Motion Controller for Atomic Force Microscopy Based Nanobiomanipulation

ChapterinLecture Notes in Control and Information Sciences 413:153-168 · July 2011with18 Reads
Impact Factor: 0.25 · DOI: 10.1007/978-3-642-22173-6_9
In book: Control Technologies for Emerging Micro and Nanoscale Systems, pp.153-168

    Abstract

    Nanomanipulation with Atomic Force Microscopy (AFM) is one of the fundamental tools for nanomanufacturing. The motion control
    of the nanomanipulation system requires accurate feedback from the piezoelectric actuator and a highfrequency response from
    the control system. Since a normal AFM control system for scanning motion is not suitable for control of arbitrary motion,
    we therefore modified the hardware configuration to meet the demand of nanomanipulation control. By identifying the necessary
    parameters using system identification methods, we built up a new dynamic model for the modified configuration. Based on the
    new model and configuration, we designed and implemented a control scheme as motion controller for AFM nanomanipulation operation.
    The aims are to analyze various factors in the control of the AFM-based nanomanipulation system. By integrating the original
    AFM controller with the external Linux real-time controller, we achieved a stable system with high-frequency response. Several
    problems have been addressed based on the new control scheme, such as high frequency response, robust feedback control and
    non-linearity, etc. Finally this Multiple-Input Single-Output (MISO) system is validated by a real-time nanomanipulation task.
    It is proved to be an effective and efficient tool for the controlling of the nanobiomanipulation operation by cutting the
    intercellular junction of human keratinocytes.