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Manufacturing avalanche diodes for detection of low energy gamma- and X-rays

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Abstract

Three types of silicon avalanche detectors for low energy gamma- and X-ray counting were manufactured using planar and planar-epitaxial technology. The detectors were tested at room temperature with 57Co and 241Am. Besides the characteristic lines of the sources additional peaks were observed due to X-rays of elements included in the matrices and holders of the sources.For 6.4 keV the energy resolution is approximately 10%.

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