Article

On the simple random-walk models of ion-channel gate dynamics reflecting long-term memory

Department of Physical Chemistry and Technology of Polymers, Section of Physics and Applied Mathematics, Silesian University of Technology, Ks. M. Strzody 9, 44-100 Gliwice, Poland.
Biophysics of Structure and Mechanism (Impact Factor: 2.22). 04/2012; 41(6):505-26. DOI: 10.1007/s00249-012-0806-8
Source: PubMed

ABSTRACT

Several approaches to ion-channel gating modelling have been proposed. Although many models describe the dwell-time distributions correctly, they are incapable of predicting and explaining the long-term correlations between the lengths of adjacent openings and closings of a channel. In this paper we propose two simple random-walk models of the gating dynamics of voltage and Ca(2+)-activated potassium channels which qualitatively reproduce the dwell-time distributions, and describe the experimentally observed long-term memory quite well. Biological interpretation of both models is presented. In particular, the origin of the correlations is associated with fluctuations of channel mass density. The long-term memory effect, as measured by Hurst R/S analysis of experimental single-channel patch-clamp recordings, is close to the behaviour predicted by our models. The flexibility of the models enables their use as templates for other types of ion channel.

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