A Study on the Structure-Piezoresponse Property of a ZnO Nanobelt by In Situ Transmission Electron Microscopy

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of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Ferritic-martensitic steels, such as T91, are candidate materials for high-temperature applications, including superheaters, heat exchangers, and advanced nuclear reactors. Considering these alloys’ wide applications, an atomistic understanding of the underlying mechanisms responsible for their excellent mechano-chemical properties is crucial. Here, we developed a modified embedded-atom method (MEAM) potential for the Fe-Cr-Si-Mo quaternary alloy system—i.e., four major elements of T91—using a multi-objective optimization approach to fit thermomechanical properties reported using density functional theory (DFT) calculations and experimental measurements. Elastic constants calculated using the proposed potential for binary interactions agreed well with ab initio calculations. Furthermore, the computed thermal expansion and self-diffusion coefficients employing this potential are in good agreement with other studies. This potential will offer insightful atomistic knowledge to design alloys for use in harsh environments.
Electronic transport through individual ZnO nanowires has been investigated. The current increases linearly with the bias and the conductance jumps upon ultraviolet illumination. The increase rate upon the illumination is much faster than the decrease rate as the light is off. The decrease rate under vacuum is slower than that in air. These phenomena are related to the surface oxygen species and further confirmed by in situ current–voltage measurements as a function of oxygen pressure at room temperature. Also, the conductance increases greatly as the temperature is raised. These results demonstrate that the surface oxygen species dominate the transport process through individual ZnO nanowires, which indicates their potential application to room temperature gas sensors. © 2004 American Institute of Physics.
  • M Huang
  • P Rugheimer
  • M G Lagally
  • F Liu
M. Huang, P. Rugheimer, M. G. Lagally, and F. Liu, Phys. Rev. B 72, 085450 (2005).