Conference Paper

Improved Registration for Large Electron Microscopy Images.

Med. Sch., Comput. Radiol. Lab., Harvard Univ., Boston, MA, USA
DOI: 10.1109/ISBI.2009.5193077 Conference: Proceedings of the 2009 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Boston, MA, USA, June 28 - July 1, 2009
Source: DBLP


In this paper we introduce a novel algorithm for alignment of Electron Microscopy images for 3D reconstruction. The algorithm extends the Expectation Maximization - Iterative Closest Points (EM-ICP) algorithm to go from point matching to patch matching. We utilize local patch characteristics to achieve improved registration. The method is applied to enable 3D reconstruction of Transmission Electron Microscopy (TEM) images. We demonstrate results on large TEM images and show the increased alignment accuracy of our approach.

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