Paul Ceria

Paul Ceria
Laboratoire National de Métrologie et d'Essais · 78190

About

10
Publications
8,163
Reads
How we measure 'reads'
A 'read' is counted each time someone views a publication summary (such as the title, abstract, and list of authors), clicks on a figure, or views or downloads the full-text. Learn more
40
Citations

Publications

Publications (10)
Poster
Full-text available
Le poster se focalisera sur la récente mise en service du premier AFM métrologique (mAFM) français. Cet instrument de référence développé par le LNE matérialise une nouvelle voie de traçabilité pour les mesures dimensionnelles réalisées à l’échelle nanométrique. Il délivre des mesures directement traçables au mètre SI (Système international d’unité...
Poster
Full-text available
To provide traceable dimensional measurements at the nanometer scale, SPM users need to periodically calibrate their instruments. This calibration task is achieved thanks to reference standards like 1D or 2D gratings and/or step heights whose dimensional characteristics have been calibrated by a National Metrology Institute (or ISO/IEC accredited l...
Thesis
Full-text available
À l’heure où les nanotechnologies sont en plein essor, la précision des mesures réalisées à l’échelle nanométrique devient un défi essentiel pour améliorer les performances et la qualité des produits intégrant des nano. Pour répondre aux besoins sous-jacents en nanométrologie dimensionnelle, le Laboratoire National de métrologie et d’Essais (LNE) a...
Article
In order to evaluate the uncertainty budget of the LNE's mAFM, a reference instrument dedicated to the calibration of nanoscale dimensional standards, a numerical model has been developed to evaluate the measurement uncertainty of the metrology loop involved in the XYZ positioning of the tip relative to the sample. The objective of this model is to...
Poster
Full-text available
Scanning probe microscopes (SPMs) are very well suited for characterization at the nanometer scale. To ensure the measurement consistency and the accuracy of the results, those SPMs need to be periodically calibrated. It’s done thanks to standards whose dimensional characteristics are measured by a metrological atomic force microscope (mAFM). LNE d...
Presentation
Full-text available
Modeling of a metrological AFM interferometric position measurement system to determine its measurement uncertainty
Book
Full-text available
Le carbone a depuis longtemps attiré l’imagination des chercheurs. S'il est l’élément clé de la vie, il trouve également de nombreuses applications dans divers domaines de la technologie. La phase la plus stable du carbone est le graphite, jusqu’à des pressions de 10 GPa à température ambiante. Au dessus de cette pression, il subit des transformati...
Article
Full-text available
We performed a systematic structural search of high-pressure carbon allotropes for unit cells containing from 6 to 24 atoms using the minima hopping method. We discovered a series of new structures that are consistently lower in enthalpy than the ones previously reported. Most of these include (5+7)- or (4+8)-membered rings and can therefore be pla...

Questions

Question (1)
Question
I have a question about Monte Carlo method. My Matlab model uses a parallel computing to accelerate the calculations with 32 cores.
The main goal is to obtain, after Monte Carlo processing, a Gaussian distribution, then to recover standard deviation. This distribution is provided from 100 000 draws in an uniform density.
Is that the same between:
to use 100 000 draws in an uniform density to obtain the output Gaussian distribution
and
to use 100 000 draws /32 cores in 32 uniform densities (the same that previous uniform density) to obtain 32 output single distributions and to add them to obtain the final Gaussian distribution? As showed in the picture.
Matlab gives the same result, but statistically is it right? Did you have any article that mentioned this similarly?
Thank you.

Network

Cited By

Projects

Projects (2)
Project
The LNE’s metrological Atomic Force Microscope (mAFM) is the French reference instrument for calibrating standards dedicated to Scanning Probe Microscope (SPM) and Scanning Electron Microscope (SEM). On this instrument, the relative position of the tip with respect to the sample is measured in real time by interferometry in order to achieve direct traceability to the SI.
Project
Current trends in precision engineering demand ever higher accuracies for industrial high-end production and measurement equipment. This requires control of positioning systems over measurement ranges from nanometres to millimetres in all 6 degrees of freedom (DoF). The application of high precision motion systems ranges from nanometrology (AFM, SEM) to industrial production technologies (machine tools, CMM, photo lithography) to large scale applications like telescopes. Improved precision engineering tools using thermal insensitive design principles is beneficial not only for tool manufacturers but also for European key-industries, especially smaller companies, in terms of more efficient production processes and reliable, better products, an important condition to ensure a competitive advantage of European industries on the world market. This will also help to reduce the number of defective parts, leading to savings in raw materials, and reductions of machine time per part.