Localization of spontaneous emission in front of a mirror

Department of Chemistry, Ultrafast Laser and Spectroscopy Laboratory, University of Groninge, Nijenborgh 16, 9747 AG Groningen, The Netherlands
Optics Communications (Impact Factor: 1.45). 09/1989; 73(2):91-95. DOI: 10.1016/0030-4018(89)90149-1
Source: OAI


We show that the fluorescence emitted in front of a mirror exhibits angular and spectral localization effects that are caused by self-interference in the spontaneous emission from a Wiener-fringe pattern. A semi-classical description is given and found to be in good agreement with the observations.

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Available from: Douwe A. Wiersma
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    • "Self-interference fluorescence microscopy (SIFM) extends the capabilities of confocal microscopy by providing depth sensitivity much better than the axial spot size. Fluorescence self-interference has been explored before [6–10], but these approaches were based on a transmission configuration and therefore could not easily be incorporated into conventional or miniature imaging systems. Our SIFM method addresses this challenge by collecting the fluorescence in the backward direction and phase-encoding the depth information through the use of a phase plate (e.g., a glass plate with an opening) placed into the beam path. "
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