Younes Boukellal

Younes Boukellal
Laboratoire National de Métrologie et d'Essais · Yvelines

Research Engineer in Nanometrology

About

13
Publications
4,107
Reads
How we measure 'reads'
A 'read' is counted each time someone views a publication summary (such as the title, abstract, and list of authors), clicks on a figure, or views or downloads the full-text. Learn more
31
Citations
Additional affiliations
March 2014 - present
March 2011 - March 2014

Publications

Publications (13)
Thesis
Full-text available
Avec l’émergence des nanosciences et nanotechnologies ces dernières années, l’étude et la caractérisation des propriétés dimensionnelles et physicochimiques sur des structures ayant des dimensions inférieures à 100 nm sont devenues indispensables. Cela nécessite la mise au point de techniques de mesures et le développement d’instruments adaptées au...
Article
In the frame of developing a thermally passive atomic force microscope head, a new kind of 2D displacement sensor based on a four quadrant optic fibre bundle has been implemented. The aim is to replace the quad cell photodiode used in the optical beam deflection method to detect cantilever deflection. The use of the bundle as a position sensor has...
Article
This article reports on the development of a new kind of 2D displacement sensor based on an optic fiber bundle whose fiber arrangement has been customized to provide an input sensitive surface with four quadrants. The fibers of each quadrant are regrouped to form four output arms. The aim is to reach behavior similar to that of a quad cell photodio...
Conference Paper
Full-text available
A metrological Atomic Force Microscope (mAFM) has been developed at LNE [1, 2]. It is mainly used for performing traceable measurement and calibration of transfer standards dedicated to scanning probe and scanning electron microscopes. In order to improve the mAFM performance and reduce the measurement uncertainty, a new mAFM head is being develope...
Article
Full-text available
LNE is developing a MEtrological ChARacterization of Nanomaterials (CARMEN) platform to offer a complete supply of main parameter measurements characterizing a nano-object (size, shape, polydispersity, agglomeration/aggregation state, surface charges, specific charges. . . ). Other physical properties such local electrical measurements will be able...
Article
In order to evaluate the uncertainty budget of the LNE's mAFM, a reference instrument dedicated to the calibration of nanoscale dimensional standards, a numerical model has been developed to evaluate the measurement uncertainty of the metrology loop involved in the XYZ positioning of the tip relative to the sample. The objective of this model is to...
Poster
Full-text available
Nanosciences and Nanotechnologies industrial activities raise new questions in terms of production processes and potential risks associated to the use of nanomaterials. The reliability of measurement data appears as a core issue and stresses the importance of developing metrological traceability to common references (most of the time the Internatio...
Poster
Full-text available
Scanning probe microscopes (SPMs) are very well suited for characterization at the nanometer scale. To ensure the measurement consistency and the accuracy of the results, those SPMs need to be periodically calibrated. It’s done thanks to standards whose dimensional characteristics are measured by a metrological atomic force microscope (mAFM). LNE d...
Presentation
Full-text available
Modeling of a metrological AFM interferometric position measurement system to determine its measurement uncertainty
Conference Paper
Full-text available
A metrological atomic force microscope (mAFM) has been developed at LNE [1, 2]. It can be used for traceable Atomic Force Microscope (AFM) measurement and calibration of transfer standards dedicated to scanning probe microscopy. It is based on an immobile AFM head working in a zero detection mode. All the displacements (i.e. the three translations)...

Questions

Question (1)
Question
I'm using a fiber optic bundle as a 2d displacement sensor to measure a small displacement. The bundle contains 40 000 micro fibers and those fibers are glued inside the bundle but not fused. That leads to a multiple dead zone between fibers. In order to improve the active surface of the bundle, we want to fuse the optical fibers at high temperature ( industrial process) but I want to know before performing this operation how can I estimate the impact of coupling between optical fibers when they are fused at high temperature , knowing that we use a borocylicate fibers with a 50 µm core diameter and a clading of 5µm only.  

Network

Cited By

Projects

Projects (3)
Project
The LNE’s metrological Atomic Force Microscope (mAFM) is the French reference instrument for calibrating standards dedicated to Scanning Probe Microscope (SPM) and Scanning Electron Microscope (SEM). On this instrument, the relative position of the tip with respect to the sample is measured in real time by interferometry in order to achieve direct traceability to the SI.