Nicolas Gagliolo

• Engineering Scientist Associate at Applied Research Laboratories at the University of Texas

The need to increase transistor packing density beyond Moore's Law and the need for expanding functionality, real-estate management and faster connections has pushed the industry to develop complex 3D package technology which includes System-in-Package (SiP), wafer-level packaging, through-silicon-vias (TSV), stacked-die and flex packages. These st...

The need to increase transistor packing density beyond Moore's Law and the need for expanding functionality, realestate management and faster connections has pushed the industry to develop complex 3D package technology which includes System-in-Package (SiP), wafer-level packaging, through-silicon-vias (TSV), stacked-die and flex packages. These sta...

We developed a scanning DC SQUID microscope with novel readout electronics capable of wideband sensing of RF magnetic fields from 50 to 200 MHz and simultaneously providing closed-loop response at kHz frequencies. To overcome the 20 MHz bandwidth limitation of traditional closed-loop SQUIDs, a flux-modulated closed-loop simultaneously locks the SQU...

While transistor gate lengths may continue to shrink for some time, the semiconductor industry faces increasing difficulties to satisfy Moore's Law. One solution to satisfying Moore's Law in the future is to stack transistors in a 3-dimensional (3D) formation. In addition, the need for expanding functionality, real-estate management and faster conn...

Magnetic Field Imaging (MFI) technology is capable of localize shorts using Magnetic Current Imaging (MCI) technique with a very high spatial resolution [1]. In this paper we demonstrate that a Giant Magneto Resistance (GMR) sensor positioned in close proximity to the front side of a die sample enables MFI to achieve sub micron resolution.

Space Domain Reflectometry (SDR) is a newly developed non-destructive failure analysis (FA) technique for localizing open defects in both packages and dies through mapping in space domain the magnetic field produced by a radio frequency (RF) current induced in the sample, herein the name Space Domain Reflectometry. The technique employs a scanning...

Space Domain Reflectometry (SDR) is a newly developed non-destructive failure analysis (FA) technique for localizing open defects through the imaging of magnetic field produced by a radio frequency (RF) current induced in the sample. The technique employs a Scanning Superconducting Quantum Interference Device (SQUID) RF Microscope and is capable of...