Conference Paper

Three dimensional numerical prediction of epoxy flow during the underfill process in flip chip packaging

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Abstract

In the present paper, a 3D numerical prediction has been made to study the flip chip underfill process using the epoxy molding compound (EMC). The prediction considered the EMC filling behavior for the flow induced between the tiny gap of silicon die and substrate. Three different arrangements of the solder bump have been tested in this work. The EMC is treated as a generalized Newtonian fluid (GNF). The developed methodology combines the Kawamura and Kawahara technique, and the melt front volume tracking method to solve the two-phase flow field around the solder bumps. The Castro-Macosko rheology model with Arrhenius temperature dependence is adopted in the viscosity model. The predictions are made to investigate the filling patterns at several time intervals. The results show that the underfill process for solder bump with Type A gives minimum filling time and better filling yield. The effect of gap height between the plate and substrate on the underfill process also has been considered. The close agreement between prediction and experimental results from the previous work illustrates the applicability of the present numerical model.

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... Process engineers can use transparent dies [18,19], and different coloured underfills if a flow analysis is required. The industry used the 'I' and 'L' path techniques [20], followed by a seal pass. The underfill process was brought with a new level of robustness when jetting technology was introduced. ...
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... For protecting the package from adverse environmental affect, encapsulation is required. Generally, thermoset material is used for encapsulation and the process involved is transfer molding [1][2]. This molding process is preferred since it offers high accuracy of transfer molding tooling and at the same time, low cycle time of the process. ...
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Flip-chip underfill process is a very important step in the flip-chip packaging technology because of its great impact on the reliability of the electronic devices. In this technology, underfill is used to redistribute the thermo-mechanical stress generated from the mismatch of the coefficient of thermal expansion between silicon die and organic substrate for increasing the reliability of flip-chip packaging. In this article, the models which have been used to describe the properties of underfill flow driven by capillary action are discussed. The models included apply to Newtonian and non-Newtonian behavior with and without the solder bump resistance for the purpose of understanding the behavior of underfill flow in flip-chip packaging.
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The underfill flow process is one of the important steps in Microsystems technology. One of the best known examples of such a process is with the flip-chip packaging technology which has great impact on the reliability of electronic devices. For optimization of the design and process parameters or real-time feedback control, it is necessary to have a dynamic model of the process that is computationally efficient yet reasonably accurate. The development of such a model involves identifying any factors that can be neglected with negligible loss of accuracy. In this paper, we present a study of flow transient behavior and flow resistance due to the presence of an array of solder bumps in the gap. We conclude (1) that the assumption of steady flow in the modeling of the flow behavior of fluids in the flip-chip packaging technology is reasonable, and (2) the solder bump resistance to the flow can not be neglected when the clearance between any two solder bumps is less than 60–70 μm. We subsequently present a new model, which extends the one proposed by Han and Wang in 1997 by considering the solder bump resistance to the flow.
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Underfill process is a very important step in the flip-chip packaging because of its great impact on the reliability of electronic devices. In the control of the underfill dispensing in flip-chip packaging, an analytical model for the underfill flow behavior is required to perform the control action. Traditionally, the Washburn model is used for predicting the viscous flow behavior in the flip-chip underfill process driven by capillary forces. Unfortunately, some studies in the literature have shown that the model does not match the measured results well due to the neglect of the characteristics such as solder bump resistance and non-Newtonian behavior of underfills. Although some underfill flow models have been developed for considering these characteristics, there is no sufficient account for such a mismatch from the literature. In this article, we present an experimental investigation aimed to understand the possible causes responsible for the observed mismatch with the Washburn model. The experimental investigation confirmed that the underfill fluid used in flip-chip packaging shows a complex non-Newtonian behavior and that the Washburn model is, indeed, only applicable to the Newtonian fluid in this setting. Another contribution of the work reported in this article is the provision of measured data on a test bed which was built upon using the off-the-shelf components; as such the data can be used by other researchers to validate their theoretical findings.
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Thesis (Ph.D.)--The University of Saskatchewan, 2005. Includes bibliographical references.
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The capillary rise of liquid in a cylinder bank is examined in order to study the capillary pressure variation perpendicular to the direction of the cylinders. The calculations consider the local geometric variation of the flow channel and the position-dependent capillary pressure. The capillary flow around each cylinder is calculated by balancing the capillary pressure and the viscous drag along the flow path. The rate of filling for several layers of cylinders is used to estimate the equivalent capillary pressure. The method is also applied to the underfill of a flip chip system, which is modeled as a cylinder bank between parallel plates.
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This paper presents recent results on underfill flow characterization. The flow properties of a number of commercial and experimental underfills were recorded and analyzed using quartz test chips with specially designed bump patterns (e.g., peripheral, full array, and mixed designs). Each was bonded onto an organic laminate substrate to form a flip chip package. Underfill was then applied to the packages and flow time, filler settling, and air entrapment were evaluated. Good flow can be described in terms of three measurable parameters, namely, viscosity, contact angle, and more importantly, filler size and distribution. Viscosity and contact angle are commonly used in Hele Shaw and Washburn models. However, these models do not take filler properties into consideration. In general, underfills with particles less than 5 μm exhibited faster and more uniform flow fronts than materials with larger particles. The best flowing materials worked well with standoff heights between 50 and 75 μm, while the poorer flowing materials showed streaking, voiding, and fingering at these heights. At gaps of 25 μm, however, nearly all the materials exhibited pronounced and reproducible streaking
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The flow characteristics of a number of underfills were evaluated with quartz dies of different patterns and pitches bonded on different substrate surfaces. Perimeter, mixed array, and full array patterns were tested. Observations on the flow front uniformity, streaking, voiding, and filler segregation were collected, The information was compared with the results predicted by a new simulation code, plastic integrated circuit encapsulation-computer aided design (PLICE-CAD) under DARPA-funded development. The two-phase model of the combined resin and air takes into account geometrical factors such as bumps and die edges, together with boundary conditions in order to track accurately the propagation of the flow fronts, The two-phase flow field is based on the volume-of-fluid (VOF) methodology embedded in a general-purpose three-dimensional (3-D) flow solver
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This article describes an analytical model for the prediction of the underfill flow characteristics in a flip-chip package driven by capillary action. In this model, we consider non-Newtonian fluid properties of the encapsulant as opposed to most other studies where Newtonian fluid properties were assumed for the underfill flow. The power-law constitutive equation was applied in our study. The simulation based on this model agreed well with the measurement obtained from the experiments available in literature. It was further shown that this model performs better than the Washburn model traditionally used for the prediction of underfill flow characteristics in the flip-chip packaging. Based on this model, the effects of the solder bump pattern (including bump pitch, solder bump diameter, and gap height) on the process variables (i.e., flow front and filling time) were studied, which facilitated both the package design and the process optimization.
In this paper, the flow of encapsulant during the underfill encapsulation of flip-chips has been studied. Analytical as well as numerical methods have been developed to analyze the flow. For capillary-driven encapsulation (by dispensing), the capillary force at the melt-front has been calculated based on a model for the melt-front shape. A model has also been developed for the analysis of forced-injection encapsulation. The numerical analysis uses a finite-element method based on a generalized Hele-Shaw method for solving the flow field. Experiments have been performed to investigate the flow behavior using actual chips and encapsulants. Short-shot runs have been performed to observe the melt-front advancement at different flow times. In addition, measurements have been made of the material properties of the encapsulant, namely its viscosity, curing kinetics and surface-tension coefficient. The experimental and simulation results have been compared in terms of the flow-front shapes and times at different fill fractions. Such comparisons indicate that the model developed in this study is adequate to approximately simulate the flow during encapsulation of flip chips
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