unmetallized substrate
f, GHz
ε
r
•Reinforcing woven glass: glass fibers or
filaments drawn out from the same material
(self reinforcing)
•Filler: Teflon or other organic substances,
powders, polymers, etc.
Woven glass
fibers

Multi-layer, artificial, absorbing or other anisotropic materials
Multilayer LTCC
Mata-materials
Micro and nano-layers
Absorbing isotropic or gradient materials
Biopolymers or tissue in vivo
Fresh biomass

One or multi-layer antenna radomes
One-layer resonance radome type A
τ
ττ
τ
~ λg /2
τ
ττ
τ
<< λg /2
One-layer resonance radome type B
Three-layer radome type C
Multi-layer radomes type D

An indisputable fact: Most of the considered one and multi-
layer materials have expressed dielectric anisotropy!
ε
εε
ε
'
⊥
⊥⊥
⊥
, tan
δ
δδ
δ
ε
εε
ε
⊥
⊥⊥
⊥
ε
εε
ε
'
||
, tan
δ
δδ
δ
ε
εε
ε
||
Oy
Oz
Ox










=
⊥
'00
0'0
00'
'
||
||
ε
ε
ε
ε
r
Dielectric Anisotropy:
α
αα
α
ε
εε
ε
=
ε
εε
ε
'
||
/
ε
εε
ε
'
⊥
⊥⊥
⊥
;
α
αα
α
tanδε
δεδε
δε
= tan
δ
δδ
δ
ε
εε
ε
||
/ tan
δ
δδ
δ
ε
εε
ε
⊥
⊥⊥
⊥
∆
∆∆
∆A
ε
εε
ε
= 2(
ε
εε
ε
'
||
−
−−
−
ε
εε
ε
'
⊥
⊥⊥
⊥
)/(
ε
εε
ε
'
||
+
ε
εε
ε
'
⊥
⊥⊥
⊥
)
∆
∆∆
∆A
tanδε
δεδε
δε
= 2(tan
δ
δδ
δ
ε
εε
ε
||
−
−−
−tan
δ
δδ
δ
ε
εε
ε
⊥
⊥⊥
⊥
)/
(tan
δ
δδ
δ
ε
εε
ε
||
+ tan
δ
δδ
δ
ε
εε
ε
⊥
⊥⊥
⊥
)










=
⊥
ε
ε
ε
ε
δ
δ
δ
δ
tan00
0tan0
00tan
tan ||
||
(
)
ε
δ
ε
ε
ε
ε
tanj1'"j'
−
=
−
=
rrrr

2014: This year the importance of the substrate dielectric
anisotropy was finally mentioned in "Microwave and
Millimeter-Wave Electronic Packaging" by Rick Sturdivant

IPC TM-650 2.5.5.5 Stripline Test Method (used by the
substrate producers for obtaining of catalogue data)
This test method gives the parameters,
perpendicular to the substrate surface:
Dielectric constant ~
ε
'
⊥
Dissipation factor ~ tan
δ
ε
⊥
Substrate
under test
pressure
Wide
stripline
resonator
E field pattern

Another fact: It is known, that if the anisotropy has not been
taken into account, many structures could not be designed
There are structures with complex
distribution of the E field and only the
normal to the surface parameters are not
sufficient (filters, combiners /dividers,
diplexers, matching elements, stubs,
resonators, etc., which support high-
order modes besides the fundamental
mode.
12.50 12.75 13.00 13.25
-40
-35
-30
-25
-20
-15
f, GHz
measured
HFSS (3.38)
IE3D (3.38)
Designer (3.38)
IE3D - (3.53)
S21 , dB
Short example: microstrip ring resonator on
thin substrate
There are indications
that the RF designers
“tune” the catalogue
data to fit the simulated
and measured S-
parameters of their
devices (filters,
combiners, resonators,
stubs, etc…)

Papers, which applied (our) results for the dielectric anisotropy

Examples for planar antenna matching including anisotropy
Plamen I. Dankov, Maria I. Kondeva, and Slavi R. Baev, “Influence of the Substrate
Anisotropy in the Planar Antenna Simulations”, ISBN: 978-1-4244-4883-8, iWAT
Conference, Lisabon, Portugal, March 2010 on-line available:
http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5464930&url=http%3A%
2F%2Fieeexplore.ieee.org%2Fiel5%2F5456465%2F5464631%2F05464930.pdf%3
Farnumber%3D5464930

Resonance structures – the anisotropy is extremely important
⇐
Kim, O., Sergey Pivnenko, and Olav Breinbjerg.
"Superdirective magnetic dipole array as a first-
order probe for spherical near-field antenna
measurements“, IEEE Transactions on Antennas
and Propagation, Vol. 60, Issue 10, (2012), pp.
4670-4676
Bogaert, Ignace. "Computation and Storage of the
Bianisotropic Scalar Green's Function and its
Derivatives.“, IEEE Transactions on Antennas and
Propagation, Vol. 61, Issue 7, (2013), pp. 3629 -
3641

Initial solution: introduction of equivalent complex dielectric
constant
ε
εε
ε
'
eq
and tan
δ
δδ
δ
ε
εε
ε, eq
ε
εε
ε
'
eq
= a
ε
εε
ε
'
||
+ b
ε
εε
ε
'
⊥
⊥⊥
⊥
;
tan
δ
δδ
δ
ε
εε
ε
, eq
= c tan
δ
δδ
δ
ε
εε
ε
||
+ d tan
δ
δδ
δ
ε
εε
ε
⊥
⊥⊥
⊥
a, b, c, d – constant, which should be
determined for each type of planar structure
Example: Rogers 4003 substrate
(frequency range 1-40 GHz):
ε
εε
ε
'
eq
= 3.52 ±
±±
±0.02 (mean value)
ε
εε
ε
'
r
= 3.38 (catalogue data)

Measurement od the of equivalent dielectric constant
L
r
2R
r
2 4 6 8 1 0 1 2 1 4 1 6 1 8 2 0
2 .3
2 .4
2 .5
2 .6
2 .7
2 .8
2 .9
3 .0
3 .1
3 .2
M S L (R O 3 2 03, h = 0 .2 5 4 m m )
eps _eff
eps _eq uiv alent
ε
ε
ε
ε
eff
,
ε
ε
ε
ε
eq
f , G H z
2 4 6 8 1 0 1 2 1 4 1 6 1 8 2 0
-7 0
-6 0
-5 0
-4 0
-3 0
-2 0
-1 0
0
...
...
2 5
2 6
4
3
2
n = 1
S
21
, dB
f, G H z

Our data: for Arlon® DiClad 880
Grounded coplanar
waveguide ring
resonator (GCPWG)
Microstrip ring
resonator (MSL)
MSL
GCPWG
ε
εε
ε
'
eq
~ 2.24-2.28
ε
εε
ε
'
eq
~ 2.29-2.32
Our method (next slide):
ε
εε
ε
'
||
~ 2.31-2.34;
ε
εε
ε
'
⊥
⊥⊥
⊥
~ 2.15-2.16
IPC TM-650 2.5.5.5:
ε
εε
ε
r
= 2.17
0.51 0.254

2
2
nd
nd
Part:
Part:
Realization of the
Realization of the “
“Two
Two-
-
Resonator Method
Resonator Method”
”

Two Resonator Method
(for determination of the dielectric anisotropy, developed
2004-2006)
Source: Plamen I. Dankov, "Two-Resonator Method for
Measurement of Dielectric Anisotropy in Multi-Layer
Samples”, IEEE Trans. on Microwave Theory and Tech.,
MTT-54, pp. 1534-1544, April 2006
TE
011
-mode resonator R1:
parallel parameters:
ε
'
||
, tan
δ
ε
||
(±1.5 %; ±5 %)
TM
010
-mode resonator R2:
normal parameters:
ε
'
⊥
, tan
δ
ε
⊥
(±5 %; ±15 %)
sample
H
2
D
2
D
1
R2
H
1
E field
R1

Pair of measuring cylinder resonators R1,2
R2′
′′
′
(∅
∅∅
∅30)
R1
(∅
∅∅
∅30)
R2
(∅
∅∅
∅18.1)
samples

Realization of the "Two-Resonator method"
1) By analytical model; 2) by utilization of 3D
ЕМ
simulators
Measurement of the resonance parameters: f
ε
εε
ε
1,2
иQ
ε
εε
ε
1,2
1) Resonators with samples:
Measurement of the resonance parameters: f
01,2
иQ
01,2
(Determination of the so-called equivalent diameters of the
resonators D
eq 1,2
and equivalent wall conductivity
σ
σσ
σ
eq 1,2
)
2) Empty resonators :
•Determination of the pair of parameters: (
ε
εε
ε
'
||
, tan
δ
δδ
δ
ε
εε
ε
||
)
and (
ε
εε
ε
'
⊥
⊥⊥
⊥
, tan
δ
δδ
δ
ε
εε
ε
⊥
⊥⊥
⊥
)
(with special software)
;
•Calculation of the dielectric anisotropy of the
samples: ∆
∆∆
∆A
ε
εε
ε
, ∆
∆∆
∆A
tanδε
δεδε
δε

Analytical model of “Two-Resonator Method"
Task: To obtain analytical relationships between the measured resonance parameters f
ε
εε
ε
1,2
and Q
ε
εε
ε
1,2 of the resonator with sample and the dielectric parameters (
ε
εε
ε
'||;tan
δ
δδ
δ
ε
εε
ε
||)
and
(
ε
εε
ε
'⊥
⊥⊥
⊥; tan
δ
δδ
δ
ε
εε
ε
⊥
⊥⊥
⊥).
E field
E field
13
2
4
5
0tan
tan
tantantan
tan.tan
tantan
tan
tan.tan
tantan
tantan
tan
5
1
541
32
5
1
4
44
2
22
1
11
5533
5
3
5
55
3
33
1
11
4422
4
2
5
55
3
33
4
44
2
22
111
=




+




−







+++







+++







+







+
∏
∑=
=iii
ii
ii h
h
hhh
hh
hh
h
hh
hh
hh
h
β
βββ ββ
β
ββ
β
β
β
β
β
ββ
β
ββ
β
β
β
β
β
ββ
β
ββ
β
β
β
β
β
β
β
ββ
Dispersion equations:
0tan.tan1
tantan
tan.tan1tantan
2211
21
12
55
5
5
33
3
3
5533
53
35
22
2
2
11
1
1
=







−
×







++







−







+
hh
hh
hhhh
ββ
εβεβ
β
ε
β
β
ε
β
ββ
εβεβ
β
ε
β
β
ε
β
β
ββ
β
i – propagation constants in
each layer; hi – thicknesses
of the separate layers;
tan(
β
ββ
β
ihi)for
β
ββ
β
i2> 0 or
tanh(
α
αα
α
ihi)for
β
ββ
β
i2< 0.

E field
13
2
4
5
Quality factor (expressions for resonator R1, similar for R2):
where





+++=
∑ ∑∑ = == bottomtop
i i Wii
ii
PPPPWQ
5
1
5
1
5
1
0
ω
ε
111 /tan WP
ω
δ
ε
=





+++−=
∑∑∑
=== bottomtop
iWi
ii
ii
PPPPQWP
5
1
5
2
0
5
1
1
ε
ω
dzddEW
z
zz
Ri
i
i
ϕρρ
εε
π
ϕ ρ
∫ ∫ ∫
= = = Σ
=
2
1
2
0 0
2
)(
0
2
'
iii
WP
ω
δ
ε
tan
=
R
z
zz
i
t
s
Wi
dzdH
R
P
=
= =
∫ ∫
=
ρ
π
ϕ
ϕρ
2
1
2
0
2
)(
2
)(
0
2
0
2
)4(
24
2
hhz
R
t
s
bottom
ddH
R
P
+−=
= =
∫ ∫
=
ϕρρ
ρ
π
ϕ
135
0
2
0
2
)5(
2
hhhz
R
t
s
top
ddH
R
P
++=
= =
∫ ∫
=
ϕρρ
ρ
π
ϕ
Full final expressions in [1]
Analytical model of “Two-Resonator Method"

Измерване на резонансните параметри
Sample
R1 R2
An example spectrum is given in the
figure at left in the frequency range
of 0-24 GHz for the both considered
types of bulk cylindrical resonators
R1 and R2 with samples. Here the
interesting for measuring purposes
are the azimuthally-symmetrical
modes TE011 and TM010.
Resonance curve in narrow band

Measurement errors
Main sources of measurement errors:
•For permittivity: errors from determination of resonator dimensions, the
resonance frequency, the substrate thickness, etc. ;
•For dielectric loss tangent: errors from determination of resonator dimensions,
the conductivity of the walls, the substrate thickness, the unloaded quality factor,
errors from determination of the permittivity itself, etc.

Important moment: Determination of the equivalent
parameters of the both cylindrical resonators
R in mm; fin GHz;
σ
in S/m; Rs in Ohms
where
(
)
2/1
2
1
2
111 9.22468824.182 −= HfHR eeq 22 /74274.114 eeq fR
=
22,12,12,1
842.3947
Seeq
Rf=
σ
[ ]
1
2
11
5
11
1
3
1
211
5
1
)(109918.21/5.0
1
108798.1
−
−
−
×+−
××=
eeqeq
e
eeqS
fRRH
Q
fRHR
(
)
( )
[ ]
1
222
52
2
222
/11056313.5
1
/40483.25.0
−
−
+×
×=
eqe
e
eqS
RHf
Q
RHR
R1 R2
TE
011
mode TM
010
mode

0.90 0.95 1.00 1.05 1.10
0.92
0.96
1.00
1.04
1.08
R2
,H varied; D fixed
,D varied; H fixed
R1
f / f
0
∆
∆∆
∆
D/D ,
∆
∆∆
∆
H/H
0.90 0.95 1.00 1.05 1.10
0.9
1.0
1.1
1.2
Re
∆
∆∆
∆
D/D ,
∆
∆∆
∆
H
r
/H
r
,
∆
∆∆
∆
D
r
/D
r
Hr- varied; Dr, D- fixed
Dr- varied; Hr, D- fixed
D- varied; Hr, Dr- fixed
f / f0
D
1
H
1
R1 Re
D
HD
r
H
r
D
2
H
2
R2
How to choose which geometrical parameter to be equivalent
in a given resonance structure?

Example: equivalent parameters in R1, R2
Samples
R1 R2
Physical dimensions:
R1
: D
1
= 30; H
1
= 29.82 mm;
R2
: D
2
= 30; H
2
= 12.12 mm.
Equivalent parameters:
R1
: D
1eq
= 30.088 mm;
σ
1eq
= 1.7×10
7
S/m;
(instead of 4.9 ×10
7
S/m)
R2
: D
2eq
= 30.046 mm;
σ
2eq
= 1.1×10
7
S/m
(instead of 4.9 ×10
7
S/m)

012345678
0.0030
0.0035
0.0040
0.0045
0.0050
0.0055
0.0060
tan
δ
δδ
δε
εε
ε⊥
⊥⊥
⊥
tan
δ
δδ
δε
εε
ε||
||||
||
,
tan
δ
δδ
δε
εε
ε
h, mm
012345678
2.60
2.65
2.70
2.75
2.80
2.85
2.90
Polycarbonate
ε
εε
ε
'⊥
⊥⊥
⊥
ε
εε
ε
'
||
||||
||
,
ε
εε
ε
'
r
h, mm
Very important “Isotropic-Sample Test”
Example: Polycarbonate with different thickness
< 2% < 7%

Anisotropic sample
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
3.2
3.3
3.4
3.5
3.6
3.7
3.8
3.9
ε
εε
ε
'||
||||
||
RO4003 substrate
ε
εε
ε
'⊥
⊥⊥
⊥
,
ε
εε
ε
'
r
h, mm
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
0.002
0.003
0.004
0.005
tan
δ
δδ
δ
ε
εε
ε⊥
⊥⊥
⊥
tan
δ
δδ
δ
ε
εε
ε//
////
//
,
tan
δ
δδ
δ
ε
εε
ε
h, mm
+6.1% +25.2%
Example: Rogers 4003 substrate with different thickness

Extension of the “Two-resonator method“ with pairs of
more complicated resonance structures
Metal walls
Sample
E-field direction
Source: Plamen I. Dankov, “Dielectric Anisotropy of Modern Microwave Substrates”,
Chapter 4 in “Microwave and Millimeter Wave Technologies”, IN-TECH Publ., Vienna,
Austria, Jan.2010, ISBN 978-953-7619-66-4

Idea: to use 3D EM simulator for measurement purposes
by resonance methods
Resonator and sample with determined
geometrical parameters and measured
resonance characteristics f
ε
εε
ε
иQ
ε
εε
ε
Introduction of 3D model of the resonator with sample, suitable discretization (griding,
meshing), field simulations, determination of the simulated resonance characteristics
Determination of the full set of
dielectric parameters of materials
(
ε
εε
ε
'||;tan
δ
δδ
δ
ε
εε
ε
||)and (
ε
εε
ε
'⊥
⊥⊥
⊥; tan
δ
δδ
δ
ε
εε
ε
⊥
⊥⊥
⊥).

Principles for construction of 3D models
1) 3D model – realistic or equivalent cavity?
We draw pure cylinders with equivalent diameter D
eq 1,2
and equivalent wall
conductivity
σ
σσ
σ
e1,2
, determined from the measured resonance parameters of the
empty cavities: f
e1,2
and Q
e1,2

N 72 108 144 180 216 288 Meas.
f
e1
, GHz
13.1578
13.1541
13.1529
13.1527
13.1523
13.1520
13.1528
Q
e1
14086
14106
14115
14111
14108
14109
14117
Simple rule: 1) choose D
eq 1,2
and
σ
σσ
σ
e 1,2
; 2) tune Nuntil calculated and measured
resonance parameters f
e 1,2
and Q
e 1,2
are coincided (if the width of the linear
segments describing the cylinder surface is ~λ
λλ
λ/32, this could be enough)
2) Surface description (N– number of the line segments)
Principles for construction of 3D models

3) Field-symmetry properties of the excited modes
The symmetry of the excited modes (TE
011
or TM
010
) allows us to split the
cylinders and to construct smaller 3D cavity models, which considerably
decrease the computational time (50–100 times), improve accuracy and facilitate
the mode identification
R1
R2
(1/8)R1
(1/4)R2
Principles for construction of 3D models

4) Pictures of the E-field vectors in the sample volume
Example: Rogers 4003 sample with thickness 1.53 mm in the (1/8)R1 cavity and
the (1/4)R2 cavity (the red color correspond to a strong E-field; the blue color –
to a weak E-field
Principles for construction of 3D models

Principles for construction of 3D models
(1/8) R1
2
2
3
1
1
R1
1
1
1R2
1
1
1
(1/4) R2
3
3
1
1
1
Boundary conditions:
1 – finite conductivity;
2 – E-field symmetry;
3 – H-field symmetry
TE
011
mode TM
010
mode
5) Symmetrical properties of the excited modes
(E fields)

New measurement resonators
Cylinders Re-Entrant
Split Cylinders Split Coaxial Cylinders

R1
ODPR
SC
Re
R2
Examples for 3D models of more complex resonators and
their suitable “splitting”
1/4R2
1/8
ODPR
1/4Re
1/8R1
1/8SC

New boundary conditions
2
3
2
(1/8) R1
3333
4
22
34
22
Boundary conditions:
1– finite conductivity;
2– E-field symmetry;
3– H-field symmetry;
4– ideal magnetic walls
(1/8) ODPR
(1/8) SC
(1/4) R2 (1/4) Re
11
13
11
111

“Sensitivity” of the different measurement resonators due
to the sample anisotropy (simulation research)
-20 -10 0 10 20
0.990
0.995
1.000
1.005
1.010
1.015
1.020
R2
R1
Re
SC
SCoax
f
anisotropic
/ f
isotropic
∆
∆∆
∆
A
ε
εε
ε
, % -20 -10 0 10 20
0.92
0.96
1.00
1.04
1.08 RO4003 (1.53 mm)
Q
anisotropic
/ Q
isotropic
∆
∆∆
∆
A
tan
δε
δεδε
δε
, %
R1 R2 Re SC SCoax

3
3
rd
rd
Part:
Part:
Data for some one
Data for some one-
-and
and
multi
multi-
-layer materials
layer materials

Measurements of dielectric
Measurements of dielectric
anisotropy of one
anisotropy of one-
-layer RF
layer RF
and microwave substrates
and microwave substrates

1
st
type of data: frequency dependencies of the
dielectric parameters in wide band
0 2 4 6 8 10 12 14 16 18
2.5
2.6
2.7
2.8
2.9
3.0 Polycarbonate 0.5 mm
ε
εε
ε
r
f , GHz
0 2 4 6 8 10 12 14 16 18
0.004
0.005
0.006
0.007
tan
δ
δδ
δ
ε
εε
ε
f , GHz
Legend
Example: Polycarbonate

The same for anisotropic substrate
Example: Rogers 4003 substrate
Legend
0 2 4 6 8 10 12 14 16 18
3.3
3.4
3.5
3.6
3.7
3.8
ε
εε
ε
r
f , GHz
ε
εε
ε
||
ε
εε
ε
⊥
⊥⊥
⊥
ε
εε
ε
eq
0 2 4 6 8 10 12 14 16 18
0.002
0.003
0.004
0.005 RO4003 0.5 mm
tan
δ
δδ
δ
ε
εε
ε
f , GHz
tan
δ
δδ
δ
ε
εε
ε
||
tan
δ
δδ
δ
ε
εε
ε
⊥
⊥⊥
⊥
tan
δ
δδ
δ
ε
εε
ε
eq

2
nd
type of data: dielectric parameters of one
substrate with different thickness
Example: Rogers 4003 substrates with thickness 0.2-1.5 mm
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
3.2
3.3
3.4
3.5
3.6
3.7
3.8
3.9
ε
εε
ε
'||
||||
||
RO4003 substrate
ε
εε
ε
'⊥
⊥⊥
⊥
,
ε
εε
ε
'
r
h, mm
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
0.002
0.003
0.004
0.005
tan
δ
δδ
δ
ε
εε
ε⊥
⊥⊥
⊥
tan
δ
δδ
δ
ε
εε
ε//
////
//
,
tan
δ
δδ
δ
ε
εε
ε
h, mm

3
rd
type of data: dielectric parameters of substrates
from different producers in fixed frequency range

4
th
type of data: statistics of the dielectric
parameters of a given substrate
Substrate Neltec® NH9338
ε
εε
ε
'
||
= 4.0268
±
±±
±
0.032;
tan
δ
δδ
δ
ε
εε
ε
||
= 0.00494
±
±±
±
0.00042
Substrate Neltec® NH9338
ε
εε
ε
'
⊥
⊥⊥
⊥
= 3.130422
±
±±
±
0.031;
tan
δ
δδ
δ
ε
εε
ε
⊥
⊥⊥
⊥
= 0.00246
±
±±
±
0.00032
Catalogue: 3.38 / 0.0025

5
th
type of data: local inhomogeneity of the dielectric
parameters of samples, extracted from one sheet
Ox samples
Oy
Area for plate manufacture
Area for plate manufacture
samples
XY-type
resonators
Y-type resonators
X-type resonators

Data for the inhomogeneity of the dielectric
parameters along the X and Y of NH9338 substrate
( )
∑
=
−
−
±=
n
ii
xx
n
SDx
12
1
1
Standard deviation
SD
ε
ε
ε
ε
||
SD
ε
ε
ε
ε
⊥
⊥
⊥
⊥
SDh
Substrate
SD
ε
εε
ε
||
SD
ε
εε
ε
⊥
⊥⊥
⊥
SDtg
δ
δδ
δ
ε
εε
ε
|
SDtg
δ
δδ
δ
ε
εε
ε
⊥
⊥⊥
⊥
SDh n SDZ
C
SD
ε
εε
ε
ef f
SD
β
ββ
β
SD
α
αα
α
NH9338 ±0.80 ±1.00 ±8.5 ±13.0 ±0.7 90 ±.52 ±0.91 ±0.45 ±6.1
RO4003 ±0.2 ±0.5 ±2.0 ±9.0 ±0.2 12 ±0.22 ±0.45 ±0.23 ±4.4
NH9300 ±0.60 ±0.85 ±6.9 ±10.7 ±1.0 97 ±0.37 ±.75 ±0.37 ±2.8
RO3203 ±0.3 ±0.3 ±1.0 ±3.0 ±0.1 18 ±0.13 ±0.27 ±.13 ±0.37
Measured standard deviations (SD) in %
XY

Confirmation of the observed periodicity of the
inhomogeneity of
ε
εε
ε
'
r
by another methods (TDR)
along the X-direction
along the Y-direction
2.5 mm
5 mm
Comment: The local inhomogeneity of the dielectric
parameters (e.g. for
ε
εε
ε
r
) in NH9300 substrate is not so
large, but sufficient for accumulation of random phase
delays of the signal propagating along different axes 0x
and 0y or in mixed direction. If this substrate is used for
antenna feed lines longer than 10λ
g
, the phases between
two signals in two lines with equal length, but randomly
oriented, can exceed value ~30-60 deg, which can
completely destroy the beamforming in large antennas.

Special cases: measurements of different materials
Ferrites and magneto-
dielectrics
E field H field
Gradient
absorbers

Special cases: measurements of different materials
Very thin nano-material
composites Artificial dielectrics

Special cases: measurements of different materials
LTCC ceramics Multi-layer
antenna radomes
-30
-20
-10
0
10
20
30
40
50
60
70
80
90
100
core
top skin
bottom skin
whole sample
whole sample
top skin
top coating
top glue fillets
bottom glue fillets
Model 1
Model 3
Model 2
core bottom skin
whole sample
anisotropy, %
Radome
models
dielectric constant anisotropy
dielectric loss tangent anisotropy

Special cases: measurements of different materials
Fresh biomass Lysozyme
air
Lysozyme
solution

Plamen I. Dankov, "Two-Resonator Method for Measurement of Dielectric
Anisotropy in Multi-Layer Samples”, IEEE Trans. Microwave Theory Tech.,
MTT-54, April 2006, pp. 1534-1544
Plamen I. Dankov et. al., “Measurement of Dielectric Anisotropy of Microwave
Substrates by Two-Resonator Method with Different Pairs of Resonators",
PIERS online: vol. 5, No. 6, 2009, pp. 501-505 (online available:
http://piers.org/piersonline/piers.php?volume=5&number=6&page=501)
Plamen I. Dankov, “Dielectric Anisotropy of Modern Microwave Substrates”,
Chapter 4 in “Microwave and Millimeter Wave Technologies from Photonic
Bandgap Devices to Antenna and Applications”, ed. by Igor Minin, IN-TECH
Publ., Vienna, Austria, Jan. 2010, ISBN 978-953-7619-66-4 (online available:
http://www.intechopen.com/books/microwave-and-millimeter-wave-
technologies-from-photonic-bandgap-devices-to-antenna-and-applications)
Two resonator method
Two resonator method –
–main
main
references
references

Dielectric parameters of the most common substrate in
the near past (very valuable results (!) for engineers who
are involved in the design of microwave devices)

Other papers dealing with the dielectric
anisotropy
Mumcu, Gokhan, Kubilay Sertel, and John L. Volakis. "A measurement process to
characterize natural and engineered low-loss uniaxial dielectric materials at
microwave frequencies." IEEE Transactions on Microwave Theory and
Techniques, vol. 56, issue 1 (2008): pp. 217-223.
Zhang, Huiyu, Soon Yim Tan, and Hong Siang Tan. "An improved method for
microwave nondestructive dielectric measurement of layered media." Progress In
Electromagnetics Research B vol. 10 (2008): pp. 145-161.
Rautio, James C., et al. "Shielded dual-mode microstrip resonator measurement of
uniaxial anisotropy." IEEE Transactions on Microwave Theory and Techniques,
vol. 59. issue 3 (2011): pp. 748-754.
Horn III, Allen F., Patricia A. LaFrance, John W. Reynolds, and John Coonrod. "The
influence of test method, conductor profile and substrate anisotropy on the
permittivity values required for accurate modeling of high frequency planar
circuits." Circuit World 38, no. 4 (2012): 219-231.
Ricky Lee Sturdivant, “Microwave and Millimeter-wave Electronic Packaging”,
Artech House, Inc., Norwood, MA, USA, 2014 (to be published 2014).

Data for some planar substrates
(valuable results, not published jet)
An important result (!): In different planar structures the recalculated equivalent
dielectric parameters are different, depend on the field distribution. Therefore, the
introduction of the dielectric anisotropy in 3D simulators in the design of planar
devices is considerably important. This is a new "culture" of the utilization of the
data for the materials in the modern 3D simulators

Two-Resonator Method for Anisotropy
Measurement, Assisted by 3D Simulators
Simple realization in laboratory conditions (by the users,
not by the producers); equipment independent
Calculations based on arbitrary 3D simulator (no
additional software is needed); simulator independent
Enough accuracy (< ±3 % for dielectric constant
anisotropy and < ±8 % for loss tangent anisotropy);
Possibility for measurement of dielectric anisotropy in
multi-layer samples)

Thanks for
Thanks for
your
your
attention!
attention!
(September 2013)
(September 2013)