About
241
Publications
34,607
Reads
How we measure 'reads'
A 'read' is counted each time someone views a publication summary (such as the title, abstract, and list of authors), clicks on a figure, or views or downloads the full-text. Learn more
4,947
Citations
Current institution
Additional affiliations
March 1996 - March 2020
March 1994 - March 1995
September 1996 - September 1998
Publications
Publications (241)
Nanopillars are widely used for various applications and require accurate shape characterization to enhance their performance and optimize fabrication processes. In this paper, we employ coherent Fourier scatterometry (CFS) combined with rigorous three-dimensional finite-difference time-domain simulations to accurately determine the shapes of nanop...
We demonstrate a broadband implementation of coherent Fourier scatterometry (CFS) using a supercontinuum source. Spectral information can be resolved by splitting the incident field into two pulses with a variable delay and interfering them at the detector after interaction with the sample, bearing similarities with Fourier-transform spectroscopy....
In power electronics, compound semiconductors with large bandgaps, like silicon carbide (SiC), are increasingly being used as material instead of silicon. They have a lot of advantages over silicon but are also intolerant of nanoscale material defects, so that a defect inspection with high accuracy is needed. The different defect types on SiC sampl...
Inspection of surface and nanostructure imperfections play an important role in high-throughput manufacturing across various industries. This paper introduces a novel, parallelised version of the metrology and inspection technique: Coherent Fourier scatterometry (CFS). The proposed strategy employs parallelisation with multiple probes, facilitated...
Nanostructures with steep side wall angles (swa) play a pivotal role in various technological applications. Accurate characterization of these nanostructures is crucial for optimizing their performance. In this study, we propose a far-field detection method based on coherent Fourier scatterometry (CFS) for accurate quantification of steep swa and h...
We show a general method to estimate with optimum precision, i.e., the best precision determined by the light-matter interaction process, a set of parameters that characterize a phase object. The method is derived from ideas presented by Pezze []. Our goal is to illuminate the main characteristics of this method as well as its applications to the p...
We exploit quantum correlations to enhance quantitative phase retrieval of an object in a non-interferometric setting, only measuring the propagated intensity pattern after interaction with the object
We propose a technique which exploits entanglement to enhance quantitative phase retrieval of an object in a non-interferometric setting only measuring the propagated intensity pattern after interaction with the object
Detecting defects on diffraction gratings is crucial for ensuring their performance and reliability. Practical detection of these defects poses challenges due to their subtle nature. We perform numerical investigations and demonstrate experimentally the capability of coherent Fourier scatterometry (CFS) to detect particles as small as 100 nm and al...
Integrated photonic platforms have proliferated in recent years, each demonstrating its unique strengths and shortcomings. Given the processing incompatibilities of different platforms, a formidable challenge in the field of integrated photonics still remains for combining the strengths of different optical materials in one hybrid integrated platfo...
Optical singularities indicate zero-intensity points in space where parameters, such as phase, polarization, are undetermined. Vortex beams such as the Laguerre–Gaussian modes are characterized by a phase factor eilθ, and contain a phase singularity in the middle of its beam. In the case of a transversal optical singularity (TOS), it occurs perpend...
Quantum entanglement and squeezing have significantly improved phase estimation and imaging in interferometric settings beyond the classical limits. However, for a wide class of non-interferometric phase imaging/retrieval methods vastly used in the classical domain, e.g., ptychography and diffractive imaging, a demonstration of quantum advantage is...
Integrated photonic platforms have proliferated in recent years, each demonstrating its own unique strengths and shortcomings. Given the processing incompatibilities of different platforms, a formidable challenge in the field of integrated photonics still remains for combining the strength of different optical materials in one hybrid integrated pla...
Integrated photonic platforms have proliferated in recent years, each demonstrating its own unique strengths and shortcomings. Given the processing incompatibilities of different platforms, a formidable challenge in the field of integrated photonics still remains for combining the strength of different optical materials in one hybrid integrated pla...
Integrated photonic platforms have proliferated in recent years, each demonstrating its own unique strengths and shortcomings. However, given the processing incompatibilities of different platforms, a formidable challenge in the field of integrated photonics still remains for combining the strength of different optical materials in one hybrid integ...
A fast noninvasive method based on scattering from a focused radially polarized light to detect and localize subwavelength nanoparticles on a substrate is presented. The technique relies on polarization matching in the far field between scattered and spurious reflected fields. Results show a localization uncertainty of ≈ 10 −4 λ 2 is possible for a...
Quantum entanglement and squeezing have significantly improved phase estimation and imaging in interferometric settings beyond the classical limits. However, for a wide class of non-interferometric phase imaging/retrieval methods vastly used in the classical domain e.g., ptychography and diffractive imaging, a demonstration of quantum advantage is...
It has been a widely growing interest in using silicon carbide (SiC) in high-power electronic devices. Yet, SiC wafers may contain killer defects that could reduce fabrication yield and make the device fall into unexpected failures. To prevent these failures from happening, it is very important to develop inspection tools that can detect, character...
By combining coherent Fourier scatterometry (CFS) with synthetic optical holography (SOH) we show that the sensitivity of detection of isolated nanoparticles on surfaces can be substantially increased. This improvement is a result of the boost in the signal at the detector due to the added reference beam, and the reduction of background noise cause...
Coherent Fourier Scatterometry (CFS) is a scatterometry technique that has been applied for grating and nanoparticle detection. Here, it has been challenged to verify the detectability of the so-called killer defects on SiC samples for power electronic applications. It has been shown that CFS is able to precisely recognize these defects regardless...
We demonstrate the detection of particles/contamination present on a structured surface using Coherent Fourier scatterometry (CFS) by applying Fourier filtering to the scanned maps, which eliminates background effects due to the electronic noise as well the structure itself. We show that by using filters in the Fourier space we can significantly im...
We present an erratum to our article Kolenov, D., et al. “Direct detection of polystyrene equivalent nanoparticles with a diameter of 21 nm ( ∼ λ/19) using coherent Fourier scatterometry.” Opt. Express 29, 16487 (2021)10.1364/OE.421145.
We demonstrate that the sensitivity of nanoparticle detection on surfaces can be substantially improved by implementing synthetic optical holography (SOH) in coherent Fourier scatterometry (CFS), resulting in a phase-sensitive confocal differential detection technique that operates at very low power level (P = 0.016 mW). The improvement in sensitiv...
Accurate determination of the physical parameters of nanostructures from optical far-field scattering is an important and challenging topic in the semiconductor industry. Here, we propose a novel metrology method to determine simultaneously the height and side-wall angle of a step-shaped silicon nanostructure. By employing an optical singular beam...
Shortly after their inception, superconducting nanowire single-photon detectors (SNSPDs) became the leading quantum light detection technology. With the capability of detecting single-photons with near-unity efficiency, high time resolution, low dark count rate, and fast recovery time, SNSPDs outperform conventional single-photon detection techniqu...
In recent years, a lot of works have been published that use parameter retrieval using orbital angular momentum (OAM) beams. Most make use of the OAM of different Laguerre-Gauss modes. However, those specific optical beams are paraxial beams and this limits the regime in which they can be used. In this paper, we report on the first results on retri...
Quantum correlation, such as entanglement and squeezing have shown to improve phase estimation in interferometric setups on one side, and non-interferometric imaging scheme of amplitude object on the other. In the last case, quantum correlation among a pair of beams leads to a sub-shot-noise readout of the image intensity pattern, where weak detail...
Shortly after their inception, superconducting nanowire single-photon detectors (SNSPDs) became the leading quantum light detection technology. With the capability of detecting single-photons with near-unity efficiency, high time resolution, low dark count rate, and fast recovery time, SNSPDs outperform conventional single-photon detection techniqu...
The sidewall angle (SWA) of a nanostructure exerts influence on the performance of the nanostructure and plays an important role in processing nano-structural chips. It is still a great challenge to determine steep SWAs from far field measurements especially when the SWAs are close to 90°. Here, we propose a far-field detection system to determine...
Coherent Fourier scatterometry (CFS) has been introduced to fulfil the need for noninvasive and sensitive inspection of subwavelength nanoparticles in the far field. The technique is based on detecting the scattering of coherent light when it is focused on isolated nanoparticles. In the present work, we describe the results of an experimental study...
Single photon detectors are indispensable tools in optics, from fundamental measurements to quantum information processing. The ability of superconducting nanowire single photon detectors (SNSPDs) to detect single photons with unprecedented efficiency, short dead time, and high time resolution over a large frequency range enabled major advances in...
Single photon detectors are indispensable tools in optics, from fundamental measurements to quantum information processing. The ability of superconducting nanowire single photon detectors to detect single photons with unprecedented efficiency, short dead time and high time resolution over a large frequency range enabled major advances in quantum op...
The analysis of 2D scattering maps generated in scatterometry experiments for detection and classification of nanoparticles on surfaces is a cumbersome and slow process. Recently, deep learning techniques have been adopted to avoid manual feature extraction and classification in many research and application areas, including optics. In the present...
Previous simulation studies by Menzel et al. [Phys. Rev. X 10, 021002 (2020)] have shown that scattering patterns of light transmitted through artificial nerve fiber constellations contain valuable information about the tissue substructure such as the individual fiber orientations in regions with crossing nerve fibers. Here, we present a method tha...
Optical inspection of periodic nanostructures is a major challenge in the semiconductor industry due to constantly decreasing critical dimensions. In this paper we combine coherent Fourier scatterometry (CFS) with a sectioning mask for subwavelength grating parameter determination. By selecting only the most sensitive regions of the scattered light...
Improving the image quality of small particles is a classic problem and especially challenging when the distance between particles are below the optical diffraction limit. We propose a imaging system illuminated with radially polarized light combined with a suitable substrate that contains a thin dielectric layer to demonstrate that the imaging qua...
We present an efficient machine learning framework for detection and classification of nanoparticles on surfaces that are detected in the far-field with coherent Fourier scatterometry (CFS). We study silicon wafers contaminated with spherical polystyrene (PSL) nanoparticles (with diameters down to λ/8). Starting from the raw data, the proposed fram...
A broad range of scientific and industrial disciplines require precise optical measurements at very low light levels. Single-photon detectors combining high efficiency and high time resolution are pivotal in such experiments. By using relatively thick films of NbTiN (8-11 nm) and improving the pattern fidelity of the nano-structure of the supercond...
We present an efficient machine learning framework for detection and classification of nanoparticles on surfaces that are detected in the far-field with Coherent Fourier Scatterometry (CFS). We study silicon wafers contaminated with spherical polystyrene (PSL) nanoparticles (with diameters down to $\lambda/8$). Starting from the raw data, the propo...
Previous simulation studies by Menzel et al. [Phys. Rev. X 10, 021002 (2020)] have shown that scattering patterns of light transmitted through artificial nerve fiber constellations contain valuable information about the tissue substructure such as the crossing angles of the fibers. Here, we present a method that measures these scattering patterns i...
We report a novel method of focus determination with high sensitivity and submicrometre accuracy. The technique relies on the asymmetry in the scattered far field from a nanosphere located at the surface of interest. The out-of-focus displacement of the probing beam manifests itself in imbalance of the signal of the differential detector located at...
A broad range of scientific and industrial disciplines require precise optical measurements at very low light levels. Single-photon detectors combining high efficiency and high time resolution are pivotal in such experiments. By using relatively thick films of NbTiN (8-11\,nm) and improving the pattern fidelity of the nano-structure of the supercon...
We demonstrate the far field detection of low-contrast nanoparticles on surfaces using a technique that is based on evanescent-wave amplification due to a thin dielectric layer that is deposited on the substrate. This research builds upon earlier results where scattering enhancement of 200 nm polystyrene (PSL) particles on top of a glass substrate...
Lateral resolution enhancement is demonstrated in a confocal imaging system with amplitude-modulated radially polarized (RP) light at the wavelength λ = 632 nm . Annular pupil fields and optimized amplitude distribution functions can be realized with a spatial light modulator. By comparing images obtained with full and amplitude modulated apertures...
Fourier Ptychography is a computational imaging technique able to decouple high resolution from wide field of view, bypassing the diffraction limit of the microscope. LED-array misalignment, optical system aberrations and partial coherent sources are common issues which have been addressed with calibration algorithms. Physical interpretation of how...
The analysis of 2D scattering maps generated in scatterometry experiments for detection and classification of nanoparticle on surfaces is a cumbersome and slow process. Recently, deep learning techniques have been adopted to avoid manual feature extraction and classification in many research and application areas, including optics. In the present w...
In the past decade, superconducting nanowire single-photon detectors (SNSPDs) have gradually become an indispensable part of any demanding quantum optics experiment. Until now, most SNSPDs have been coupled to single-mode fibers. SNSPDs coupled to multimode fibers have shown promising efficiencies but have yet to achieve high time resolution. For a...
In the past decade superconducting nanowire single photon detectors (SNSPDs) have gradually become an indispensable part of any demanding quantum optics experiment. Until now, most SNSPDs are coupled to single-mode fibers. SNSPDs coupled to multimode fibers have shown promising efficiencies but are yet to achieve high time resolution. For a number...
Single-photon sources and detectors are indispensable building blocks for integrated quantum photonics, a research field that is seeing ever increasing interest for numerous applications. In this work we implemented essential components for a Quantum Key Distribution (QKD) transceiver on a single photonic chip. Plasmonic antennas on top of silicon...
We have demonstrated that the extended ptychographic iterative engine (ePIE) algorithm can be applied to retrieve the phase information of the vectorial scattered field of a subwavelength object with the amplitude of the scattered field as input. We applied this technique combined with coherent Fourier scatterometry to determine the phase of the sc...
Wavefront aberration measurements are required to test an extreme ultraviolet (EUV) imaging system. For a high-NA EUV imaging system, where conventional wavefront-sensing techniques show limitations, ptychography can be used for this purpose. However, at the wavelength region of EUV (i.e., 13.5 nm), the position accuracy of the scanning mask that i...
Ptychography is a form of coherent diffractive imaging; it employs far-field intensity patterns of the object to reconstruct the object. In ptychography, an important limiting factor for the reconstructed image quality is the uncertainty in the probe positions. Here, we propose a new approach which uses the hybrid input–output algorithm and cross-c...
We describe non-invasive, shortwave-infrared spectroscopy for quantitative profiling of stratum corneum barrier function and wide field reflectance imaging for measurement of skin gloss.
Rigorous vectorial focusing theory is used to study the imaging of small adjacent particles with a confocal laser scanning system. We consider radially polarized illumination with an optimized amplitude distribution and an annular lens to obtain a narrower distribution of the longitudinal component of the field in focus. A polarization convertor at...
In wavefront characterization, often the combination of a Shack-Hartmann sensor and a reconstruction method utilizing the Cartesian derivatives of Zernike circle polynomials (the least-squares method, to be called here Method A) is used, which is known to introduce crosstalk. In [J. Opt. Soc. Am. A 31, 1604 (2014)10.1364/JOSAA.31.001604], a crossta...
In wavefront characterization, often the combination of a Shack-Hartmann sensor and a reconstruction method utilizing the Cartesian derivatives of Zernike circle polynomials (the least-squares method, to be called here Method A) is used, which is known to introduce crosstalk. In \citep{janssen2014zernike} a crosstalk-free analytic expression of the...
In the semiconductor industry, the performance and capabilities of the lithographic process are evaluated by measuring specific structures. These structures are often gratings of which the shape is described by a few parameters such as period, middle critical dimension, height, and side wall angle (SWA). Upon direct measurement or retrieval of thes...
Ptychography, a form of Coherent Diffractive Imaging, is used with short wavelengths (e.g. X-rays, electron beams) to achieve high-resolution image reconstructions. One of the limiting factors for the reconstruction quality is the accurate knowledge of the illumination probe positions. Recently, many advances have been made to relax the requirement...
Ptychography, a form of Coherent Diffractive Imaging, is used with short wavelengths (e.g. X-rays, electron beams) to achieve high-resolution image reconstructions. One of the limiting factors for the reconstruction quality is the accurate knowledge of the illumination probe positions. Recently, many advances have been made to relax the requirement...
Coherent Fourier scatterometry is an optical metrology technique that utilizes the measured intensity of the scattered optical field to reconstruct certain parameters of test structures written on a wafer with nano-scale accuracy. The intensity of the scattered field is recorded with a camera and this information is used to retrieve the grating par...
We demonstrate a low-cost optical method for measuring the gloss properties with improved sensitivity in the low gloss regime, relevant for skin gloss properties. The gloss estimation method is based on, on the one hand, the slope of the intensity gradient in the transition regime between specular and diffuse reflection and on the other on the sum...
The classical problem of subwavelength particle detection on a flat surface is especially challenging when the refractive index of the particle is close to that of the substrate. We demonstrate a method to improve the detection ability several times for such a situation, by enhancing the “forbidden” evanescent waves in the substrate using the princ...
We have designed a ptychographical algorithm (HIO-PIE) in which HIO (Hybrid Input-Output) iterations are applied for each probe position sequentially. Simulations indicated that HIO-PIE tends to outperform PIE (Ptychographical Iterative Engine) even in the presence of shot noise, especially when the number of probe positions is small. Thus, this ad...
Particle defects are important contributors to yield loss in semi-conductor manufacturing. Particles need to be detected and characterized in order to determine and eliminate their root cause. We have conceived a process flow for advanced defect classification (ADC) that distinguishes three consecutive steps; detection, review and classification. F...
For high resolution imaging, X-rays and electron beams are being used. However, for such a short wavelength, imaging with lenses becomes difficult as lenses absorb a part of radiation and lenses with very low aberrations must be used. Ptychography is a lens-less imaging technique which uses intensity information of the multiple diffraction patterns...
Skin barrier function relies on well balanced water and lipid system of stratum corneum. Optimal hydration and oiliness levels are indicators of skin health and integrity. We demonstrate an accurate and sensitive depth profiling of stratum corneum sebum and hydration levels using short wave infrared spectroscopy in the spectral range around 1720 nm...
The classical problem of subwavelength particle detection on a flat surface is especially challenging when the refractive index of the particle is close to that of the substrate. We demonstrate a method to improve the detection ability several times for such a situation, by enhancing the "forbidden" evanescent waves in the substrate using the princ...
In this article we combine the well-known Ptychographical Iterative Engine (PIE) with the Hybrid Input-Output (HIO) algorithm. The important insight is that the HIO feedback function should be kept strictly separate from the reconstructed object, which is done by introducing a separate feedback function per probe position. We have also combined HIO...
We demonstrate a method to obtain within an arbitrary numerical aperture (NA) the entire scattering matrix of a scatterer by using focused beam coherent Fourier scatterometry. The far-field intensities of all scattered angles within the NA of the optical system are obtained in one shot. The corresponding phases of the field are obtained by an inter...
We report a method on quantitative and simultaneous non-contact in-vivo hydration and sebum measurements of the skin using an infrared optical spectroscopic set-up. The method utilizes differential detection with three wavelengths 1720, 1750, and 1770 nm, corresponding to the lipid vibrational bands that lay “in between” the prominent water absorpt...
Skin health characterized by a system of water and lipids in Stratum Corneum provide protection from harmful external elements and prevent trans-epidermal water loss. Skin hydration (moisture) and sebum (skin surface lipids) are considered to be important factors in skin health; a right balance between these components is an indication of skin heal...
Closed formulas are presented for the electromagnetic field of given power in the lens pupil, which maximizes the longitudinal electric field when focusing through an interface at arbitrary depth along the optical axis. The optimum pupil field is found to be a continuous, monotonously increasing function of the radial pupil coordinate, which differ...
Skin health is characterized by heterogeneous system of water and lipids in upper layers providing protection from external environment and preventing loss of vital components of the body. Skin hydration (moisture) and sebum (skin surface lipids) are considered to be important factors in skin health; a right balance between these components is an i...
Laser direct-writing is an important technique for the fabrication of complex patterns. There is a continuous need for structures with increasingly small features, i.e., enhanced resolution. Focused radially polarized light is known to exhibit a narrow longitudinal polarization component. Here, a proof-of-concept is shown of enhanced resolution thr...
Optical detection of scatterers on a flat substrate, generally done using dark field microscopy technique, is challenging since it requires high power illumination to obtain sufficient SNR (Signal to Noise Ratio) to be able to detect sub-wavelength particles. We developed a bright field technique, based on Fourier scatterometry, with special illumi...
Spot size reduction is demonstrated by printing focused spots from amplitude-modulated radially polarized light at the wavelength λ = 405 nm on a photoresist. Amplitude modulation is realized by ring illumination and by application of an optimized amplitude distribution function. Amplitude modulation is implemented via spatial light modulator, whic...
In this paper we present several algorithms to find pupil functions which give focal fields with different desirable properties, such as a laterally elongated spot, a focal sheet, a spot with increased axial resolution, a lateral array of closely packed spots, and a lateral array of widely spaced diffraction-limited spots. All the algorithms work b...
We describe and experimentally validate an algorithm to reconstruct an
unknown extended object from through-focus measured image intensities blurred
by unknown aberrations. It is shown that the method can recover
diffraction-limited image quality. The algorithm is a rigorous, computational
optics alternative to the conventional adaptive optics whic...
A circular wire grid polarizer (WGP) as a device to produce high quality radially polarized light at near UV wavelength range (in particular at the wavelength of λ ¼ 405 nm) is presented starting from design modeling followed by fabrication and performance analysis. The wire grid consists of concentric subwavelength metallic cylinders covering a hi...
Finding a fast and precise method to measure the side-wall angle of periodic (or non-periodic) structures is still a very challenging problem in lithographic applications. For this reason, over the years, many techniques have been proposed to circumvent this limitation, with the final goal to give the most precise geometrical description of particu...
Indirect optical methods like ellipsometry or scatterometry require an optical model to calculate the response of the system, and to fit the parameters in order to minimize the difference between the calculated and measured values. The most common problem of optical modeling is that the measured structures and materials turn out to be more complex...
A fast noninvasive method based on scattering from a focused radially polarized light to detect and localize subwavelength nanoparticles on a substrate is presented. The technique relies on polarization matching in the far field between scattered and spurious reflected fields. Results show a localization uncertainty of ≈10^{-4}λ^{2} is possible for...
An extension of Fourier scatterometry is presented, aiming at increasing the sensitivity by measuring the phase difference between the
reflections polarized parallel and perpendicular to the plane of incidence. The ellipsometric approach requires no additional hardware
elements compared with conventional Fourier scatterometry. Furthermore, incohere...
An extension of Fourier scatterometry is presented, aiming at increasing the sensitivity by measuring the phase difference between the reflections polarized parallel and perpendicular to the plane of incidence. The ellipsometric approach requires no additional hardware elements compared with conventional Fourier scatterometry. Furthermore, incohere...
Re
ection of light measured in a polarimetric, scatterometric and spectroscopic
way allows the measurement of structures in a broad size range from large (meter) scales like
photovoltaic panels down to small (nanometer) scales like nanocrystals. Optical metrology
continues to be improved to measure those materials with increasing sensitivity and ac...
Optical scatterometry is the state of art optical inspection technique for quality control in lithographic process. As such, any boost in its performance carries very relevant potential in semiconductor industry. Recently we have shown that coherent Fourier scatterometry (CFS) can lead to a notably improved sensitivity in the reconstruction of the...
Inspection tools for nano-particle contamination on a planar substrate surface is a critical problem in micro-electronics. The present solutions are either expensive and slow or inexpensive and fast but have low sensitivity because of limitations due to diffraction. Most of them are also substrate specific. In this article we report how Coherent Fo...