Victor Fiorese- Test engineer at STMicroelectronics
Victor Fiorese
- Test engineer at STMicroelectronics
About
6
Publications
121
Reads
How we measure 'reads'
A 'read' is counted each time someone views a publication summary (such as the title, abstract, and list of authors), clicks on a figure, or views or downloads the full-text. Learn more
29
Citations
Current institution
Publications
Publications (6)
This article introduces the first BiCMOS SiGe technology-based packaged noise source (NS) operating in the
$G$
-band (140–220 GHz). An amplified p-n junction diode has been packaged and biased in avalanche mode to generate excess noise ratios (ENRsav) of approximately 25 dB between 140 and 170 GHz at package output for an unbiased low state and a...
Les technologies avancées sur silicium visant des Ft/Fmax supérieures à 400 GHz permettent la conception de circuits sur silicium dans la plage de fréquence 130-260 GHz. Afin de pousser le développement de ces technologies et l’extraction des facteurs de mérite des transistors tels que le facteur de bruit, l’efficacité en puissance et leur modélisa...
