The sulphides and selenides of Mo and Ware layered compounds that possess a hexagonal strueture. The electronic structure of these layered transition metal dichalcogenide compounds, e.g. MoS2, WS2, MoSe2, WSe2, etc. [1-6], is of fundamental interest primarily because of the unusual crystal structure of these compounds. Within a layer the bonds are strong; while between adjacent layers, they are weak. As a result, the compounds exhibit marked anisotropy in most of their physical properties, which accounts for the great interest in this family of materials. The layer type structure also facilitates the process of intercalation by foreign metal atoms and organic and inorganic molecules, thereby allowing a convenient method of changing the strueture and electronic properties of the host crystals [7]. These compounds can form a wide fange of solid solutions, with either mixed metals or mixed chalcogenides [8, 9]. The main applications of these types of compounds are in hydrogen storage devices [7], in the field of catalysis [10], high temperature high pressure lubricants [1], long-life photochemical solar cells [11], etc. We have prepared a series of mixed metal-chalcogens solid solutions based on the Mo-W-S-Se quaternary system, Mo0.sW0.sSxSe2-x (0 ~< x ~< 2); whose characterization, thermal and magnetic behaviour have been reported earlier [12]. The aim of the present smdy is to determine some microstructural parameter, like particle size, r.m.s, strain, etc.; and, owing to the strong intralayer and weak interlayer forces, layer disorders are expected. We have thus calculated the variability of interlayer spacing, g, the fraction of planes affected by such defects, 7, and the dislocation density, p, etc. The estimations have been made using the method of variance, Fourier and integral width of the X-ray diffraction (XRD) line profiles of the (0 0 1) reflections. The compounds were synthesized directly from the elements, and the method of preparation is quite similar to that reported earlier [13]. The sample was then ground at room temperature (32 °C) by hand without any appreciable change in temperature and were passed through a 150 mesh sieve. The XRD intensities of the compounds were taken on a Philips 1729 diffractometer using CuKa radiation. Assuming that the broadening of the X-ray diffraction (XRD) line profile is due to presence of size broadening, strain broadening and broadening